A method of using an analog-to-digital converter system includes receiving a sampled voltage corresponding to one of an input voltage and a known voltage, causing preamplifiers to generate output signals based on the sampled voltage, generating first and second signals based on the output signals, causing a delay-resolving delay-to-digital backend to generate a single-bit digital signal representing an order of receipt of the first and second signals, and adjusting one or more of the preamplifiers based on the digital signal. The disclosure also relates to a system which includes a voltage-to-delay frontend and a delay-resolving backend, and to a method which includes causing a delay comparator to generate a single-bit digital signal representing an order of receipt of input signals, causing the comparator to transmit a residue delay signal to a succeeding comparator, and transmitting a signal to adjust one or more of the preamplifiers based on the digital signal.

A tracking analog-to-digital converter (ADC) for a power converter includes a first tracking loop and a second tracking loop. The first tracking loop is configured to track a voltage input to the tracking ADC using one or more comparators and has a re-clocking circuit to mitigate the impact of comparator output metastability, but introduces multi-cycle latency which increases a residual error of the voltage tracking provided by the first tracking loop. The second tracking loop is configured to supplement the voltage tracking provided by the first tracking loop and to reduce the residual error of the voltage tracking for dynamic changes at the voltage input. The second tracking loop has a single-cycle latency and is implemented with logic that is less sensitive to logic errors due to comparator metastability. Corresponding methods of voltage tracking and an electronic system are also described.

An analog-to-digital (ADC) circuit is disclosed that includes a first stage, a first amplifier, and a second amplifier. The first stage includes signal processing circuitry, and is configured to receive a differential input signal and generate a differential residue voltage signal on differential output nodes of the first stage. The first amplifier includes first amplifier circuitry. The first amplifier is electrically connected to the differential output nodes of the first stage, and configured to receive the differential residue voltage signal, and generate a first differential voltage signal from the differential residue voltage signal. The second amplifier includes second amplifier circuitry. The second amplifier is electrically connected to differential output nodes of the first amplifier, and configured to receive the first differential voltage signal, and generate a second differential voltage signal from the first differential voltage signal.

In an example, a system includes an input channel and a voltage to delay converter (V2D) coupled to the input channel. The system also includes a first multiplexer coupled to the V2D and an analog-to-digital converter (ADC) coupled to the first multiplexer. The system includes a second multiplexer coupled to the input channel and an auxiliary ADC coupled to the second multiplexer. The system includes calibration circuitry coupled to an output of the auxiliary ADC, where the calibration circuitry is configured to correct a non-linearity in a signal provided by the input channel. The calibration circuitry is also configured to determine the non-linearity of the signal provided to the ADC relative to the signal provided to the auxiliary ADC.

A multi-instance time-interleaving (TI) system and method of operation therefor. The system includes a plurality of TI devices, each with a plurality of clock generation units (CGUs) coupled to an interleaver network. Within each TI device, the plurality of CGUs provides a plurality of clock signals needed by the interleaver network. A phase detector device is coupled to the plurality of TI devices and configured to determine any phase differences between the clock signals of a designated reference TI device and the corresponding clock signals of each other TI device. To determine the phase differences, the phase detector can use a logic comparator configuration, a time-to-digital converter (TDC) configuration, or an auto-correlation configuration. The phases of the clock signals of each other TI device can be aligned to the reference TI device using internal phase control, retimers, delay cells, finite state machines, or the like.

An example apparatus includes: an analog input; a resistor circuit including a first reference output and a second reference output; a first amplifier including a first analog input, a first reference input, and a first amplifier output, the first analog input coupled to the analog input, the first reference input coupled to the first reference output; a second amplifier including a second analog input, a second reference input, and a second amplifier output, the second analog input coupled to the analog input, the second reference input coupled to the second reference output; a first comparator including a first comparator input, the first comparator input coupled to the first amplifier output; and a second comparator including a second comparator input, the second comparator input coupled to the second amplifier output; a first multiplexer including a first multiplexer input and a first residue output, the first multiplexer input coupled to the first amplifier output; and a second multiplexer including a second multiplexer input and a second residue output, the second multiplexer input coupled to the second amplifier output.

A flash analog to digital converter includes double differential comparator circuits and a calibration circuit. Each double differential comparator circuit compares a first input signal with a corresponding voltage in a first set of reference voltages, and compares a second input signal with a corresponding voltage in a second set of reference voltages, in order to generate a corresponding signal in first signals. The calibration circuit outputs a first test signal to be the first input signal and outputs a second test signal to be the second input signal in a test mode, and calibrates a common mode level of each of the first input signal and the second input signal, or calibrates at least one first reference voltage in the first set of reference voltages and at least one second reference voltage in the second set of reference voltages according to a distribution of the first signals.

A DAC cell includes first and second transistors, drain-source coupled at a first node, a gate of the second transistor coupled to a data input (D), and third and fourth transistors, drain-source coupled at a second node, a gate of the fourth transistor coupled to a complement of the data input (DB). The circuit further includes first and second shadow transistors each coupled between the first node and ground, a gate of the first shadow transistor coupled to a switching input (S) and a gate of the second shadow transistor coupled to a complement of the switching input (SB). The circuit still further includes third and fourth shadow transistors each coupled between the second node and ground, a gate of the third shadow transistor coupled to S and a gate of the fourth shadow transistor coupled to SB.

A tracking analog-to-digital converter (ADC) for a power converter includes a first tracking loop and a second tracking loop. The first tracking loop is configured to track a voltage input to the tracking ADC using one or more comparators and has a re-clocking circuit to mitigate the impact of comparator output metastability, but introduces multi-cycle latency which increases a residual error of the voltage tracking provided by the first tracking loop. The second tracking loop is configured to supplement the voltage tracking provided by the first tracking loop and to reduce the residual error of the voltage tracking for dynamic changes at the voltage input. The second tracking loop has a single-cycle latency and is implemented with logic that is less sensitive to logic errors due to comparator metastability. Corresponding methods of voltage tracking and an electronic system are also described.

A method of using an analog-to-digital converter system includes receiving a sampled voltage corresponding to one of an input voltage and a known voltage, causing preamplifiers to generate output signals based on the sampled voltage, generating first and second signals based on the output signals, causing a delay-resolving delay-to-digital backend to generate a single-bit digital signal representing an order of receipt of the first and second signals, and adjusting one or more of the preamplifiers based on the digital signal. The disclosure also relates to a system which includes a voltage-to-delay frontend and a delay-resolving backend, and to a method which includes causing a delay comparator to generate a single-bit digital signal representing an order of receipt of input signals, causing the comparator to transmit a residue delay signal to a succeeding comparator, and transmitting a signal to adjust one or more of the preamplifiers based on the digital signal.