Circuits and methods for minimizing charge losses due to negative transient voltage at summing terminals of an analog to digital converter (ADC) are disclosed. The ADC is coupled to a multi-bit digital to analog converter (DAC) at the summing terminals. The ADC and the DAC include PMOS and NMOS transistors whose timing are controlled to reduce charge losses. The PMOS transistors are turned ON before the NMOS transistors. Also, the PMOS transistor of the ADC is turned ON at a slower rate than the PMOS transistors of the DAC.

A method of operation in an analog-to-digital converter (ADC) includes performing a calibration operation. The calibration operation includes sampling an input analog reference voltage. A sequence of charge sharing transfers is then performed with a charge sharing regulator to transfer an actual amount of charge between a charge source and a charge load based on the input analog reference voltage. The transferred actual amount of charge is compared to a reference charge value corresponding to the reference voltage. A control input to the charge sharing regulator is adjusted to correspondingly adjust charge sharing of a subsequent amount of charge based on the comparing.

An analog-to-digital converter (ADC) including input circuitry to receive an input analog signal having an analog signal level. Sampling circuitry couples to the input circuitry and includes first and second capacitor circuits to sample the received input analog signal. The first and second capacitor circuits exhibit a relative charge imbalance as a result of the sampling that corresponds to the analog signal level. Regulated charge sharing circuitry regulates charge sharing transfers during multiple charge sharing transfer sequences with the first and second capacitor circuits. A digital output generates multiple bit values based on the charge sharing transfer sequences.

A method for operating an ADC includes storing a sampled input charge on a capacitance of a sample-and-hold circuit including a DAC. The sampled input charge is stored using a first reference signal coupled to the DAC and a second signal. The sampled input charge has a value based on a first digital code. The method includes converting a second digital code to an analog signal on the first node using the DAC, the sampled input charge, and the first reference signal. The second digital code is one least-significant bit different from the first digital code. The method includes generating a monotonicity indicator indicating whether an output analog signal of the DAC is monotonic in response to a transition of a digital input of the DAC from the first digital code to the second digital code based on a comparison of the analog signal to the second signal.

A successive-approximation ADC includes an input capacitance coupled to a first node and configured to store a sampled input charge based on an input analog signal during a first phase of an analog-to-digital conversion. A gain tuning capacitance configured to store a first portion of the sampled input charge during a second phase of the analog-to-digital conversion. A charge-redistribution DAC includes a conversion capacitance configured to store a second portion of the sampled input charge during the second phase and configured to use the second portion, a remaining portion of the sampled input charge, and a reference voltage to provide an analog signal on the first node corresponding to a digital output code approximating the input analog signal at an end of the third phase. The gain tuning capacitance sequesters the first portion of the sampled input charge from the charge-redistribution DAC during the third phase.

A digital-to-analog conversion circuit (60) for converting a digital input sequence to an analog representation is disclosed. It comprises a first DAC, (100) wherein the first DAC (100) is of a capacitive voltage division type having a capacitive load (110). Furthermore, it comprises a second DAC (120) having a resistive load (130). An output (104) of the first DAC (100) and an output (124) of the second DAC (120) are connected, such that said capacitive load (110) and said resistive load (130) are connected in parallel.

A digital-to-analog conversion circuit (60) for converting a digital input sequence to an analog representation is disclosed. It comprises a first DAC, (100) wherein the first DAC (100) is of a capacitive voltage division type having a capacitive load (110). Furthermore, it comprises a second DAC (120) having a resistive load (130). An output (104) of the first DAC (100) and an output (124) of the second DAC (120) are connected, such that said capacitive load (110) and said resistive load (130) are connected in parallel.

Disclosed is a SAR ADC (Ai) having an input for receiving an input voltage, a comparator, a first switch network configured to be controlled by the SAR state machine and connected to the input of the SAR ADC and to reference voltage nodes, and a first capacitor network. The first capacitor network has a first node connected to an input of the comparator, a second node, and a bridge capacitor (Cb) connected between the first node and the second node. Furthermore, the first capacitor network comprises a first set of capacitors having a first and a second terminal, wherein the first terminal of each capacitor in the first set is connected to the first node and the second terminal of each capacitor in the first set is connected to the switch network. Moreover, the first capacitor network comprises a second set of capacitors having a first and a second terminal, wherein the first terminal of each capacitor in the second set is connected to the second node and the second terminal of each capacitor in the first set is connected to the switch network. The SAR ADC further comprises a second capacitor network configured to control a gain of the SAR ADC.

A pipelined successive approximation register analog-to-digital converter (2), SAR ADC, comprises a first SAR ADC stage (4); an inter-stage amplifier (6) for amplifying an analog residue from the first SAR ADC stage; and a second SAR ADC stage (8) input from the inter-stage amplifier, wherein the inter-stage amplifier (6) comprises one or more MOS transistors (16, 18), wherein the source and drain terminals of each of the one or more MOS transistors (16, 18) are connected to each other and may be toggled between ground and a supply voltage.

A method of calibrating capacitive array of a resistor-capacitor hybrid successive approximation register analog-to-digital converter (RC-hybrid SAR ADC) that includes a high M-bit capacitor DAC and a low N-bit resistor DAC. The method includes: disposing n unit capacitors in each capacitive array of the RC-hybrid SAR ADC, wherein n=2.sup.M1; sorting the capacitors in an ascending order according to their capacitances to form a sorted array, and selecting two capacitors C.sub.u(n/2)*, C.sub.u(n/2+1)* in the middle positions as a least significant bit (LSB) capacitor and a dummy capacitor, respectively; 4) obtaining a new array by forming each capacitor through adding two capacitors which have symmetrical positions with respect to the middle position(s) in the sorted array; and sorting the new array in an ascending order, and selecting the capacitor in the middle position as a higher bit capacitor. The method improves the static and dynamic performance of the SAR. ADC