A n-bit Successive Approximation Register Analog-to-Digital Converter, SAR ADC, is provided. The SAR ADC comprises a respective plurality of sampling cells for each bit of the n-bit of the SAR ADC. Each sampling cell comprises a capacitive element coupled to a cell output of the sampling cell in order to provide a cell output signal. Further, each sampling cell comprises a first cell input for receiving a first signal, and a first switch circuit capable of selectively coupling the first cell input to the capacitive element. Each cell additionally comprises a second cell input for receiving a second signal, and a third cell input for receiving a third signal. The third signal exhibits opposite polarity compared to the second signal. Each sampling cell comprises a second switch circuit capable of selectively coupling one of the second cell input and the third cell input to the capacitive element. The SAR ADC further comprises at least one comparator circuit coupled to the sampling cells. The at least one comparator circuit is configured to output a comparison signal based on the cell output signals of the sampling cells. Additionally, the SAR ADC comprises a calibration circuit configured to supply at least one respective control signal to the respective second switch circuit of the sampling cells for controlling the second switch circuits.

Circuits for continuous-time analog correlators are provided, comprising: a first VCO that receives an input signal and that outputs a first pulse frequency modulated (PFM) output signal; a second VCO that receives a reference signal and that outputs a second PFM output signal; a first phase frequency detector (PFD) that receives the first PFM output signal and the second PFM output signal and that produces a first PFD output signal; a first delay cell that receives the first PFM output signal and that produces a first delayed signal (DS); a second delay cell that receives the second PFM output signal and that produces a second DS; a second PFD that receives the first DS and the second DS and that produces a second PFD output signal; and a capacitor-digital-to-analog converter (capacitor-DAC) that receives the first PFD output signal and the second PFD output signal and that produces a correlator output.

A charge sharing circuit includes a charge source having an accumulated first charge and a charge load having an accumulated second charge, where during a charge sharing interval the second charge is less than the first charge. A charge sharing regulator selectively couples between the charge source and the charge load along a charge sharing path. The charge sharing regulator regulates transfer of a shared amount of charge from the charge source to the charge load during the charge sharing interval.

Circuits and methods for minimizing charge losses due to negative transient voltage at summing terminals of an analog to digital converter (ADC) are disclosed. The ADC is coupled to a multi-bit digital to analog converter (DAC) at the summing terminals. The ADC and the DAC include PMOS and NMOS transistors whose timing are controlled to reduce charge losses. The PMOS transistors are turned ON before the NMOS transistors. Also, the PMOS transistor of the ADC is turned ON at a slower rate than the PMOS transistors of the DAC.

In-memory computing architectures and methods of performing multiply-and-accumulate operations are provided. The method includes sequentially shifting bits of first input bytes into each row in an array of memory cells arranged in rows and columns. Each memory cell is activated based on the bit to produce a bit-line current from each activated memory cell in a column on a shared bit-line proportional to a product of the bit and a weight stored therein. Charges produced by a sum of the bit-line currents in a column are accumulated in first charge-storage banks coupled to a shared bit-line in each of the columns. Concurrently, charges from second input bytes accumulated in second charge-storage banks previously coupled to the columns are sequentially converted into output bytes. The charge-storage banks are exchanged after the first input bytes have been accumulated and the charges from the second input bytes converted. The method then repeats.

A two-capacitor digital-to-analog converter circuit having circuitry to compensate for an unwanted capacitance is disclosed. The converter is configured to generate an average voltage on two capacitors for a sequence of bits in a digital word so that when the final bit is reached, the average voltage corresponds to an analog level of the digital word. The converter is configured to input and average the voltage on the two capacitors using different modes to minimize the effects of capacitor mismatch and switching capacitance on the accuracy of the conversion. The converter includes a buffer amp that has an input capacitance that can affect the conversion. Accordingly, the converter further includes capacitance compensation circuitry configured to provide a replica input capacitance that can be charged and discharged according to the bits of the digital word and coupled to the input capacitor to prevent the input capacitance from affecting the conversion.

A time-multiplexed group of MAC circuits for a machine learning application is provided in which at least one MAC circuit in the time-multiplexed group also functions as a capacitive-digital-to-analog converter (CDAC) within a successive approximation analog-to-digital converter (ADC). A comparator in the ADC is shared by the time-multiplexed group of MAC circuits.

Methods and apparatuses for use in tuning reactance are described. Open loop and closed loop control for tuning of reactances are also described. Tunable inductors and/or tunable capacitors may be used in filters, resonant circuits, matching networks, and phase shifters. Ability to control inductance and/or capacitance in a circuit leads to flexibility in operation of the circuit, since the circuit may be tuned to operate under a range of different operating frequencies.

An analog-to-digital converter (ADC) device includes an ADC circuitry and a digital slope ADC circuitry. The ADC circuitry is configured to generate first bits and a first voltage according to an input signal. The digital slope ADC circuitry is configured to generate a second voltage at a node according to the first voltage and to gradually adjust the second voltage to generate second bits. After the second bits are generated, the digital slope ADC circuitry is further configured to perform a noise shaping function according to a first residual signal of the node.

An electronic circuit comprises capacitive structures that are connected to one or a plurality of nodes, where each of the capacitive structures is formed by a capacitor or by a plurality of capacitors electrically connected in parallel. The electronic circuit further comprises additional capacitors that are each connected to the one or plurality of nodes. For at least one distance between capacitors, the capacitive structures have a same average of values defined, for each capacitor of each capacitive structure, by the number of capacitors of the circuit connected to the one or plurality of nodes and located at the distance from the capacitor of the capacitive structure.