In one embodiment, a phase lock loop circuit includes a control circuit, wherein the control circuit is configured to input an estimation having a second frequency and a second phase. The second frequency is selected from a range of frequencies including a first frequency from an acquired signal. A numerically controlled oscillator is coupled to the control circuit, wherein the control circuit is configured to control an output response of the numerically controlled oscillator. The numerically controlled oscillator is configured to receive the estimation from the control circuit and generate an output signal in response to the estimation. A phase detector is coupled to the control circuit and the numerically controlled oscillator, wherein the phase detector is configured to compare the first signal and the output signal and produce a comparison output, the comparison output indicative of a phase difference between the first signal and the estimation.

An element includes a coupling line in which a first conductor layer, a dielectric layer, and a second conductor layer are stacked in this order, and which is connected to the second conductor layer in order to mutually synchronize a plurality of antennas at a frequency of a terahertz wave; and a bias line connecting a power supply for supplying a bias signal to a semiconductor layer and the second conductor layer. A wiring layer in which the coupling line is formed and a wiring layer in which the bias line is formed are different layers. The bias line is disposed in a layer between the first conductor layer and the second conductor layer.

A phase and frequency detector receives a reference clock signal with a period error and receives a feedback clock signal from a feedback divider. The feedback divider circuit divides a clock signal from a voltage controlled oscillator. The feedback divider divides by different divide values during odd and even cycles of the reference clock signal to cause the feedback clock signal to have a period error that substantially matches the period error of the reference clock signal. The divider values supplied to the feedback divider are determined, at least in part, by the period error of the reference clock signal.

A built-in self-test (BIST) block is provided that is incorporated into an all-digital phase locked loop (ADPLL) located on chip with the ADPLL. The BIST performs testing functions without need for support external to the chip. Test setup, test control, and test evaluation are performed entirely on chip. The BIST provides information regarding success or failure of the testing and can provide error information regarding test cases that do not pass successfully.

An element includes a coupling line in which a first conductor layer, a dielectric layer, and a second conductor layer are stacked in this order, and which is connected to the second conductor layer in order to mutually synchronize a plurality of antennas at a frequency of a terahertz wave; and a bias line connecting a power supply for supplying a bias signal to a semiconductor layer and the second conductor layer. A wiring layer in which the coupling line is formed and a wiring layer in which the bias line is formed are different layers. The bias line is disposed in a layer between the first conductor layer and the second conductor layer.

A time-to-digital converter (TDC) circuit generates a digital output indicating a time, known as a phase difference, from a phase of the generated signal to a corresponding phase of a reference signal. The digital output is used by the digitally controlled oscillator (DCO) to correct for the phase/frequency difference to synchronize the generated signal with the reference signal. In an aspect, an adaptive TDC circuit generates a first digital indication in a coarse mode when the offset time is above a threshold and generates a second digital indication in a fine mode when the offset time is below the threshold. The first digital indication and the second digital indication each comprise a same number of bits, and the first digital indication is normalized to the second digital indication for the digital output of the adaptive TDC circuit. A fractional bit may be employed to compensate for a quantization error.

An oscillator circuit includes a current source, an oscillating section, a first capacitor, and a setting section. The current source is coupled to a connection node and causes a current having a current value based on an input voltage to flow from a first power node to the connection node. The oscillating section is on a current path between the connection node and a second power node. The oscillating section oscillates at an oscillation frequency based on a current flowing through the current path. The first capacitor is between the connection node and the second power node. The first capacitor has a capacitance that varies in accordance with a voltage at the connection node. The setting section that performs variation operation based on the voltage at the connection node. The variation operation is operation of varying an impedance between the connection node and the second power node.

An oscillator includes a tunable resonant circuit having an inductance and a variable capacitance coupled between first and second nodes, and a set of capacitances selectively coupleable between the first and second nodes. An input control node receiving an input control signal is coupled to the variable capacitance and set of capacitances. The tunable resonant circuit is tunable based on the input control signal. A biasing circuit biases the tunable resonant circuit to generate a variable-frequency output signal between the first and second nodes. A voltage divider generates a set of different voltage thresholds, and a set of comparator circuits with hysteresis compares the input control signal to the set of different voltage thresholds to generate a set of control signals. The capacitances in the set of capacitances are selectively coupleable between the first and second nodes as a function of control signals in the set of control signals.

In one embodiment, a phase lock loop circuit includes a control circuit, wherein the control circuit is configured to input an estimation having a second frequency and a second phase. The second frequency is selected from a range of frequencies including a first frequency from an acquired signal. A numerically controlled oscillator is coupled to the control circuit, wherein the control circuit is configured to control an output response of the numerically controlled oscillator. The numerically controlled oscillator is configured to receive the estimation from the control circuit and generate an output signal in response to the estimation. A phase detector is coupled to the control circuit and the numerically controlled oscillator, wherein the phase detector is configured to compare the first signal and the output signal and produce a comparison output, the comparison output indicative of a phase difference between the first signal and the estimation.

A calibration system of a digital phase locked loop (DPLL) includes a calibration circuit and a digitally controlled oscillator (DCO). The calibration circuit is configured to receive an input signal and a feedback signal, and generate a digital signal, based on a frequency of the input signal, a frequency of the feedback signal, and an input bias code. The DCO is configured to receive the input bias code and the digital signal, and generate a bias signal based on the input bias code. The DCO is further configured to generate an analog signal based on the bias signal and the digital signal, and generate the feedback signal such that the frequency of the feedback signal is based on an amplitude of the analog signal.