An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An AD converter includes: a DA converter; a comparator configured to be capable of resetting a comparison output signal to a first level after a comparison operation is performed based on an output of the DA converter and before a next comparison operation is performed; a level shifter configured to be capable of level-shifting and outputting the comparison output signal such that a change from the first level to a second level is faster than a change from the second level to the first level; a register configured to be capable of obtaining the output of the level shifter; and a logic circuit configured to be capable of controlling the DA converter.

A sampling clock generating circuit and an analog to digital converter includes a resistance variable circuit, a NOT-gate type circuit, and a capacitor, where an input end of the NOT-gate type circuit receives a pulse signal whose period is T; an output end of the NOT-gate type circuit is connected to one end of the capacitor; the other end of the capacitor is grounded; a power supply terminal of the NOT-gate type circuit is connected to a power supply; a ground terminal of the NOT-gate type circuit is connected to one end of the resistance variable circuit; and the other end of the resistance variable circuit is grounded; the NOT-gate type circuit is configured to: when the pulse signal is a high level, output a low level; and when the pulse signal is a low level, output a high level.

A method can include in a first phase of a sensing operation, controlling at least a first switch to energize a sensor inductance; in a second phase of the sensing operation that follows the first phase, controlling at least a second switch to couple the sensor inductance to a first modulator capacitance to induce a first fly-back current from the sensor inductance, the first fly-back current generating a first modulator voltage at the first modulator capacitance, and in response to the first modulator voltage, controlling at least a third switch to generate a balance current that flows in an opposite direction to the fly-back current at the first modulator node. The first and second phases can be repeated to generate a first modulator voltage at the first modulator capacitance. the modulator voltage can be converted into a digital value representing the sensor inductance. Related devices and systems are also disclosed.

An analog-digital conversion circuit is disclosed for comparing a comparison potential with a reference potential generated based on a reference power supply to convert a comparison potential to a digital value. An analog-to-digital converter generates the comparison potential based on a sampled and held input potential, the digital value, and the reference power supply. A current amount control unit controls current amount flowing to the current amount control element in each bit circuit. In response to second switches of the bit circuits being turned on in order from the upper bit in each bit circuit by the digital value, the current amount control unit applies a current control potential to the current amount control element in any of the bit circuits that the noise current is more than allowable value while the noise current proportional to the charge flowing from the capacitor is more than the allowable value.

A Bias Unit Element (UE) has a digital input, a sign input, and a chop clock. The sign input is exclusive ORed with the chop clock to generate a signed chop clock. Each Bias UE comprises a positive Bias UE and a negative Bias UE, each comprising groups of NAND gates generating an output and a complementary output, each of which are coupled to differential charge transfer lines through binary weighted charge transfer capacitors to a differential charge transfer bus comprising a positive charge transfer line and a negative charge transfer line. The chopped sign input enables the positive Bias UE when the sign bit is positive and enables the negative Bias UE when the sign bit is negative.

An architecture for a multiplier-accumulator (MAC) uses a common Unit Element (UE) for each aspect of operation, the MAC formed as a plurality of MAC UEs, a plurality of Bias UEs, and a plurality of Analog to Digital Conversion (ADC) UEs which collectively perform a scalable MAC operation and generate a binary result. Each MAC UE, BIAS UE and ADC UE comprises groups of NAND gates with complementary outputs arranged in NAND-groups, each NAND gate coupled to a differential charge transfer bus through a binary weighted charge transfer capacitor to form an analog multiplication product as a charge applied to the differential charge transfer bus. The analog charge transfer bus is coupled to groups of ADC UEs with an ADC controller which enables and disables the ADC UEs using successive approximation to determine the accumulated multiplication result.

High speed, high dynamic range SAR ADC method and architecture. The SAR DAC comparison method can make fewer comparisons with less charge/fewer capacitors. The architecture makes use of a modified top plate switching (TPS) DAC technique and therefore achieves very high-speed operation. The present disclosure proffers a unique SAR ADC method of input and reference capacitor DAC switching. This benefits in higher dynamic range, no external decoupling capacitory requirement, wide common mode range and overall faster operation due to the absence of mini-ADC.

A system and method for reducing or eliminating undesired effects of an artifact on a received signal is disclosed. The signal is generated from stimulating a sample. A receiver includes estimations of artifacts on the signal that are subtracted at different stages of the receiver. The estimations of the artifact may be performed via a successive approximation register scheme.