Patent classifications
H03M1/363
Pipelined analog-to-digital converter
Pipelined analog-to-digital converters (ADCs) include a flash ADC that reduces noise tones in power supply current drawn by the flash ADC. A pipelined analog-to-digital converter (ADC) includes a flash ADC and error correction circuitry coupled to the flash ADC. The flash ADC includes a plurality of latched comparators and a plurality of driver circuits. Each of the latched comparators includes an inverting output and a non-inverting output. Each of the driver circuits is coupled to one of the latched comparators, and includes an input terminal and an output terminal. In a first subset of the driver circuits the input terminal is coupled to the inverting output of one of the latched comparators. In a second subset of the driver circuits the input terminal is coupled to the non-inverting output of one of the latched comparators.
DIGITAL TEMPERATURE SENSING CIRCUIT
The digital temperature sensing circuit includes a temperature voltage generator configured to generate a temperature voltage varying with a temperature in response to a first reference voltage, divide a supply voltage in response to a second reference voltage, and generate a high voltage and a low voltage, a code voltage generator configured to divide the second reference voltage based on the high voltage and the low voltage and output divided voltages having different voltage levels, and a mode selector supplied with the temperature voltage and the divided voltages, and configured to output a first code or a second code in response to a mode select signal, wherein the first code and the second code have different numbers of bits.
Analog-to-digital conversion circuit, analog-to-digital conversion device, and digital x-ray imaging system
Disclosed are an analog-to-digital conversion circuit, an analog-to-digital conversion device, and a digital x-ray imaging system. The analog-to-digital conversion circuit includes a first reference voltage source, a second reference voltage source, a first analog-to-digital converter connected to the first reference voltage source, a second analog-to-digital converter connected to the second reference voltage source, a connecting circuit connected to the first analog-to-digital converter and the second analog-to-digital converter, respectively, and a current source having negative temperature coefficient configured to be connected to the first reference voltage source and the second reference voltage source, respectively.
DOUBLE DATA RATE TIME INTERPOLATING QUANTIZER WITH REDUCED KICKBACK NOISE
A flash analog to digital converter (ADC) includes a first, second, and third double data rate comparator core configured to determine a relative voltage of a first differential input signal during each of a rising edge and a falling edge in a single clock cycle of a comparator clock input to the comparator core. An inverted comparator clock coupled to the third comparator core reduces kickback noise. The ADC includes a first and a second floating voltage reference configured to shift a voltage of a differential comparator input by a fixed amount, and produce the first and second differential input signal. The third comparator core is cross coupled between the first and second comparator core.