A SAR ADC and an electronic device are disclosed. The SAR ADC includes a read clock generation circuit, configured to connect to a first output terminal and a second output terminal of a dynamic comparator, and generate a read clock signal for reading a first or a second comparison result based on the first and the second comparison result received from the dynamic comparator. The invention reads the comparison result using the read clock signal generated by grabbing the output of the comparator, and can improve the overall analog-to-digital conversion speed of the SAR ADC. Further, the present invention can detect the occurrence of metastable state of the comparator by judging that the output of the comparator has no pulse, and read the comparison result based on the backup clock generated by the operating clock of the comparator.

High speed, high dynamic range SAR ADC method and architecture. The SAR DAC comparison method can make fewer comparisons with less charge/fewer capacitors. The architecture makes use of a modified top plate switching (TPS) DAC technique and therefore achieves very high-speed operation. The present disclosure proffers a unique SAR ADC method of input and reference capacitor DAC switching. This benefits in higher dynamic range, no external decoupling capacitory requirement, wide common mode range and overall faster operation due to the absence of mini-ADC.

A system and method for reducing or eliminating undesired effects of an artifact on a received signal is disclosed. The signal is generated from stimulating a sample. A receiver includes estimations of artifacts on the signal that are subtracted at different stages of the receiver. The estimations of the artifact may be performed via a successive approximation register scheme.

Disclosed are an analog-to-digital converter (ADC), an electronic device including the ADC, and an operating method of the ADC. The ADC includes a first stage that includes a plurality of channels, generates a first sampling signal by sequentially sampling a first analog signal based on time interleaving, and generates a first digital signal and a first residual signal corresponding to the first analog signal by performing analog-to-digital conversion based on the first sampling signal, an amplifier that amplifies the first residual signal, and a second stage that includes a plurality of channels, generates a second sampling signal by sequentially sampling the amplified first residual signal based on time interleaving, and generates a second digital signal and a second residual signal corresponding to the first analog signal by performing analog-to-digital conversion based on the second sampling signal. The number of the plurality of channels included in the first stage is odd-numbered.

The present invention discloses an analog-to-digital conversion circuit having speed-up comparison mechanism. Each of a positive and a negative capacitor arrays receives a positive and a negative input voltages to generate a positive and a negative output voltages. A first comparator performs comparison thereon to generate a first comparison result and a second comparator performs comparison according to a reference voltage to generate a second comparison result. A control circuit switches a capacitor enabling combination of the capacitor arrays according to the first comparison result and outputs a digital code as a digital output signal when the positive and the negative output voltages equal. The control circuit operates in a speed-up switching mode when a difference between the positive and the negative output voltages is outside of a predetermined range defined by the reference voltage and operates in a normal switching mode when the difference is within the predetermined range.

An apparatus comprises at least one processor and at least one memory including instruction code configured to, with the at least one processor, cause the apparatus at least to perform a successive approximation analog-to-digital conversion of an analog input, representing a result of multiplication of first and second vectors, to a digital output by determining an upper bound on the result of multiplication of the first and second vectors, identifying, based at least in part on the determined upper bound, at least a portion of the successive approximation analog-to-digital conversion to be skipped, and skipping the identified portion of the successive approximation analog-to-digital conversion.

Disclosed successive approximation register analog-to-digital converters (SAR ADCs) and conversion methods detect a statistical effect of meta-stability induced errors and limit the level of such errors. One illustrative integrated circuit chip includes: a SAR ADC that employs asynchronous bit cycles to convert a sequence of analog signal samples into a sequence of digital signal samples; and a detector that accelerates the asynchronous bit cycles when a meta-stability error bias exceeds a predetermined threshold. An illustrative analog-to-digital conversion method includes: converting a sequence of analog signal samples to a sequence of digital signal samples using a successive approximation register analog to digital converter (SAR ADC) with asynchronous bit cycles; deriving a meta-stability error bias from the sequence of digital signal samples; and accelerating the asynchronous bit cycles when the meta-stability error bias exceeds a predetermined threshold.

A successive approximation Analogue to Digital Converter (ADC), comprising: a sample and hold device arranged to sample and hold an input signal at the beginning of a conversion cycle; a successive approximation register that sequentially builds up a digital output from its most significant bit to its least significant bit; a digital to analogue converter that outputs a signal based on the output of the successive approximation register; a comparator that compares the output of the digital to analogue converter with an output of the sample and hold device and supplies its output to the successive approximation register; and a residual signal storage device arranged to store the residual signal at the end of a conversion cycle; and wherein the successive approximation ADC is arranged to add the stored residual signal from the residual signal storage device to the input signal stored on the sample and hold device at the start of each conversion cycle. After each ADC full conversion by the SAR, the analogue conversion of the digital output is as close to the original input signal as the resolution will allow. However there remains the residual part of the input signal that is smaller than what can be represented by the least significant bit of the digital output of the SAR. In normal operation, successive outputs of a SAR for the same input will result in the same digital value output and the same residual. By storing the residual at the end of each conversion and adding the residual onto the input signal of the next conversion the residuals are accumulated over time so that they may affect the output digital value. After a number of conversions, the accumulated residuals add up to more than the value represented by the LSB of the register and the digital value will be one higher than if a conversion had been performed on the input signal alone. In this way, the residual signal affects the output value in time and thus can be taken into account by processing the digital output in the time domain.

Disclosed are an audio ADC for supporting voice wake-up and an electronic device. The audio ADC includes a programmable gain amplifier (PGA) having an input terminal for receiving an audio signal; a bypass switch having an input terminal for receiving an analog audio signal; and a successive approximation ADC having input terminals respectively connected to output terminals of the PGA and the bypass switch; the PGA gains and amplifies the audio signal, the bypass switch bypasses the PGA, and outputs the analog audio signal; the successive approximation performs analog-to-digital conversion with noise shaping on the analog audio signal after gain amplification at a first sampling rate/oversampling rate when the audio ADC is normal working, and turns off noise shaping when the audio ADC is sleep, performs analog-to-digital conversion on the analog audio signal output by the bypass switch at a second sampling rate/oversampling rate, and outputs to a DSP.

The present description concerns a comparator (1) of a first voltage (V+) and of a second voltage (V−), comprising first (100) and second (102) branches each comprising a same succession of alternated first (106) and second (108) gates in series between a node (104) and an output (1002; 1022) of the branch (100; 102), wherein: each branch starts with a first gate (106), each gate (106; 108) has a second node (114) receiving a bias voltage, the second node (114) of each first gate (106) of the first branch (100) and of each second gate (108) of the second branch (102) receives the first voltage (V+), the second node of the other gates receiving the second voltage (V−), and an order of arrival of the edges on the outputs (1002; 1022) of the branches determines a result of a comparison.