Disclosed a chip packaging structure and a manufacturing method thereof. The chip packaging structure comprises: a metal heat dissipation layer; a chip structure comprising a plurality of first electrical contacts on an upper surface of the chip structure; a pin layer comprising a plurality of second electrical contacts and a plurality of separate metal bumps; an encapsulant encapsulating at least one portion of the chip structure, the metal heat dissipation layer and the pin layer, wherein at least one portion of the pin layer is exposed to an upper surface of the encapsulant, and an lower surface of the metal heat dissipation layer is exposed outside the encapsulant. The metal heat dissipation layer includes a flange on the side surface for tightly combining the metal heat dissipation layer and the encapsulant.

One aspect of the invention relates to an electronic module comprising a module housing and an electrically conductive connection element. The connection element has a first portion and a second portion, and also a shaft between the first portion and the second portion. The connection element, which is provided with a non-metallic coating in the region of the shaft, is injected together with the coating in the region of the shaft into the module housing, such that the connection element is fixed in the module housing.

A semiconductor device includes a shielding wire formed across a semiconductor die and an auxiliary wire supporting the shielding wire, thereby reducing the size of a package while shielding the electromagnetic interference generated from the semiconductor die. In one embodiment, the semiconductor device includes a substrate having at least one circuit device mounted thereon, a semiconductor die spaced apart from the circuit device and mounted on the substrate, a shielding wire spaced apart from the semiconductor die and formed across the semiconductor die, and an auxiliary wire supporting the shielding wire under the shielding wire and formed to be perpendicular to the shielding wire. In another embodiment, a bump structure is used to support the shielding wire. In a further embodiment, an auxiliary wire includes a bump structure portion and wire portion and both the bump structure portion and the wire portion are used to support the shielding wire.

Provided are a semiconductor module capable of easily connecting extraction pin with a wiring board and having reliable connections, and a method for manufacturing the same. A semiconductor module includes: a multilayer board having a semiconductor device mounted thereon, the multilayer board electrically connecting to the semiconductor device; an extraction pin electrically connecting to one of the semiconductor device and the multilayer board; and a wiring board bonded to the extraction pin for electrical connection. The extraction pin has a press-fit. The wiring board has a hole portion bonded with the press-fit of the extraction pin. The base materials of the press-fit of the extraction pin and the hole portion of the wiring board are copper (Cu). A bonded portion between the base materials of press-fit and the corresponding hole portion of the wiring board includes a CuSnNi alloy layer.

A semiconductor device includes a base body, a semiconductor chip deposited on a top surface of the base body, an encapsulating resin covering the base body and the semiconductor chip, a ring-shaped plug, and at least one stand-up terminal. The ring-shaped plug has an insulating property, is buried in a part of an upper part of the encapsulating resin while being aligned with respect to the base body, and has a top surface exposed to an outside of the encapsulating resin. The at least one stand-up terminal includes a vertical part penetrating the ring-shaped plug and extending in a direction perpendicular to the top surface of the base body, and has a lower end electrically connected to an electrode of the semiconductor chip inside the encapsulating resin and an upper end exposed to the outside of the encapsulating resin. The ring-shaped plug is fixed and bonded to a circumference of a side surface of the vertical part of the stand-up terminal.

A semiconductor and a method of fabricating the semiconductor having multiple, interconnected die including: providing a semiconductor substrate having a plurality of disparate die formed within the semiconductor substrate, and a plurality of scribe lines formed between pairs of adjacent die of the plurality of disparate die; and fabricating, by a lithography system, a plurality of inter-die connections that extend between adjacent pair of die of the plurality of die.

An electronic device structure having a shielding structure includes a substrate with an electronic component electrically connected to the substrate. The shielding structure includes conductive spaced-apart pillar structures that have proximate ends connected to the substrate and distal ends spaced apart from the substrate, and that are laterally spaced apart from the first electronic component. In one embodiment, the conductive pillar structures are conductive wires attached at one end to the substrate with an opposing end extending away from the substrate so that the conductive wires are provided generally perpendicular to the substrate. A package body encapsulates the electronic component and the conductive spaced-apart pillar structures. In one embodiment, the shielding structure further includes a shielding layer disposed adjacent the package body, which is electrically connected to the conductive spaced-apart pillar structures. In one embodiment, the electrical connection is made through the package. In another embodiment, the electrical connection is made through the substrate.

A manufacturing method for a chip packaging structure, comprising: arranging a metal heat dissipation layer on a substrate comprising at least one flange on its side surface; forming a sealing pin located on an upper surface of the flange, so that the metal heat dissipation layer, the flange and the sealing pin form a cavity for accommodating an encapsulant; attaching a chip structure on an upper surface of the metal heat dissipation layer using an adhesive layer; forming the encapsulant encapsulating an upper surface of the substrate, the metal heat dissipation layer and the chip structure, the sealing pin extends to a periphery of the upper surface of the encapsulant; performing a mechanical or chemical treatment, to make electrode connecting structures on an upper layer of the chip structure exposed outside the first encapsulant; arranging a pin layer for electrically coupling to and covering the electrode connection structures.

A semiconductor module includes a laminated substrate that includes a heat radiating plate, and an insulation layer having a conductive pattern thereof and being disposed on a top surface of the heat radiating plate, a semiconductor element disposed on a top surface of the conductive pattern, an integrated circuit that controls driving of the semiconductor element, a control-side lead frame having a primary surface on which the integrated circuit is disposed, and a mold resin that seals the laminated substrate, the semiconductor element, the integrated circuit, and the control-side lead frame. The control-side lead frame has a rod-shaped first pin having a first end, a first end side of the first pin extending toward the top surface of the heat radiating plate, and the heat radiating plate has at least one insertion hole into one of which the first end of the first pin is press-fitted.

A semiconductor memory device includes: a local write bit (LWB) line; a local write bit_bar (LWB_bar) line; a global write bit (GWB) line; a global write bit_bar (GWBL_bar) line; a column of segments, each segment including bit cells that are connected correspondingly between the LWB and LWB_bar lines; and a distributed write driving arrangement including a global write driver and local write drivers included correspondingly in the segments; and the global write driver including a first equalizer circuit, arranged in a switched-coupling between the LWB line and the LWB_bar line, and arranged in a control-coupling with respect to signals correspondingly on the GWB line and the GWB_bar line, and the global write driver and the local write drivers each including first inversion couplings (coupled in parallel between the GWB line and the LWB line) and second inversion couplings (coupled in parallel between the GWB_bar line and the LWB_bar line).