Embodiments herein provide for oxygen based treatment of low-k dielectric layers deposited using a flowable chemical vapor deposition (FCVD) process. Oxygen based treatment of the FCVD deposited low-k dielectric layers desirably increases the Ebd to capacitance and reliability of the devices while removing voids. Embodiments include methods and apparatus for making a semiconductor device including: etching a metal layer disposed atop a substrate to form one or more metal lines having a top surface, a first side, and a second side; depositing a passivation layer atop the top surface, the first side, and the second side under conditions sufficient to reduce or eliminate oxygen contact with the one or more metal lines; depositing a flowable layer of low-k dielectric material atop the passivation layer in a thickness sufficient to cover the one or more metal lines; and contacting the flowable layer of low-k dielectric material with oxygen under conditions sufficient to anneal and increase a density of the low-k dielectric material.

A semiconductor device includes a first dielectric layer over a device base layer, the first dielectric layer having a first opening with a first sidewall; a first interconnect segment extending through the first opening; and a cap layer over a top surface of the first interconnect segment, wherein the cap layer comprises a first metal, carbon, and nitrogen.

Methods and devices for forming a conductive line disposed over a substrate. A first dielectric layer is disposed over the substrate and coplanar with the conductive line. A second dielectric layer disposed over the conductive line and a third dielectric layer disposed over the first dielectric layer. A via extends through the second dielectric layer and is coupled to the conductive line. The second dielectric layer and the third dielectric layer are coplanar and the second and third dielectric layers have a different composition. In some embodiments, the second dielectric layer is selectively deposited on the conductive line.

An interconnection structure includes a first dielectric layer, a first conductive feature, a second dielectric layer, a conductive layer, a liner layer, a third dielectric layer, a second conductive feature, and a first capping layer. The first conductive feature is disposed in the first dielectric layer. The second dielectric layer is formed on the first dielectric layer, and the second dielectric layer is in direct contact with the first dielectric layer. The conductive layer is disposed in the second dielectric layer. The liner layer is disposed between the conductive layer and the second dielectric layer. The third dielectric layer is formed on the second dielectric layer. The second conductive feature is disposed in the third dielectric layer. The first capping layer is disposed between the second conductive feature and the third dielectric layer.

An integrated circuit device includes a fin-type active area that extends on a substrate in a first direction, a gate structure that extends on the substrate in a second direction and crosses the fin-type active area, source/drain areas arranged on first and second sides of the gate structure, and a contact structure electrically connected to the source/drain areas. The source/drain areas comprise a plurality of merged source/drain structures. Each source/drain area comprises a plurality of first points respectively located on an upper surface of the source/drain area at a center of each source/drain structure, and each source/drain area comprises at least one second point respectively located on the upper surface of the source/drain area where side surfaces of adjacent source/drain structures merge with one another. A bottom surface of the contact structure is non-uniform and corresponds to the first and second points.

A semiconductor device includes: a plurality of metal interconnections spaced apart over a substrate including a lower structure; a first hydrogen-containing layer covering the plurality of the metal interconnections; a dielectric layer formed over the first hydrogen-containing layer; an air gap formed between neighboring metal interconnections inside the dielectric layer; and a second hydrogen-containing layer formed over the dielectric layer.

Methods for selectively depositing on metallic surfaces are disclosed. Some embodiments of the disclosure utilize a hydrocarbon having at least two functional groups selected from alkene, alkyne, ketone, hydroxyl, aldehyde, or combinations thereof to form a self-assembled monolayer (SAM) on metallic surfaces.

Apparatuses and methods for controlling hydrogen diffusion to a substrate in manufacturing memory devices are described. An example apparatus includes: a substrate; an active region in the substrate; at least one first conductive material above the active region; a hydrogen source layer on the at least one first conductive material, the hydrogen source layer including hydrogen atoms and/or molecules and the hydrogen source layer configured to release the hydrogen atoms and/or molecules; a hydrogen diffusion barrier layer on the conductive layer; and at least one second conductive material above the hydrogen diffusion barrier layer, the at least one second conductive material coupled to the at least one first conductive material. The at least one first conductive material has hydrogen diffusion properties. The hydrogen diffusion barrier layer has hydrogen barrier properties.

The present disclosure involves forming a porous low-k dielectric structure. A plurality of conductive elements is formed over the substrate. The conductive elements are separated from one another by a plurality of openings. A barrier layer is formed over the conductive elements. The barrier layer is formed to cover sidewalls of the openings. A treatment process is performed to the barrier layer. The barrier layer becomes hydrophilic after the treatment process is performed. A dielectric material is formed over the barrier layer after the treatment process has been performed. The dielectric material fills the openings and contains a plurality of porogens.

Embodiments described herein relate generally to methods for forming a conductive feature in a dielectric layer in semiconductor processing and structures formed thereby. In some embodiments, a structure includes a dielectric layer over a substrate, a surface modification layer, and a conductive feature. The dielectric layer has a sidewall. The surface modification layer is along the sidewall, and the surface modification layer includes phosphorous and carbon. The conductive feature is along the surface modification layer.