Methods and devices are provided in which a first parameter partial value (p1) is stored in a first memory (12) and a second parameter partial value (p2) is stored in a second memory (13). A parameter value (p) of a parameter can then be obtained by combining the first parameter partial value (p1) with the second parameter partial value (p2).

An interleaved Analog-to-Digital Converter (ADC) has a reference channel receiving an attenuated analog input. The reference channel is also calibrated to remove capacitor-ratio mismatch, static, and dynamic mismatches and produces a linear replica of the data channels with negligible nonlinear errors due to attenuation. Nonlinear errors on the data channels are corrected by Harmonic Distortion HD2 and HD3 coefficients. A counter increments when the sign bit of a nonlinear-corrected channel code is negative. The count is doubled and reduced by a number of samples to generate a HD2 cost function that adjusts the HD2 coefficient in a LMS loop. A HD3 correlation is generated by multiplying the reference channel output by its difference with the nonlinear-corrected channel code. The sign of the correlation code increments a second counter which generates a HD3 cost function whose sign bit adjusts the HD3 coefficient. These 2 counters generate cost functions, eliminating sample storage.

Methods and devices are provided in which a first parameter partial value (p1) is stored in a first memory (12) and a second parameter partial value (p2) is stored in a second memory (13). A parameter value (p) of a parameter can then be obtained by combining the first parameter partial value (p1) with the second parameter partial value (p2).

Embodiments of the present disclosure includes systems and methods for diagnosing and correcting deficiencies in operation of integrated circuits. A set of operational data of an integrated circuit is received by a network via a communication interface. A deficiency in operation of the integrated circuit is diagnosed based on the set of operational data. A correction is generated for improving operation of the integrated circuit based on the deficiency diagnosed. The correction is transmitted over the network via the communication interface to the integrated circuit.