A gain equalizer and a method for controlling a tunable gain of the gain equalizer are provided. The gain equalizer includes a common source stage and a switch array. The common source stage is configured to apply the tunable gain to an input signal, in order to generate an amplified signal. The common source stage includes input transistors and cascode transistors, wherein the cascode transistors are respectively coupled to the input transistors. The input transistors are configured to receive the input signal via gate terminals of the input transistors, respectively, and the cascode transistors are configured to output the amplified signal via drain terminals of the cascode transistors, respectively. In addition, the switch array is coupled between respective source terminals of the cascode transistors, wherein the tunable gain is controlled according to an equivalent impedance of the switch array.

A solid-state imaging device includes a first A/D converter circuit and a second A/D converter circuit per column. The first A/D converter circuit performs a first A/D conversion that (i) refines, using a first comparator, a range including a potential of an analog signal through a binary search, and (ii) generates, based on a result of the binary search, a first digital signal being a high-order portion of the digital signal. The second A/D converter circuit performs a second A/D conversion that generates a second digital signal being a low-order portion that is a remainder of the digital signal by measuring a time required for an output of the second comparator to be inverted, the second comparator comparing a quantitative relationship between the analog signal refined and a ramp signal.

An operational amplifier includes a single-stage amplifier and a current controller. The single-stage amplifier receives an input signal, and amplifies the input signal to generate an output signal, wherein the single-stage amplifier includes a voltage controlled current source circuit that operates in response to a bias voltage input. The current controller receives the input signal, and generates the bias voltage input according to the input signal.

A top-plate sampling analog-to-digital converter (ADC) circuit includes a first ADC stage and a residue amplifier coupled to the first ADC stage. The residue amplifier comprises a first transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a second transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a linearity adjustment circuit coupled to a second current terminal of at least one of the first transistor and the second transistor. The linearity adjustment circuit comprises at least one switch that changes its state as a function of an input sampling phase and a gain phase of the residue amplifier.

A top-plate sampling analog-to-digital converter (ADC) circuit includes a first ADC stage and a residue amplifier coupled to the first ADC stage. The residue amplifier comprises a first transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a second transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a linearity adjustment circuit coupled to a second current terminal of at least one of the first transistor and the second transistor. The linearity adjustment circuit comprises at least one switch that changes its state as a function of an input sampling phase and a gain phase of the residue amplifier.

Amplifier configuration for load-line enhancement is described herein. In some implementations, an apparatus includes an amplifier. The amplifier includes at least one plus transistor stack, at least one minus transistor stack, and at least one inductor. The at least one plus transistor stack is coupled to a plus amplifier node and a plus input node. The at least one minus transistor stack is coupled to a minus amplifier node and a minus input node. The at least one inductor is coupled between the plus amplifier node and the minus amplifier node, with the at least one inductor including an inter-inductor node. The amplifier also includes a minus power switch coupled between the minus amplifier node and one or more supply voltages and an inductor power switch coupled between the inter-inductor node and at least one supply voltage.

A solid-state imaging device includes a first A/D converter circuit and a second A/D converter circuit per column. The first A/D converter circuit performs a first A/D conversion that (i) refines, using a first comparator, a range including a potential of an analog signal through a binary search, and (ii) generates, based on a result of the binary search, a first digital signal being a high-order portion of the digital signal. The second A/D converter circuit performs a second A/D conversion that generates a second digital signal being a low-order portion that is a remainder of the digital signal by measuring a time required for an output of the second comparator to be inverted, the second comparator comparing a quantitative relationship between the analog signal refined and a ramp signal.

Amplifiers can be found in pipelined ADCs and pipelined-SAR ADCs as inter-stage amplifiers. The amplifiers can in some cases implement and provide gains in high speed track and hold circuits. The amplifier structures can be open-loop amplifiers, and the amplifier structures can be used in MDACs and samplers of high speed ADCs. The amplifiers can be employed without resetting, and with incomplete settling, to maximize their speed and minimize their power consumption. The amplifiers can be calibrated to improve performance.

Amplifier configuration for load-line enhancement is described herein. In some implementations, an apparatus includes an amplifier. The amplifier includes at least one plus transistor stack, at least one minus transistor stack, and at least one inductor. The at least one plus transistor stack is coupled to a plus amplifier node and a plus input node. The at least one minus transistor stack is coupled to a minus amplifier node and a minus input node. The at least one inductor is coupled between the plus amplifier node and the minus amplifier node, with the at least one inductor including an inter-inductor node. The amplifier also includes a minus power switch coupled between the minus amplifier node and one or more supply voltages and an inductor power switch coupled between the inter-inductor node and at least one supply voltage.

Bias circuits for CMOS power amplifiers are provided. The bias circuit includes a feedback module, a first bias module, and a second bias module. The feedback module has a first input connected to a output common mode voltage, a second input connected to a reference voltage, and an output connected to gates of main amplification transistors in a first differential amplification module; based on a difference between the output common mode voltage and the reference voltage, the feedback module adjusts gate voltages of main amplification transistors until the output common mode voltage is equal to the reference voltage; the first bias module provides bias voltages for the first differential amplification module; the second bias module provides bias voltages for a second differential amplification module. The present disclosure adopts direct negative feedback and cascoded current mirrors, which realize accurate DC gate bias and accurate control of the output common mode voltage.