A sensing device that is configured to determine a depth result based on time-of-flight value is introduced. The sensing device includes a delay locked loop circuit, a plurality of time-to-digital converters, a multiplexer and a digital integrator. The delay locked loop circuit is configured to output a plurality of delay clock signals through output terminals of the delay locked loop circuit. The plurality of time-to-digital converters include a plurality of latches. The multiplexer is configured to select a sub-group of m latches among the latches of the plurality of time-to-digital converters to be connected to the output terminals of the delay locked loop circuit according to a control signal. The digital integrator is coupled to the plurality of time-to-digital converters and is configured to integrate digital outputs generated by the time-to-digital converters in each of n cycles to generate n raw data frames, wherein m and n are natural numbers, and the n raw data frames are used to generate the depth result.

A circuit includes an RF oscillator coupled in a phase-locked loop. The phase-locked loop is configured to receive a digital input signal, which is a sequence of digital words, and to generate a feedback signal for the RF oscillator based on the digital input signal. The circuit further includes a digital-to-analog conversion unit that includes a pre-processing stage configured to pre-process the sequence of digital words and a digital-to-analog-converter configured to convert the pre-processed sequence of digital words into the analog output signal. The circuit includes circuitry configured to combine the analog output signal and the feedback signal to generate a control signal for the RF oscillator. The pre-processing stage includes a word-length adaption unit configured to reduce the word-lengths of the digital words and a sigma-delta modulator coupled to the word-length adaption unit downstream thereof and configured to modulate the sequence of digital words having reduced word-lengths.

A phase-locked loop (PLL) device includes a first phase detector to receive an in-phase reference clock and an in-phase feedback clock, the first phase detector to output a first phase error; a second phase detector to receive a quadrature reference clock and a quadrature feedback clock, the second phase detector to output a second phase error; a proportional path component to generate first current pulses from the first phase error and second current pulses from the second phase error; an integrator circuit coupled to the proportional path component, the integrator circuit to sum, within a current output signal, the first current pulses and the second current pulses; a ring oscillator to be driven by the current output signal; and a pair of phase interpolators coupled to an output of the ring oscillator, the pair of phase interpolators to respectively generate the in-phase feedback clock and the quadrature feedback clock.

An electronic device is disclosed. The electronic device comprises a first clock configured to operate at a frequency. First circuitry of the electronic device is configured to synchronize with the first clock. Second circuitry is configured to determine a second clock based on the first clock. The second clock is configured to operate at the frequency of the first clock, and is further configured to operate with a phase shift with respect to the first clock. Third circuitry is configured to synchronize with the second clock.

A phase-locked loop or delay locked loop provides a coarse alignment between an input clock and an output clock. A latch receiver circuit provides an indicator of a delay error between the input clock and the output clock. The delay error is used by a control circuit or state machine to adjust a fine delay that affects the output clock signal timing relative to the input clock signal. The fine delay is adjusted to minimize the timing difference between the output clock signal and the input clock signal.

A semiconductor device may include a delay locked loop (DLL) control circuit coupled to an update trigger generator and a DLL update circuit. The DLL control circuit may receive an update trigger signal and an internal refresh signal and configured to activate the DLL update circuit responsive to an update trigger in the update trigger signal and deactivate the DLL update circuit responsive to an active internal refresh signal. The DLL update circuit may perform DLL update to one or more memory cell arrays when activated and not perform DLL update to the memory cell arrays when deactivated. The DLL control circuit may reactivate the DLL update circuit once the internal refresh signal becomes inactive. In other scenarios, once the DLL update circuit is deactivated, the DLL update circuit stays deactivated until the next update trigger in the update trigger signal.

A biased impedance circuit, an impedance adjustment circuit, and an associated signal generator are provided. The biased impedance circuit is coupled to a summation node and applies a biased impedance to the summation node. A periodic input signal is received at the summation node. The biased impedance circuit includes a switching circuit for receiving an output window signal, wherein a period of the output window signal is shorter than a period of the periodic input signal. The switching circuit includes a low impedance path and a high impedance path. The low impedance sets the biased impedance to a first impedance when the output window signal is at a first voltage level. The high impedance path sets the biased impedance to a second impedance when the output window signal is at a second voltage level. The first impedance is less than the second impedance.

A delay lock loop circuit includes a receiver, a delay line circuit, a clock signal generator and a phase detecting circuit. The receiver receives a clock signal and a reference voltage and generates a reference clock signal according to the clock signal and the reference voltage. The delay line circuit is coupled to the receiver and generates a delayed clock signal by delaying the reference clock signal with a delay indication signal. The clock signal generator generates an output clock signal according to the delayed clock signal. The phase detecting circuit generates a detection result by sampling the reference clock signal with a feedback clock signal generated by the output clock signal, and generates the delay indication signal according to a digital value of the detection result.

A memory package includes a plurality of memory chips, and an interface chip relaying communications between a controller and the plurality of memory chips and receiving a plurality of signals from the plurality of memory chips. The interface chip includes receivers outputting a data signal and a raw clock signal based on the plurality of signals, a delay circuit outputting a delay clock signal by applying an offset delay corresponding to ½ of one unit interval of the data signal and an additional delay to the raw clock signal, and a sampler sampling the data signal in synchronization with a clock signal. The delay circuit outputs the clock signal generated by removing the offset delay from the delay clock signal when the delay clock signal and the data signal have a phase difference corresponding to one unit interval of the data signal.

A delay locked loop includes a delay line, a delay circuit, a phase detector, a delay code generator, and a delay controller. The delay line may delay an input clock signal in units of unit delay in response to a delay control code to generate an output clock signal. The delay circuit may delay the output clock signal to generate a delay clock signal. The phase detector may compare the input clock signal and the delay clock signal to generate a phase detection signal. The delay code generator may compare the input clock signal and the delay clock signal to detect a phase difference therebetween, and generate a delay code using the phase difference. The delay controller may generate the delay control code using the delay code and the phase detection signal.