A delta sigma modulator includes two adders, an integrator stage, a reconfigurable local resonator, an analog-to-digital converter (ADC), and a digital-to-analog converter (DAC). A first adder receives an analog input signal at an additive input, and the integrator stage receives an output from the first adder and generates an integrated signal. The reconfigurable local resonator receives the integrated signal and generates a resonator output signal. A second adder receives the resonator output signal, the integrated signal, and the input signal. The ADC receives an output from the second adder and generates a digital output signal which can be provided to other circuits. The DAC receives the digital output signal, and generates and provides a feedback signal to a subtractive input of the first adder. The reconfigurable local resonator acts as a resonator, but reconfigures to act as a low pass filter in response to overload conditions.

A delta sigma modulator includes two adders, an integrator stage, a reconfigurable local resonator, an analog-to-digital converter (ADC), and a digital-to-analog converter (DAC). A first adder receives an analog input signal at an additive input, and the integrator stage receives an output from the first adder and generates an integrated signal. The reconfigurable local resonator receives the integrated signal and generates a resonator output signal. A second adder receives the resonator output signal, the integrated signal, and the input signal. The ADC receives an output from the second adder and generates a digital output signal which can be provided to other circuits. The DAC receives the digital output signal, and generates and provides a feedback signal to a subtractive input of the first adder. The reconfigurable local resonator acts as a resonator, but reconfigures to act as a low pass filter in response to overload conditions.

A variable output data rate converter circuit preferably meets performance requirements while keeping the circuit complexity low. In some embodiments, the converter circuit may include an oversampling sigma delta modulator circuit to quantize an analog input signal at an oversampled rate, and output an sigma delta modulated signal, a transposed polynomial decimator circuit to decimate the sigma delta modulated signal, and output a first decimated signal, and an integer decimator circuit to decimate the first decimated signal by an integer factor and output a second decimated signal having a desired output data rate. The transposed polynomial decimator circuit has a transposed polynomial filter circuit and a digital phase locked loop circuit, which tracks a ratio between a sampling rate of the first decimated signal and the oversampled rate, and outputs an intersample position parameter to the transposed polynomial filter circuit.

A system includes an analog-to-digital converter configured to convert an analog signal generated by a digital sensor into a digital signal, and a testing apparatus configured to be enabled after the analog-to-digital converter operates in a testing mode, wherein the testing apparatus comprises a filter configured to receive the digital signal from the analog-to-digital converter, and apply a filtering process to the digital signal, a control circuit configured to terminate the filtering process after an output of the control circuit reaches a predetermined reference value, and a result register configured to receive a result generated by the filter after the control circuit terminates the filtering process.

Systems and methods for low power sample rate conversion are based on a noise shaping technique. A sample rate conversion circuit includes a clock synchronization circuit configured to receive an input sample sequence at a first sample rate and generate a valid sample sequence that is sampled at a second sample rate different from the first sample rate. The valid sample sequence may include valid samples from a registered sequence sampled at an oversampled rate greater than the first sample rate with invalid samples in the registered sequence being excluded from the valid sample sequence. The sample rate conversion circuit also includes a noise shaping circuit coupled to the clock synchronization circuit and configured to encode the valid sample sequence into a noise-shaped output sequence at the second sample rate by suppressing quantization noise from the valid sample sequence.

A continuous-time (CT) delta-sigma modulator (DSM) based analog to digital converter (ADC) in a radio receive chain supports a wide range of data rates in a power efficient way in a small die area. The ADC utilizes a 2.sup.nd order loop-filter with a single-amplifier loop-filter topology using a two stage Miller amplifier with a feed forward path and a push-pull output stage. High bandwidth operations utilize a negative-R compensation scheme at the amplifier input. Negative-R assistance is disabled for low data rate applications. With the negative-R assistance disabled, loop-filter resistor values are increased, instead of only the loop filter capacitor values to scale the noise transfer function (NTF), thereby limiting the capacitor area needed and enabling lower power operation. The NTF zero location is programmable allowing the NTF zero to be located near the intermediate frequency for different bandwidths to reduce the DSM quantization noise contribution for narrow-band (low data rate) applications.

This disclosure describes apparatuses, methods, and techniques that enable a computing device to support a dynamic range of audio quality, varying bandwidths, varying sampling rates, numerous effective number of bits (ENOBs) resolutions, conserve power during an overall usage of the computing device, and enhance a user experience. To do so, the computing device utilizes a reconfigurable analog-to-digital converter (ADC). The reconfigurable ADC includes a successive-approximation-register (SAR) ADC, a noise-canceling circuit, and a noise-shaping circuit. The reconfigurable ADC can selectively operate in different modes of operation, in part, by enabling or disabling the noise-canceling circuit and the noise-shaping circuit.

Disclosed is an analog-to-digital converter with an adjustable operation frequency for noise reduction. The operation frequency of the analog-to-digital converter is adjustable, and if an input signal or a circuit is affected by a noise, the noise can be reduced by spreading the frequency distribution of the noise. A clock generator generates a clock signal for controlling the operation frequency of the analog-to-digital converter. Additionally, a clock controller receives a setting signal and a counting signal, controls the clock generator, and adjusts the frequency of the clock signal. In addition, a counter counts the number of periods of the clock signal, and generates the counting signal. Furthermore, a selecting signal makes the frequency of the clock signal gradually increase or decrease with time, thereby allowing change rate or change amount of the frequency of the clock signal to be adjustable.

A modulator of an analog to digital converter includes a quantizer component configured to generate a digital signal based on a clock input operating at a sample rate. The modulator further includes a first digital to analog converter (DAC) configured to generate first DAC output at half the sample rate. The modulator further includes a second DAC configured to generate second DAC output at half the sample rate, where the first DAC and the second DAC are updated at alternate cycles of the clock input.

A modulator of an analog to digital converter includes a quantizer component configured to generate a digital signal based on a clock input operating at a sample rate. The modulator further includes a first digital to analog converter (DAC) configured to generate first DAC output at half the sample rate. The modulator further includes a second DAC configured to generate second DAC output at half the sample rate, where the first DAC and the second DAC are updated at alternate cycles of the clock input.