A switched-capacitor gain stage circuit and method include an amplifier connected to an input sampling circuit with sampling switched capacitors for coupling an input voltage and a first or second reference voltage to one or more central nodes during a sampling phase and for coupling the one or more central nodes to an amplifier input during a gain phase, wherein a common-mode reference voltage generation circuit uses one or more additional sampling switched capacitors to selectively couple the first and second reference voltages to the amplifier input during the gain phase when the input voltage is between the high and low threshold voltages using a switching configuration of switches that are controllable to connect the sampling switched capacitors to the one or more central nodes in the sampling phase, and to connect the amplifier output in feedback to the input sampling circuit in the gain phase while simultaneously connecting the one or more central nodes to the first amplifier input.

In pipelined analog-to-digital converters (ADCs), a passive switched capacitor (PSWC) circuit can be used in a multiplying analog-to-digital converter (MDAC), which generates an analog output being fed to a subsequent stage. Complementary analog input signals are sampled respectively onto first and second capacitors, which are stacked to provide gain. The first capacitor is positioned between a first input switch and an output node of the PSWC circuit, and the second capacitor is positioned between the second input switch and a digital-to-analog converter (DAC) output. The topology advantageously isolates common modes of the complementary analog input signals, the DAC output, and the output of the PSWC circuit. As a result, the topology offers more degrees of freedom in the overall circuit design when stages having the MDAC are cascaded, resulting in pipelined ADCs with a more elegant design with lower noise and lower power consumption.

A two-stage successive-approximation-register (SAR) analog-to-digital converter (ADC) comprising is described. The SAR ADC includes a first stage comprising a SAR ADC; a voltage-to-time interface that translates a voltage-domain residue from the SAR ADC to a time-domain residue; and a second stage comprising a time-to-digital converter (TDC) that resolves multiple bits from the time-domain residue.

Systems and methods are provided for enhanced analog-to-digital conversions, particularly by allowing for an ultra-low burst error rate. Analog-to-digital conversion may be applied to an analog input via one or more conversion cycles; and performance related parameter corresponding to the analog-to-digital conversion may be assessed. A digital output corresponding to the analog input may be generated, with the generating being controlled based on the assessing of the performance related parameter. The controlling may include adjusting at least a portion of the digital output. The assessing may include determining, for at least one conversion cycle, whether a performance related condition, corresponding to the performance related parameter, occurs. The determination may be based on an outcome of a matching search performed for that conversion cycle. The determination that the performance related condition occurs may be made when the matching search fails to settle within a corresponding time period.

Techniques are provided for compacting indirect blocks. For example, an object is represented as a structure including data blocks within which data of the object is stored and indirect blocks including block numbers of where the data blocks are located in storage. Block numbers within a set of indirect blocks are compacted into a compacted indirect block including a base block number, a count of additional block numbers after the base block number in the compacted indirect block, and a pattern of the block numbers in the compacted indirect block. The compacted indirect block is stored into memory for processing access operations to the object. Storing compacted indirect blocks into memory allows for more block numbers to be stored within memory.

A pipelined analog-to-digital converter (ADC) and an operating method are provided. The pipelined ADC includes a multiplying digital-to-analog converter (MDAC) and a sub-ADC. The MDAC alternatively operates in an amplifying phase and a sampling phase according to two non-overlapping clocks, and performs operations on an input signal in the amplifying phase according to a target voltage determined by a digital code. The sub ADC includes multiple comparators, a determination circuit, and an encoding circuit. The comparators generate multiple comparison results by comparing the input signal with multiple predetermined voltages. The determination circuit generates multiple comparison completion signals in a non-overlapping interval of the two clocks according to the comparison results. The comparison completion signals respectively indicate whether the comparators complete the comparison. The encoding circuit determines the digital code according to the comparison results and the comparison completion signals.

A pipelined analog-to-digital converter (ADC) and an operating method are provided. The pipelined ADC includes a multiplying digital-to-analog converter (MDAC) and a sub-ADC. The MDAC alternatively operates in an amplifying phase and a sampling phase according to two non-overlapping clocks, and performs operations on an input signal in the amplifying phase according to a target voltage determined by a digital code. The sub-ADC includes multiple comparators, a determination circuit, and an encoding circuit. The comparators generate multiple comparison results by comparing the input signal with multiple predetermined voltages. The determination circuit generates multiple comparison completion signals in a non-overlapping interval of the two clocks according to the comparison results. The comparison completion signals respectively indicate whether the comparators complete the comparison. The encoding circuit determines the digital code according to the comparison results and the comparison completion signals.

The disclosure includes a successive approximation register (SAR) analog to digital converter (ADC). The SAR ADC includes a sampling network to store a sample of an analog signal. The SAR ADC also includes a comparator to successively compare the sample to reference values to determine a digital value corresponding to the sample of the analog signal. The comparator employs a plurality of comparator preamplifiers. The comparator also includes a programmable trim filter. The programmable trim filter is selectively set to adjust a bandwidth of the comparator preamplifiers to a bandwidth value corresponding with a preamplifier settling time subceeding a preamplifier settling threshold.

Some embodiments include apparatuses and methods using capacitor circuitry to sample a value of an input signal; comparators to compare the value of the input signal with a range of voltage values and provide comparison results; successive approximation register (SAR) logic circuitry to generate first bits and second bits based on the comparison results; and circuitry to calculate an average value of a value of the second bits and a value of bits of a portion of the first bits, and to generate output bits representing the value of the input signal, the output bits including bits generated based on the average value.

A high-speed successive approximation analog-to-digital converter of two bits per cycle, includes three switches, two capacitor arrays, three comparators, an encoding circuit, a first switch array corresponding to the first capacitor array, a second switch array corresponding to the second capacitor array, a shifting register and a digital correction unit. The analog-to-digital converter, featuring doubled speed, realizes a successive approximation process without any fault when a high-bit large capacitor is unsettled. Thus no redundancy bit capacitor is required to compensate for unsettled pre-stage large capacitor. By using the encoding circuit, a thermometer code is converted into a binary code effectively, and inherent errors of comparators are reduced by the randomization of three comparators.