A circuit includes an RF oscillator coupled in a phase-locked loop. The phase-locked loop is configured to receive a digital input signal, which is a sequence of digital words, and to generate a feedback signal for the RF oscillator based on the digital input signal. The circuit further includes a digital-to-analog conversion unit that includes a pre-processing stage configured to pre-process the sequence of digital words and a digital-to-analog-converter configured to convert the pre-processed sequence of digital words into the analog output signal. The circuit includes circuitry configured to combine the analog output signal and the feedback signal to generate a control signal for the RF oscillator. The pre-processing stage includes a word-length adaption unit configured to reduce the word-lengths of the digital words and a sigma-delta modulator coupled to the word-length adaption unit downstream thereof and configured to modulate the sequence of digital words having reduced word-lengths.

A time-to-digital converter including N stages of converting circuits, where N≧2, and N is an integer. Each stage of converting circuit includes a first delayer and an arbiter; an output end of the first delayer in each stage of converting circuit outputs a delayed signal of the stage of converting circuit; and the arbiter in each stage of converting circuit receives a sampling clock and the delayed signal of the stage of converting circuit, and compares the sampling clock with the delayed signal to obtain an output signal of the stage of converting circuit. Output signals of the N stages of converting circuits form a non-linear binary number, to indicate a time difference between a clock signal and a reference signal.

An apparatus having a digitally controlled timing adjustment circuit configured to receive a first clock and a second clock and output a third clock and a fourth clock in accordance with a noise cancellation signal and a gain control signal, an analog phase detector configured to receive the third clock and the fourth clock and output an analog timing error signal, a filtering circuit configure to receive the analog timing error signal and output an oscillator control signal, a controllable oscillator configured to receive the oscillator control signal and output a fifth clock, a clock divider configured to receive the fifth clock and output the second clock in accordance with a division factor, a modulator configured to receive a clock multiplication factor and output the division factor and the noise cancellation signal, wherein a mean value of the division factor is equal to the clock multiplication factor, a digital phase detector configured to receive the third clock and the fourth clock and output a digital timing error signal, wherein the digital phase detector is self-calibrated so that a mean value of the digital timing error signal is zero, and a correlation circuit configured to receive the timing error signal and the noise cancellation signal and output the gain control signal.

A multiplying delay-locked loop circuit includes a delay chain including a plurality of variable delay circuits connected in series and having a delay chain output, and a feedback loop including circuitry for deriving a digital control signal representing magnitude and sign of phase offset in the delay chain output, for controlling delay in ones of the variable delay circuits. The circuitry for deriving a digital control signal includes a sampling time-to-digital converter (STDC) configured to operate on a time delay between inputs to generate the digital control signal. The STDC subtracts a second difference the signals derived from the delay chain output and output of the feedback divider from a first difference between the signals derived from the delay chain output and output of the feedback divider to provide a difference value, and the difference value indicates sign and magnitude of output offset in the delay chain output.

The disclosure provides a delay estimation device and a delay estimation method. The delay estimation device includes a pulse generator, a digitally controlled delay line (DCDL), a time-to-digital converter (TDC), and a control circuit. The pulse generator receives a reference clock signal, outputs a first clock signal in response to a first rising edge of the reference clock signal, and outputs a second clock signal in response to a second rising edge of the reference clock signal. The DCDL receives the first clock signal from the pulse generator and converts the first clock signal into phase signals based on a combination of delay line codes. The TDC samples the phase signals to generate a timing code based on the second clock signal. The control circuit estimates a specific delay between the first clock signal and the second clock signal based on the timing code.

Apparatus and methods for multiphase clock generation are provided herein. In certain embodiments, a multiphase clock generator includes a first clock buffer that generates a first output clock signal based on a first input clock signal, a second clock buffer that generates a second output clock signal based on a second input clock signal, and a first clock interpolation circuit that generates a third output clock signal based on interpolating the first input clock signal and the second input clock signal. The first clock interpolation circuit generates the third output clock signal based on multiplying the first input clock signal by a first adjustable current to generate a first multiplied current, multiplying the second input clock signal by a second adjustable current to generate a second multiplied current, combining the first multiplied current and the second multiplied current to generate a combined current, and integrating the combined current.

A memory device in which reliability of a clock signal is improved is provided. The memory device comprises a data module including a clock signal generator configured to receive an internal clock signal from a buffer, and to generate a first internal clock signal, a second internal clock signal, a third internal clock signal, and a fourth internal clock signal having different phases, on the basis of the internal clock signal, and a first data signal generator configured to generate a first data signal on the basis of first data and the first internal clock signal, generate a second data signal on the basis of second data and the second internal clock signal, generate a third data signal on the basis of third data and the third internal clock signal, and generate a fourth data signal on the basis of fourth data and the fourth internal clock signal.

Systems and methods provide a fractional signal from a delta sigma modulator to a summer, a combination of an integer value and the fractional signal to a divider, and a divided clock signal from the divider in response to the combination and the input clock signal. The systems and methods also delay the divided clock signal in response to a truncation phase error and gain calibration factor from a calibration unit to provide an output clock signal having equal periods.

Described herein is an apparatus and a method for a low noise infinite radio frequency (RF) delayed-locked loop (DLL). The apparatus comprises a phase detector having a first input configured to receive a first RF signal, a second input, and an output; an infinite phase shifter having a first input configured to receive a second RF signal, an input bus, and an output connected to the second input of the phase detector; and a controller having a first input connected to the output of the phase detector and an output bus connected to the input bus of the infinite phase detector, wherein the output of the infinite phase shifter comprises a low noise signal in phase alignment with the first RF signal.

A system delays input clock signals using time-to-digital converters (TDCs) to convert edges or the clock signals to digital values and storing the digital values in a memory. The digital values are retrieved from the memory based on a desired delay. A time counter used by the TDCs to determine the edges is also used determine the delay. The accuracy and range of the delay depends on the time counter and size of the memory.