Digital-to-analog conversion circuit, digital-to-analog conversion method, display apparatus are disclosed. Digital-to-analog conversion circuit may comprise: voltage dividing sub-circuit comprising M voltage dividing signal terminals; decoding sub-circuit comprising M input and output terminals, M input terminals electrically coupled to first to M.sup.th voltage dividing signal terminals of voltage dividing sub-circuit respectively, decoding sub-circuit configured to receive digital signal and select one of M input terminals to be electrically connected with output terminal according to digital signal; amplification sub-circuit comprising input and output terminals, input terminal of amplification sub-circuit electrically coupled to output terminal of decoding sub-circuit, amplification sub-circuit configured to amplify signal at its input terminal, output analog gray-scale voltage at output terminal, voltage dividing signal at voltage dividing signal terminal is less than or equal to ½ of maximum load voltage at output terminal of digital-to-analog conversion circuit, amplification sub-circuit has amplification coefficient N greater than or equal to 2.

A multi-instance time-interleaving (TI) system and method of operation therefor. The system includes a plurality of TI devices, each with a plurality of clock generation units (CGUs) coupled to an interleaver network. Within each TI device, the plurality of CGUs provides a plurality of clock signals needed by the interleaver network. A phase detector device is coupled to the plurality of TI devices and configured to determine any phase differences between the clock signals of a designated reference TI device and the corresponding clock signals of each other TI device. To determine the phase differences, the phase detector can use a logic comparator configuration, a time-to-digital converter (TDC) configuration, or an auto-correlation configuration. The phases of the clock signals of each other TI device can be aligned to the reference TI device using internal phase control, retimers, delay cells, finite state machines, or the like.

A flash analog to digital converter includes double differential comparator circuits and a calibration circuit. Each double differential comparator circuit compares a first input signal with a corresponding voltage in a first set of reference voltages, and compares a second input signal with a corresponding voltage in a second set of reference voltages, in order to generate a corresponding signal in first signals. The calibration circuit outputs a first test signal to be the first input signal and outputs a second test signal to be the second input signal in a test mode, and calibrates a common mode level of each of the first input signal and the second input signal, or calibrates at least one first reference voltage in the first set of reference voltages and at least one second reference voltage in the second set of reference voltages according to a distribution of the first signals.

An integrated circuit including a first passive component of capacitive, resistive, or inductive type, including: a plurality of second and third passive components of said type, each having a same first theoretical value Compu_t, the second components being connected together so that their values add, and each third component being associated with a first switch having its state determining whether the value of the third component adds to the values of the second components; and a plurality of fourth passive components of said type, each associated with a second switch having its state determining whether the value of the fourth component adds to the values of the second components, at least one of the fourth passive components having a second theoretical value equal to (1−P).Compu_t or to (1+P).Compu_t, P being positive and smaller than ½.

An A/D converter includes: a sampler that includes a sampling capacitor and samples an input signal; a D/A converter that selectively outputs an analog voltage; an integrator that integrates an input from the sampler and an input from the D/A converter; Multiple switches that include a first switch independently connecting the sampler to the integrator, a second switch independently connecting the D/A converter to the integrator, a third switch, and, a fourth switch, a quantizer that quantizes an output of the integrator; a control circuit that outputs a digital value based on an output of the quantizer, and a reference potential generation circuit that provides a second reference potential to an integrator side of the sampler through the third switch and provides a first reference potential to the integrator side of the D/A converter through the fourth switch.

In at least some examples, an integrated circuit includes an input pin and an analog-to-digital converter (ADC) comprising an input terminal coupled to the input pin and an output terminal. The integrated circuit further includes a logic circuit comprising an input terminal coupled to the output terminal of the ADC, a first output terminal, and a second output terminal. The integrated circuit further includes a resistance circuit. In an example, the resistance circuit includes a resistor coupled between the input pin and a first node, a first switch coupled between the first node and a reference voltage pin, and a second switch coupled between the first node and a ground pin.

Digital-to-analog conversion circuit, digital-to-analog conversion method, display apparatus are disclosed. Digital-to-analog conversion circuit may comprise: voltage dividing sub-circuit comprising M voltage dividing signal terminals; decoding sub-circuit comprising M input and output terminals, M input terminals electrically coupled to first to M.sup.th voltage dividing signal terminals of voltage dividing sub-circuit respectively, decoding sub-circuit configured to receive digital signal and select one of M input terminals to be electrically connected with output terminal according to digital signal; amplification sub-circuit comprising input and output terminals, input terminal of amplification sub-circuit electrically coupled to output terminal of decoding sub-circuit, amplification sub-circuit configured to amplify signal at its input terminal, output analog gray-scale voltage at output terminal, voltage dividing signal at voltage dividing signal terminal is less than or equal to ½ of maximum load voltage at output terminal of digital-to-analog conversion circuit, amplification sub-circuit has amplification coefficient N greater than or equal to 2.

An A/D converter includes: a sampler that includes a sampling capacitor and samples an input signal; a D/A converter that selectively outputs an analog voltage; an integrator that integrates an input from the sampler and an input from the D/A converter; Multiple switches that include a first switch independently connecting the sampler to the integrator, a second switch independently connecting the D/A converter to the integrator, a third switch, and, a fourth switch, a quantizer that quantizes an output of the integrator; a control circuit that outputs a digital value based on an output of the quantizer, and a reference potential generation circuit that provides a second reference potential to an integrator side of the sampler through the third switch and provides a first reference potential to the integrator side of the D/A converter through the fourth switch.

In an example, a system includes an input channel and a voltage to delay converter (V2D) coupled to the input channel. The system also includes a first multiplexer coupled to the V2D and an analog-to-digital converter (ADC) coupled to the first multiplexer. The system includes a second multiplexer coupled to the input channel and an auxiliary ADC coupled to the second multiplexer. The system includes calibration circuitry coupled to an output of the auxiliary ADC, where the calibration circuitry is configured to correct a non-linearity in a signal provided by the input channel. The calibration circuitry is also configured to determine the non-linearity of the signal provided to the ADC relative to the signal provided to the auxiliary ADC.

An AD conversion circuit includes a comparison circuit, a first DA conversion circuit including a plurality of resistance elements, and a first voltage output circuit. A comparator of the comparison circuit outputs a signal that represents a result of comparing a first voltage of a first input terminal with a second voltage of a second input terminal. A first combined resistance value of the first DA conversion circuit and the first voltage output circuit seen from a second terminal of the first capacitance element is a first value when the first capacitance element holds a first signal. The first combined resistance value is a second value when the comparator compares the first voltage with the second voltage. The first value is less than the second value.