Provided are a semiconductor memory device and a memory system including the same. The semiconductor memory device includes an external power supply voltage terminal configured to receive an external power supply voltage, an external ground voltage terminal configured to receive an external ground voltage, a ground voltage noise detector configured to detect a difference between the external ground voltage and an internal ground voltage of an internal ground voltage node and generate a ground voltage noise reference voltage, an internal power supply voltage reference voltage generator configured to generate an internal power supply voltage reference voltage based on the external power supply voltage and the ground voltage noise reference voltage, and an internal power supply voltage driver configured to generate an internal power supply voltage based on the internal power supply voltage reference voltage.

Transimpedance amplifiers with feedforward current are provided herein. In certain embodiments, an amplifier system includes a transimpedance amplifier that amplifies an input current received at an input to generate an output voltage at an output. The amplifier system further includes a controllable current source that is coupled to the output of the transimpedance amplifier, and operable to provide a feedforward current that changes in relation to the input current of the transimpedance amplifier. By providing a feedforward current in this manner, gain and speed performance of the transimpedance amplifier is enhanced.

A current integrator includes an operational amplifier, an integration capacitor and an offset cancelation capacitor. The operational amplifier includes a first input stage and a second input stage. The first input stage is coupled to an input terminal of the current integrator. The integration capacitor is coupled between the first input stage of the operational amplifier and an output terminal of the current integrator. The offset cancelation capacitor is coupled to the second input stage of the operational amplifier.

A differential input stage of a circuit includes a first transistor, a second transistor, a third transistor, and a fourth transistor. Drains of the first and third transistors couple together at a first node, and drains of the second and fourth transistors couple together at a second node. A first slew boost circuit includes a fifth transistor and a first current mirror. A gate of the fifth transistor couples to the second node. A source of the fifth transistor couples to the first node. The first current mirror couples to the fifth transistor and to the second node. A second slew boost circuit includes a sixth transistor and a second current mirror. A gate of the sixth transistor couples to the first node. A source of the sixth transistor couples to the second node. The second current mirror couples to the sixth transistor and to the first node.

An amplifying circuit may include: an amplifier configured to receive a first input voltage and output a first output voltage by amplifying the first input voltage; and a common-mode feedback circuit configured to enable the first output voltage to operate in a common mode by receiving the first output voltage and performing a feedback to adjust at least one feedback voltage applied to the amplifier based on the first output voltage. The common-mode feedback circuit may include a first Miller compensation circuit configured to perform dominant pole compensation by using a Miller effect for the common-mode feedback circuit. The first Miller compensation circuit may include a resistor and a capacitor.

Various embodiments of the present technology comprise a method and apparatus for an operational amplifier with a variable gain-bandwidth product. According to various embodiments, an amplifier circuit comprising the operational amplifier operates in multiple stages and provides a low gain-bandwidth and a high gain-bandwidth.

A semiconductor circuitry includes a first circuitry having a differential transistor pair and a pair of current sources connected in series to the differential transistor pair, a pair of transmission lines connected to the differential transistor pair at the opposite side to the current sources, and a second circuitry, connected to a node between the differential transistor pair and the current sources, and configured to test operations of at least the differential transistor pair and a latter-stage circuity connected to the transmission lines, in the state where the current outputs of the pair of current sources are stopped.

Provided are a semiconductor memory device and a memory system including the same. The semiconductor memory device includes an external power supply voltage terminal configured to receive an external power supply voltage, an external ground voltage terminal configured to receive an external ground voltage, a ground voltage noise detector configured to detect a difference between the external ground voltage and an internal ground voltage of an internal ground voltage node and generate a ground voltage noise reference voltage, an internal power supply voltage reference voltage generator configured to generate an internal power supply voltage reference voltage based on the external power supply voltage and the ground voltage noise reference voltage, and an internal power supply voltage driver configured to generate an internal power supply voltage based on the internal power supply voltage reference voltage.

An apparatus to prevent supply-to-ground current in a comparator is disclosed. The apparatus includes circuitry to determine if first and second output nodes of the comparator have respectively reached first and second logic levels, and circuitry responsive to a determination that the voltage at the first and second output nodes of the comparator has reached the first and second logic levels, to generate a signal. In addition, the apparatus includes circuitry to supply the signal to a transistor, the signal to turn off the transistor and prevent the flow of supply-to-ground current through the comparator.

A chopper amplifier circuit includes a first amplifier path with chopper circuitry, a switched-capacitor filter, and multiple gain stages. The chopper amplifier circuit also includes a second amplifier path with a feed-forward gain stage. A chopping frequency of the chopper circuitry is greater than a threshold frequency at which the second amplifier path is used instead of the first amplifier path.