The invention generally relates to systems and methods for ejection of ions from an ion trap. In certain embodiments, systems and methods of the invention sum two different frequency signals into a single summed signal that is applied to an ion trap. In other embodiments, an amplitude of a single frequency signal is modulated as the single frequency signal is being applied to the ion trap. In other embodiments, a first alternating current (AC) signal is applied to an ion trap that varies as a function of time, while a constant radio frequency (RF) signal is applied to the ion trap.

A method for identifying components of a sample includes providing a sample to an ion source and generating a plurality of ions from constituent components of the sample, applying a first RF waveform at a first RF amplitude to an ion trap with field resonances while directing the plurality of ions into the ion trap, and applying a second RF waveform at a second RF amplitude to the ion trap while focusing the plurality of ions towards the center of the ion trap along the longitudinal axis. The method further includes ejecting the plurality of ions from the ion trap into a mass analyzer, and using the mass analyzer to determine the mass-to-charge ratio of the ions.

The invention generally relates to systems and methods for ejection of ions from an ion trap. In certain embodiments, systems and methods of the invention sum two different frequency signals into a single summed signal that is applied to an ion trap. In other embodiments, an amplitude of a single frequency signal is modulated as the single frequency signal is being applied to the ion trap. In other embodiments, a first alternating current (AC) signal is applied to an ion trap that varies as a function of time, while a constant radio frequency (RF) signal is applied to the ion trap.

Apparatuses, systems, and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device for use in a mass analysis system. The ion trap device may comprise an ion trap and a signal generator for applying an excitation signal to the ion trap. The signal generator may include a plurality of oscillators each configured to selectively generate a corresponding sinusoid signal to be selectively combined to form the excitation signal.

A system for analyzing a sample includes a linear ion trap, an insert DC electrode, a voltage controller, and an RF control circuitry. The linear ion trap includes a first pair of trap electrodes and a second pair of trap electrodes spaced apart from each other and surrounding a trap interior. An electrode of the second pair of trap electrodes includes a trap exit. The insert DC electrode is positioned adjacent to the trap exit. The voltage controller applies a DC voltage to the insert DC electrode. The RF control circuitry applies a main RF voltage to the first pair of trap electrodes, applies a portion of the main RF to the second pair of trap electrodes, increases the main RF applied to the first pair of trap electrodes, and applies an auxiliary RF voltage to the second pair of trap electrodes.

An ion trap system and method of using an ion trap system, the system including a substrate, a radio frequency (RF) source configured to provide an RF signal, an RF electrode disposed in the substrate and connected to the RF source, a direct current (DC) source configured to provide a DC signal, a DC electrode disposed in the substrate and connected to the DC source, wherein the DC electrode is separate from the RF electrode, and a coupling compensation system configured to provide a compensating RF signal associated with the RF signal.

A mass or mass to charge ratio selective ion trap is disclosed which directs ions into a small ejection region. A RF voltage acts to confine ions in a first (y) direction within the ion trap. A DC or RF voltage acts to confine ions in a second (x) direction. A quadratic DC potential well acts to confine ions in a third (z) direction within the ion trap. The profile of the quadratic DC potential well progressively varies along the second (x) direction.

Apparatuses, systems, and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device for use in a mass analysis system. The ion trap device may comprise an ion trap and a signal generator for applying an excitation signal to the ion trap. The signal generator may include a plurality of oscillators each configured to selectively generate a corresponding sinusoid signal to be selectively combined to form the excitation signal.

A method for identifying components of a sample includes providing a sample to an ion source and generating a plurality of ions from constituent components of the sample, applying a first RF waveform at a first RF amplitude to an ion trap with field resonances while directing the plurality of ions into the ion trap, and applying a second RF waveform at a second RF amplitude to the ion trap while focusing the plurality of ions towards the center of the ion trap along the longitudinal axis. The method further includes ejecting the plurality of ions from the ion trap into a mass analyzer, and using the mass analyzer to determine the mass-to-charge ratio of the ions.