A time-interleaved digital-to-analog converter (DAC) uses M DAC cores to convert a digital input signal whose digital input words are spread to different DAC cores to produce a final analog outputs. The M DAC cores, operating in a time-interleaved fashion, can increase the sampling rate several times compared to the sampling rate of just one DAC. However, sequential time-interleaving DAC cores often exhibit undesirable spurs at the output. To spread those spurs to the noise floor, the time-interleaving DAC cores can be selected at a pseudo randomized manner or in a specific manner which can break up the sequential or periodic manner of selecting the DAC cores.

In a general aspect, an apparatus can include a signal analyzer configured to analyze a signal associated with a processing pipeline, and a dynamic element matching (DEM) selection module configured to select a DEM algorithm from a plurality of DEM algorithms based on the analysis performed by the signal analyzer. The apparatus can include a set of circuit elements where each circuit element from the set of circuit elements has the same logical configuration, and a circuit element selection module configured to select a subset of the set of circuit elements based on the selected DEM algorithm.

An apparatus comprising M time-interleaved analog to digital converters (ADC) that sample an input signal at M sampling phases, wherein M is equal to or greater than 4. A phase control circuit adjusts at least M1 sampling phases of the M sampling phases. The phase control circuit comprises M1 phase error detector circuits. Each phase error detector circuit detects a corresponding phase error for a corresponding sampling phase of the M1 sampling phases based on a sample captured at a sampling phase of the M sampling phases immediately preceding the corresponding sampling phase and a sample captured at a sampling phase of the M sampling phases immediately subsequent to the corresponding sampling phase.

A time-interleaved digital-to-analog converter (DAC) uses M DAC cores to convert a digital input signal whose digital input words are spread to different DAC cores to produce a final analog outputs. The M DAC cores, operating in a time-interleaved fashion, can increase the sampling rate several times compared to the sampling rate of just one DAC. However, sequential time-interleaving DAC cores often exhibit undesirable spurs at the output. To spread those spurs to the noise floor, the time-interleaving DAC cores can be selected at a pseudo randomized manner or in a specific manner which can break up the sequential or periodic manner of selecting the DAC cores.

A device (e.g., SAR ADC device) include a DAC circuit and generates a digital output based on logic circuitry that includes SAR logic. Additional logic circuitry includes delta modulation circuitry and dynamic element matching circuitry. The delta modulation circuitry provides several digital outputs of the SAR DAC, while the dynamic element matching circuitry selects a different set of capacitors from the DAC circuit. Each cycle is added together and averaged, and then added to the digital output from the SAR logic.

A time-interleaved analog-to-digital converter (ADC) having M ADCs can increase the sampling speed several times compared to the sampling speed of just one ADC. Some time-interleaved ADCs randomize the order of the M ADCs sampling the analog input signal to improve dynamic performance. Randomization causes the output data of the M ADCs to be valid at randomized time instants. When the output data is sampled using a rising edge of a fixed clock, the output data can be valid just before, valid right at, or only valid for a short period of time after, the rising edge. Therefore, the setup or hold time can be very short. To address this issue, information regarding the randomized selection of an ADC is used to control the sampling occurring in the fixed clock domain and avoid the short setup or hold time.

A system includes a first circuit configured to provide a digitally pre-distorted input signal, a digital-to-analog converter including a number of unit elements, a digital input, and a digital output. Each unit element is configured to receive a reference voltage and to be controllable by a control signal provided in response to the digitally pre-distorted input signal. The digital-to-analog converter provides an analog output. The first circuit is configured to reduce distortion due to signal dependent changes to the reference voltage. The signal dependent changes can be due at least in part to current through the supply network that supplies the reference voltage. The digital to analog converter can be a voltage mode converter.

A digital-to-analog converter and an operation method thereof are provided. The digital-to-analog converter includes a current source module, a decoder, a change indicator, and a random number generator. The decoder is coupled to the current source module and receives a digital input signal. The change indicator is coupled to the decoder and provides an indication signal to the decoder. The random number generator is coupled to the change indicator and provides a random number signal to the change indicator. The change indicator generates an indication signal according to the random number signal, and the decoder generates a control signal to the current source module according to the digital input signal and the indication signal, so that the current source module generates an analog output signal corresponding to the digital input signal according to the control signal.

An apparatus comprising M time-interleaved analog to digital converters (ADC) that sample an input signal at M sampling phases, wherein M is equal to or greater than 4. A phase control circuit adjusts at least M1 sampling phases of the M sampling phases. The phase control circuit comprises M1 phase error detector circuits. Each phase error detector circuit detects a corresponding phase error for a corresponding sampling phase of the M1 sampling phases based on a sample captured at a sampling phase of the M sampling phases immediately preceding the corresponding sampling phase and a sample captured at a sampling phase of the M sampling phases immediately subsequent to the corresponding sampling phase.

A digital to analog converter convert digital data in binary format to thermometer bit vectors. A first set of the thermometer bit vectors corresponds to most significant bits of the digital data and a second set of the thermometer bit vectors corresponds to least significant bits of the digital data. Connections of first current sources corresponding to the first set of the thermometer bit vectors and second current sources corresponding to the second set of the thermometer bit vectors are dynamically and randomly alternated to a first output line and a second output line. Calibration current is applied to the second current sources so a total current of the second current sources and the calibration current is within a predetermined range of an average current of the first current sources.