A successive approximation register analog to digital converter (SAR ADC) is provided in which impact of dielectric absorption is reduced with a correction circuit configured to adjust a present digital code value signal based at least in part upon a previous digital code value signal, an acquisition time and temperature.

An analog-to-digital converter (ADC) system is provided. The ADC system includes a first signal path. The first signal path includes a first ADC configured to generate first digital data based on an input signal. The first ADC is a time-interleaved ADC including a plurality of sub-ADCs. The first signal path further includes circuitry configured to output activity data indicating at least which of the plurality of sub-ADCs is currently active. The ADC system further includes a correction circuit configured to output digital correction data based on the activity data. Further, the ADC system includes a second signal path coupled in parallel to the first signal path. The second signal path includes a second ADC configured to generate second digital data based on the input signal and a combiner circuit configured to generate modified second digital data by combining the second digital data and the correction data. The ADC system further includes an equalizer configured to generate an equalized output signal of the ADC system based on the first digital data. The equalizer is configured to adjust, based on the modified second digital data, at least one equalization parameter used for generating the equalized output signal of the ADC system.

A successive approximation register analog to digital converter (SAR ADC) is provided in which impact of dielectric absorption is reduced with a correction circuit configured to adjust a present digital code value signal based at least in part upon a previous digital code value signal, an acquisition time and temperature.

An integrated circuit chip includes an interleaved analog-to-digital converter (ADC) and an interleaving calibration circuit. The interleaved ADC includes a plurality of ADCs that are each configured to sample an analog signal. The interleaved ADC is configured to convert the analog signal into an interleaved analog-to-digital signal (IADC signal) that includes a plurality of spurious signals formed from mismatches between the plurality of ADCs. The interleaving calibration circuit is configured to receive the IADC signal from the interleaved ADC, generate a mismatch profile estimate corresponding to the plurality of spurious signals to generate one or more mismatch profile estimates, determine whether a first mismatch profile estimate is in a frequency band of interest, and, in response to a determination that the first mismatch profile estimate is in the frequency band of interest, generate a set of model parameters based on the first mismatch profile estimate.

An analog to digital conversion apparatus that includes an analog to digital converter (ADC), a linearity calculating module and a calibration module is provided. The ADC includes a capacitor array, a comparator and a control circuit. The capacitor array receives an input signal to perform a capacitor-switching to generate a capacitor array output signal. The comparator compares the capacitor array output signal and a comparing signal to generate a digital code output result. The control circuit controls the capacitor-switching according to the digital code output result. The linearity calculating module generates a linearity related parameter according to the digital code output result. The calibration module generates a weighting parameter according to the linearity related parameter when the linearity related parameter is not within a predetermined range to adjust the digital code output result based on the weighting parameter to generate an adjusted digital code output result.

An analog-to-digital converter (ADC) includes a split-capacitor digital-to-analog converter (DAC) having a Most Significant Bits (MSBs) sub-DAC with one or more MSBs encoded with one or more binary capacitors and one or more MSBs encoded with one or more thermometer capacitors, a Least Significant Bits (LSBs) sub-DAC, a termination capacitor coupled to the LSBs sub-DAC, and a scaling capacitor coupled between the LSBs and MSBs sub-DACs, and coupled to receive an analog input voltage, a high reference voltage, and a low reference voltage, and to provide an output voltage. The ADC includes a comparator coupled to receive the output voltage, successive-approximation-register (SAR) circuitry coupled to the comparator and providing an uncalibrated digital value corresponding to an uncalibrated digital representation of the input voltage, and calibration circuitry configured to apply one or more calibration values to the uncalibrated digital value to obtain a calibrated digital value corresponding to a calibrated digital.

In accordance with an embodiment, a method for operating a successive approximation ADC comprising a first capacitor array includes measuring a first weight of an MSB-a.sup.th bit of the ADC by applying a first reference voltage to first terminals of capacitors of the first capacitor array corresponding to the MSB-a.sup.th bit, applying a second reference voltage to first terminals of capacitors of the first capacitor array corresponding to significant bits lower than the MSB-a.sup.th bit, applying the first reference voltage to first terminals of a first set of capacitors of the first capacitor array corresponding to significant bits higher than the MSB-a.sup.th bit, and applying the second reference voltage to first terminals of a second set of capacitors of the first capacitor array corresponding to the significant bits higher than the MSB-a.sup.th bit; subsequently, a weight of a capacitance of the capacitors corresponding to the MSB-a.sup.th bit is successively approximated.

A data converter includes multiple subunits to convert an input such as a radio frequency (RF) signal. The subunits are selected to sample the input in an order that varies over time. Two or more subunits are enabled at the same time. The selected subunits are configured to convert the input from an analog signal to a digital signal or vice versa.

An analog-to-digital converter (ADC) includes receiving an analog input voltage signal, converting the analog input voltage signal to a first digital value and an analog residue signal, converting the analog residue signal to a time value representing the analog residue signal, and converting the time value to a second digital value. The first digital value and the second digital value are combined into a digital output signal representing the analog input voltage signal.

An example apparatus includes: nonlinearity function selection circuitry with an output, the nonlinearity function selection circuitry to select a type of a nonlinearity function, the nonlinearity function to model nonlinearity portions of data output from an analog-to-digital converter, nonlinearity function term generation circuitry with a first input coupled to the output, the nonlinearity function term generation circuitry to generate one or more nonlinearity function terms of the nonlinearity function based on the type of the nonlinearity function and the data, and coefficient determination circuitry with a second input coupled to the output, the coefficient determination circuitry to determine one or more nonlinearity function coefficients based on the one or more nonlinearity function terms, the nonlinearity portions of the data to be compensated based on the one or more nonlinearity function coefficients.