Analog-to-digital converter (ADC) circuitry including a delay domain ADC that outputs converted analog input data along with a delay domain clock. A clock delay driver outputs a digital domain clock, an early clock leading the digital domain clock signal, and a late clock lagging the digital domain clock. An output latch latches the ADC output by the digital domain clock signal. The circuitry includes a timing error detection circuit with inputs receiving the delay domain clock, the early clock, and the late clock. The timing error detection circuit outputs early and late fail flags responsive to detecting timing errors of the digital domain clock relative to the early and late clocks, respectively. Timing loop circuitry has an input coupled to the error flag output of the timing error detection circuitry, and an output coupled to a control input of the clock delay driver.

Analog-to-digital converter (ADC) circuitry including a delay domain ADC that outputs converted analog input data along with a delay domain clock. A clock delay driver outputs a digital domain clock, an early clock leading the digital domain clock signal, and a late clock lagging the digital domain clock. An output latch latches the ADC output by the digital domain clock signal. The circuitry includes a timing error detection circuit with inputs receiving the delay domain clock, the early clock, and the late clock. The timing error detection circuit outputs early and late fail flags responsive to detecting timing errors of the digital domain clock relative to the early and late clocks, respectively. Timing loop circuitry has an input coupled to the error flag output of the timing error detection circuitry, and an output coupled to a control input of the clock delay driver.

In a semiconductor integrated circuit, a first analog circuit block operates by a voltage applied between a first node and a third node. Each of a plurality of first current sources has a first end connected to the third node and a second end connected to the first analog circuit block. The plurality of first current sources function as current sourcing or current sinking for the first analog circuit block. A first switch group is provided between the plurality of first current sources and the first analog circuit block, and in a test mode, individually switches electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to a second node.

Analog-to-digital converter (ADC) circuitry including a delay domain ADC that outputs converted analog input data along with a delay domain clock. A clock delay driver outputs a digital domain clock, an early clock leading the digital domain clock signal, and a late clock lagging the digital domain clock. An output latch latches the ADC output by the digital domain clock signal. The circuitry includes a timing error detection circuit with inputs receiving the delay domain clock, the early clock, and the late clock. The timing error detection circuit outputs early and late fail flags responsive to detecting timing errors of the digital domain clock relative to the early and late clocks, respectively. Timing loop circuitry has an input coupled to the error flag output of the timing error detection circuitry, and an output coupled to a control input of the clock delay driver.

The present disclosure relates to a dynamic D flip-flop, a register, a chip, and a data processing apparatus. A dynamic D flip-flop is provided, including: an input terminal, configured to receive input data; an output terminal, configured to provide output data in response to the input data; clock signal terminal(s), configured to receive clock signal(s); a first latch unit, configured to latch the input data from the input terminal and transmit the input data under control of the clock signal(s); and a second latch unit, configured to latch data from the first latch unit and transmit the data latched by the first latch unit under control of the clock signal(s), where the first latch unit and the second latch unit are sequentially connected in series between the input terminal and the output terminal, and where the output terminal is configured to use data from the second latch unit as the output data for outputting.