An embodiment of the present invention provides a manufacturing method of an amorphous-silicon flat-panel X-ray sensor; the method reduces the number of mask plates to be used, simplifies the production processes, saves production costs, while also improving the product yield. The manufacturing method comprises: on a substrate, after a gate scan line is formed, forming a data line, a TFT switch element and a photosensitive element through one patterning process, wherein on the mask plate used in the patterning process, a region corresponding to a channel of the TFT switch element is semi-transmissive, whereas regions respectively corresponding to the data line, the photosensitive element and the portion of the TFT switch element other than the channel thereof are non-transmissive; thereafter, on the substrate formed with the TFT switch element and the photosensitive element, a passivation layer and a bias line are formed.

A photosensor includes a base substrate; an insulating layer on the base substrate; and a photodiode including a semiconductor junction on a side of the insulating layer away from the base substrate. The semiconductor junction includes a first polarity semiconductor layer, an intrinsic semiconductor layer, and a second polarity semiconductor layer, stacked on the insulating layer. The second polarity semiconductor layer encapsulates a lateral surface of the intrinsic semiconductor layer.

An imaging panel includes a photoelectric conversion element disposed on a substrate. The photoelectric conversion element includes a cathode electrode, a first semiconductor layer having a first conductive type, the first semiconductor layer being in contact with the cathode electrode, a second semiconductor layer having a second conductive type different from the first conductive type, the second semiconductor layer being joined to the first semiconductor layer, and an anode electrode in contact with the second semiconductor layer. The second semiconductor layer has a greater extinction coefficient as closer to the anode electrode.

A sensor package includes a semiconductor sensor chip having multiple light sensitive regions each of which defines a respective light sensitive channel. An optical filter structure is disposed over the sensor chip and includes filters defining respective spectral functions for different ones of the light sensitive channels. In particular, the optical filter structure includes at least three optical filters defining spectral functions for tristimulus detection by a first subset of the light sensitive channels, and at least one additional optical filter defining a spectral function for spectral detection by a second subset of the light sensitive channels encompassing a wavelength range that differs from that of the first subset of light sensitive channels.

A photoelectric conversion device includes: a substrate; a photoelectric conversion element provided on the substrate; a first protective layer provided on the photoelectric conversion element; and a second protective layer provided above the substrate and surrounding the photoelectric conversion element and the first protective layer, the second protective layer being lower in water vapor transmittance than the first protective layer. The second protective layer has an upper end positioned above an upper end of the first protective layer.

Provided are an infrared detecting device and an infrared detecting system including the infrared detecting device. The infrared detecting device includes at least one infrared detector, and the at least one infrared detector includes a substrate, a buffer layer, and at least one light absorbing portion. The buffer layer includes a superlattice structure.

A positive-intrinsic-negative (PIN) photosensitive device is provided. A p-type semiconductor layer composed of molybdenum oxide and having valence band energy between valence band energy of an intrinsic semiconductor layer and an upper electrode is used to replace a p-type semiconductor layer used in a conventional PIN photodiode, so that the PIN photodiode may be prepared without using borane gas. More, a difference between valence band energy of the p-type semiconductor layer and the intrinsic semiconductor layer is used to transport holes located in a valence band, so that it is unnecessary to use an active layer of a thin film transistor, so that the PIN photosensitive device may be stacked on the thin film transistor to reduce aperture ratio loss of a display panel.

An optical device includes a first conductive layer, a first junction layer, a light absorption layer, a second junction layer, and a second conductive layer. The first junction layer is disposed on the first conductive layer. The light absorption layer is disposed on the first junction layer, wherein the light absorption layer includes a plurality of unit cells, each of the unit cells includes a plurality of pillar structures, and the pillar structures of each of the unit cells are different sizes. The second junction layer is disposed on the light absorption layer. The second conductive layer is disposed on the second junction layer.

According to an aspect, a detection device includes: a substrate; a photoelectric conversion element that is provided to the substrate and comprises a semiconductor layer; a transistor that is provided corresponding to the photoelectric conversion element; a first insulating film that is provided on the substrate so as to cover the transistor; and a second insulating film that is provided on the first insulating film so as to cover the photoelectric conversion element and is formed of an organic material.

A fingerprint sensor, includes: a light sensing layer including a photo-sensing element to flow a sensing current according to incident light; and a collimator layer on the light sensing layer, the collimator layer including: a first light blocking layer having a plurality of first holes; a first light transmitting layer on the first light blocking layer; and a second light blocking layer on the first light transmitting layer, and having a plurality of second holes overlapping with the plurality of first holes.