Examples herein relate to electronic devices that include an asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) that implements timing adjustment based on output statistics. In an example, an electronic device includes an asynchronous SAR ADC, a statistics monitor, and an operation setting circuit. The asynchronous SAR ADC is configured to output output data. The statistics monitor is configured to capture samples at a bit position of the output data. The statistics monitor is further configured to generate an operational setting based on the captured samples. The operation setting circuit is configured to adjust an operating condition of the asynchronous SAR ADC based on the operational setting.

A CMOS image sensor comprises an array of pixels. A column of the pixel array is coupled to a readout column. The readout column is couple to a readout circuitry (RC) that reads out image data from the pixel array. The RC comprises a sampling switch which is coupled to a 1-column successive approximation register (SAR) analog-to-digital converter (ADC). The 1-column SAR ADC comprises a differential comparator, a local SAR control, and a digital-to-analog converter (DAC). The sampling switch is coupled between a readout column and a non-inverting input of the differential comparator. An image readout method reads one pixel with two conversions through the RC. The RC is operated by the local SAR control to set the DAC based on comparator output, and upon which a reset digital value is obtained and stored. An overall reduced algorithm calculation is achieved herein.

Disclosed are circuits and methods for a CDAC with capacitive references. Individual reference capacitors can be implemented to provide the reference voltages for each input capacitor in a CDAC. For example, each input capacitor may be allocated a high-reference capacitor and a low-reference capacitor to provide the reference voltage to the respective input capacitor. Each of these reference capacitors is charged along with the input capacitor when the CDAC is configured into a loading configuration, and then used to convert digital data to an analog signal when the CDAC is configured into a conversion configuration. Accordingly, the reference voltage for each input capacitor is provided by a separate power source. This contrasts with current solutions in which the reference voltages for the input capacitors are provided by either a singular high-reference voltage source or low-reference voltage source.

An analog-to-digital (A/D) conversion system includes a track-and-hold circuit, a comparison circuit, a control circuit, a digital-to-analog (D/A) conversion circuit, a switched buffer and a loop filter. The track-and-hold circuit is configured to output a first signal based on an input signal or a first timing signal. The comparison circuit is configured to generate a comparison result based on the first signal and a filtered residue signal. The control circuit is coupled to the comparison circuit, and is configured to generate an N-bit logical signal according to N comparison results from the comparison circuit. The D/A circuit is configured to generate a feedback signal based on the N-bit logical signal. The switched buffer is configured to generate a first error signal based on a second timing signal and a second error signal. The loop filter is configured to generate the filtered residue signal based on the first error signal.

Errors in a cyclic analog to digital converter are reduced. An analog to digital converter is a cyclic analog to digital converter for converting an analog input signal into a digital output signal by performing a plurality of times of cycle processing on the analog input signal. A cycle processing unit performs the cycle processing and outputs a digital signal indicating a value of each bit of the digital output signal. An output circuit receives the digital signal output from the cycle processing unit and outputs, as an output signal, a signal obtained by inverting the digital signal every other cycle. A signal input to the cycle processing unit in second and subsequent cycles is generated in the cycle processing in a previous cycle. In the cycle processing, processing for inverting the signal input to the cycle processing is performed.

An apparatus comprises a sigma-delta analog-to-digital converter (ADC) circuit including a serial data input, a serial data output, a serial clock input to receive a serial clock signal, and a master clock input to receive a master clock signal; a digital isolator circuit including outputs coupled to the serial clock input and serial data input of the sigma-delta ADC circuit, and an input coupled to the serial data output of the sigma-delta ADC circuit; an oscillator circuit unconnected to the digital isolator circuit and configured to generate the master clock signal asynchronous to the serial clock input signal; and wherein the sigma-delta ADC circuit generates an ADC sampling clock using the master clock.

A circuit system for weight modulation and image recognition of a memristor array includes a personal computer (PC), a field-programmable gate array (FPGA) chip, a digital-to-analog conversion unit, a switch unit, a memristor array unit, an integration and signal amplification circuit, and an analog-to-digital converter. The circuit system selects a to-be-realized function such as array reading and writing, weight modulation or image recognition, converts a command or an RGB value of an image collected by the PC into a corresponding grayscale value, and sends the grayscale value to the FPGA chip. The FPGA chip controls and selects a to-be-modulated memristor array unit through the digital-to-analog conversion unit and the switch unit. An application program of the PC controls the FPGA chip in real time to realize array reading and writing, weight modulation, and image recognition, and then the FPGA chip displays a result on the PC in real time.

In a compute-in-memory (“CIM”) system, current signals, indicative of the result of a multiply-and-accumulate operation, from a CIM memory circuit are computed by comparing them with reference currents, which are generated by a current digital-to-analog converter (“DAC”) circuit. The memory circuit can include non-volatile memory (“NVM”) elements, which can be multi-level or two-level NVM elements. The characteristic sizes of the memory elements can be binary weighted to correspond to the respective place values in a multi-bit weight and/or a multi-bit input signal. Alternatively, NVM elements of equal size can be used to drive transistors of binary weighted sizes. The current comparison operation can be carried out at higher speeds than voltage computation. In some embodiments, simple clock-gated switches are used to produce even currents in the current summing branches. The clock-gated switches also serve to limit the time the cell currents are on, thereby reducing static power consumption.

Analog-to-digital converter circuitry includes comparator circuitry, capacitor analog-to-digital converter circuitry (CDA), and successive approximation register (SAR) circuitry. The comparator circuitry includes a non-inverting input and an inverting input to selectively receive a differential voltage signal, and an output. The CDAC circuitry includes a first capacitor network having a first plurality of capacitors. A first capacitor of the first plurality of capacitors includes a first terminal connected to the non-inverting input and a second terminal selectively connected to a first voltage potential and a second voltage potential. The first voltage potential is greater than the second voltage potential. The SAR circuitry is connected to the output and the first capacitor network, and connects, during a first period, the second terminal of the first capacitor to the second voltage potential. The non-inverting input and the inverting input are connected to the differential voltage signal during the first period.

An ADC includes a comparator to provide a comparator output responsive to an input voltage of the ADC and a DAC output voltage; a SAR circuit including a SAR that stores an n-bit digital code that is initialized at a beginning of a conversion phase of the ADC, where the SAR circuit is to update the digital code responsive to the comparator output, where an ADC output is responsive to the digital code at an end of the conversion phase; and a DAC to provide the DAC output voltage responsive to the digital code and a reference voltage. The DAC includes an m-bit CDAC and an (n-m)-bit RDAC to provide an intermediate voltage responsive to the n-m least-significant bits of the digital code and the reference voltage. The CDAC provides the DAC output voltage responsive to the m most-significant bits of the digital code, the intermediate voltage, and reference voltage.