A time-interleaved analog to digital converter includes capacitor array circuits, at least one successive approximation register circuitry, and at least one noise shaping circuitry. The capacitor array circuits are configured to alternately sample an input signal, in order to generate a sampled input signal. The at least one successive approximation register circuitry is configured to perform an analog to digital conversion according to the sampled input signal and a residue signal, in order to generate at least one digital output. The at least one noise shaping circuitry is configured to utilize at least one first circuit in switched-capacitor circuits to transfer the residue signal from a first capacitor array circuit in the capacitor array circuits, and randomly select at least one second circuit from the switched-capacitor circuits to cooperate with a second capacitor array circuit in the capacitor array circuits to sample the input signal.

A semiconductor device includes an analog-to-digital converter configured to perform a process of sampling an analog input signal and a successive-approximation process, execute an AD conversion process, and output a digital output signal. The AD converter includes an upper DAC, a redundant DAC, a lower DAC, a comparator configured to compare a comparative reference voltage and output voltages of the upper DAC, the redundant DAC and the lower DAC, a control circuit configured to control successive approximations by the upper DAC, the redundant DAC and the lower DAC based on the comparison result of the comparator, and generate a digital output signal, and a correction circuit. The correction circuit includes an error correction circuit configured to correct an error of the upper bit with the redundant bit, and an averaging circuit configured to calculate an average value of conversion values of a plurality of the lower bits supplied multiple times.

An analog-to-digital converter (ADC) is provided. In some examples, the ADC includes a first reference voltage supply input, a second reference voltage supply input, a comparator comprising an input node, and a first reference switch coupled between the second reference voltage supply input and the input node of the comparator. The ADC also includes a set of capacitors, where each capacitor of the set of capacitors comprises a first terminal. In addition, the ADC includes a second reference switch coupled between the first reference voltage supply input and the first terminal of each capacitor of the set of capacitors. The ADC further includes a third switch coupled between the input node of the comparator and the first terminal of each capacitor of the set of capacitors.

An AD converter includes: a DA converter; a comparator configured to be capable of resetting a comparison output signal to a first level after a comparison operation is performed based on an output of the DA converter and before a next comparison operation is performed; a level shifter configured to be capable of level-shifting and outputting the comparison output signal such that a change from the first level to a second level is faster than a change from the second level to the first level; a register configured to be capable of obtaining the output of the level shifter; and a logic circuit configured to be capable of controlling the DA converter.

A successive approximation register (SAR) analog-to-digital converter (ADC) includes a plurality of differential capacitive digital-to-analog converters (C-DACs), comparators, and an SAR controller. Each differential C-DAC comprises a pair of C-DACs for positive and negative polarities and each C-DAC comprises a capacitor array. A capacitor for each bit position may include a pair of equal-sized capacitors. Each outer comparator is coupled to one of the differential C-DACs and the middle comparator is coupled to a differential output node pair of C-DACs from two differential C-DACs. The SAR controller generates a control signal for the differential C-DACs for each conversion step based on outputs of the comparators. The outputs of the comparators are provided to the differential C-DACs as the control signal without encoding. Single-bit/cycle shorting switches for shorting top plates of capacitors of the C-DACs of same polarity may be closed during a single-bit/cycle conversion.

An analog-digital conversion circuit is disclosed for comparing a comparison potential with a reference potential generated based on a reference power supply to convert a comparison potential to a digital value. An analog-to-digital converter generates the comparison potential based on a sampled and held input potential, the digital value, and the reference power supply. A current amount control unit controls current amount flowing to the current amount control element in each bit circuit. In response to second switches of the bit circuits being turned on in order from the upper bit in each bit circuit by the digital value, the current amount control unit applies a current control potential to the current amount control element in any of the bit circuits that the noise current is more than allowable value while the noise current proportional to the charge flowing from the capacitor is more than the allowable value.

A conversion circuit for converting a current signal into a first output voltage signal, where the current signal flows through a sensing component, is provided. The conversion circuit includes: a first current eliminating circuit, configured to eliminate a first current in the current signal. The first current eliminating circuit includes: a current sample and hold circuit; and a current driving circuit, coupled between the sensing component and the current sample and hold circuit; a second current eliminating circuit, coupled to the sensing component and configured to eliminate a second current in the current signal; and an integrating circuit, coupled to the sensing component and configured to integrate a third current in the current signal, and output a first input voltage signal between a first integration output terminal and a second integration output terminal.

A capacitor circuit includes: a capacitor array including a plurality of capacitors; a switch array including a plurality of switch circuits, the switch circuits being respectively connected to the capacitors of the capacitor array; a plurality of switch control signal lines supplied with a plurality of switch control signals; and a substrate having a major surface on which the switch circuits are formed. At least part of the capacitors of the capacitor array is formed of a first conductive layer. The switch control signal lines are formed of a second conductive layer provided between the major surface and the first conductive layer. The capacitor array and the switch array are disposed so as to overlap each other at least in part in a plan view when viewed in a normal direction of the major surface.

Disclosed is a calibration method of a capacitor array type successive approximation register analog-to-digital converter, comprising: obtaining an actual weight value of capacitors of a target bit and an error code between the actual weight value and an ideal weight value of the capacitors of the target bit; calibrating an output code of the SAR ADC to be calibrated with the error code by corresponding addition or subtraction to obtain a final calibrated output code. The calibration method breaks through the requirement that non-binary weights must meet the redundancy, and can realize a weight calibration in a traditional binary ADC and a digital calibration by simple addition and subtraction on the basis of the original code obtained by an analog-to-digital conversion, thus effectively avoiding the error problem in the traditional technology, increasing the calibration precision and accuracy, reducing the circuit complexity and calculation complexity caused by the non-binary weights calibration.

A successive approximation register (SAR) analog-to-digital converter (ADC) comprises a comparator for generating a comparison value according to an analog signal; a SAR, coupled to the comparator, comprises N memory units, each memory unit storing a control value and the N control values being related to the comparison value, N being an integer greater than two; and a thermometer-coded DAC, which generates the analog signal and is coupled to the comparator and the SAR. The thermometer-coded DAC comprises N capacitors. The N capacitors are respectively coupled to the N memory units. The N terminal voltages of the N capacitors are respectively controlled by the N control values.