This analog-to-digital converting device comprises: an input terminal for receiving the analog input signal; an output terminal for issuing the digital output signal; a first successive approximation register analog-to-digital conversion module, called first SAR ADC module, connected to the input terminal; a first feedback module associated to the first SAR ADC module; a second successive approximation register analog-to-digital conversion module, called second SAR ADC module, connected in a cascaded manner to the first SAR ADC module; a second feedback module associated to the second SAR ADC module; and a multiplexing module connected to the first and second SAR ADC modules, to deliver the digital output signal.

A residue transfer loop, a successive approximation register analog-to-digital converter and a gain calibration method are disclosed. In particular, the residue transfer loop includes a sampling switch module, a logic controlling circuit, a residue holding capacitor module, a DAC capacitor array, a residue transfer module, a current rudder, a reset switch module and a charge sharing switch module. The logic controlling circuit sequentially outputs control signals according to preset time intervals in a preset period to control the reset switch module, the residue transfer module, the sampling switch module and the charge sharing switch module to work sequentially, thereby realizing a residue transfer.

An analog-to-digital converter (ADC) is provided. The ADC receives an analog input signal and generates a digital code. The ADC includes a sigma-delta modulator (SDM), a decimation filter and a detection circuit. The SDM includes a loop filter, a quantizer and a digital-to-analog converter (DAC). The loop filter receives the analog input signal. The quantizer is coupled to the loop filter and quantizes an output of the loop filter to generate a digital output signal. The DAC is coupled to the quantizer and the loop filter. The decimation filter is coupled to the SDM and converts the digital output signal into the digital code. The detection circuit is coupled to the SDM and detects a node voltage of the SDM and generate a control signal. The control signal is utilized to control the loop filter, the quantizer, a feedback path of the SDM and/or a feedforward path of the SDM.

Herein disclosed are some examples of metastability detectors and compensator circuitry for successive-approximation-register (SAR) analog-to-digital converters (ADCs) within delta sigma modulator (DSM) loops. A metastability detector may detect metastability at an output of a SAR ADC and compensator circuitry may implement a compensation scheme to compensate for the metastability. The identification of the metastability and/or compensation for the metastability can avoid detrimental effects and/or errors to the DSM loops that may be caused by the metastability of the SAR ADCS.

This analog-to-digital converting device comprises: an input terminal for receiving the analog input signal; an output terminal for issuing the digital output signal; a first successive approximation register analog-to-digital conversion module, called first SAR ADC module, connected to the input terminal; a first feedback module associated to the first SAR ADC module; a second successive approximation register analog-to-digital conversion module, called second SAR ADC module, connected in a cascaded manner to the first SAR ADC module; a second feedback module associated to the second SAR ADC module; and a multiplexing module connected to the first and second SAR ADC modules, to deliver the digital output signal.

The present invention provides an ADC including a first switched capacitor array, a second switched capacitor array, a third switched capacitor array, an integrator and a quantizer. The first switched capacitor array is configured to sample the input signal to generate a first sampled signal. The second switched capacitor array is configured to sample the input signal to generate a second sampled signal and generate a first quantization error. The third switched capacitor array is configured to sample the input signal to generate a third sampled signal and generate a second quantization error. The integrator is configured to receive the first quantization error and the second quantization error in a time-interleaving manner, and integrate the first/second quantization error to generate an integrated quantization error. The quantizer is configured to quantize the first sampled signal by using the integrated quantization error as a reference voltage to generate a digital output signal.

A pixel circuit that includes: a substrate body having a channel influenced by an electric field; an aperture in communication with the channel for receiving a fluorescent light input and moving electrons through the substrate body; and a plurality of sampling devices adapted to be switched on simultaneously to sample the moving electrons.

A delta-sigma modulator includes a first combining circuit, a loop filter circuit, a quantizer circuit, a truncator circuit, a first digital-to-analog converter (DAC) circuit, and a compensation circuit. The first combining circuit generates a first analog signal by combining an analog feedback signal and an analog input signal. The loop filter circuit generates a loop-filtered signal according to the first analog signal. The quantizer circuit outputs a first digital signal that is indicative of a digital combination result of at least a truncation error compensation signal and the loop-filtered signal. The truncator circuit performs truncation upon the first digital signal to generate a second digital signal. The first DAC circuit generates the analog feedback signal according to the second digital signal. The compensation circuit generates the truncation error compensation signal according to a truncation error resulting from truncation performed upon the first digital signal.

The present invention provides an ADC for receiving at least an input signal to generate a digital output signal, wherein the ADC includes an input terminal and a plurality of output terminals, the input terminal is arranged to receive the input signal, and each of the output terminals is configured to output one bit of the digital output signal. The ADC is controlled to operate in a normal mode or a low power mode, and when the ADC operates in the normal mode, all of the output terminals are enabled to output the bits to form the digital output signal; and when the ADC operates in the low power mode, only a portion of the output terminals are enabled to output the bits to form the digital output signal.

The present invention provides an ADC including a first switched capacitor array, a second switched capacitor array, a third switched capacitor array, an integrator and a quantizer. The first switched capacitor array is configured to sample the input signal to generate a first sampled signal. The second switched capacitor array is configured to sample the input signal to generate a second sampled signal and generate a first quantization error. The third switched capacitor array is configured to sample the input signal to generate a third sampled signal and generate a second quantization error. The integrator is configured to receive the first quantization error and the second quantization error in a time-interleaving manner, and integrate the first/second quantization error to generate an integrated quantization error. The quantizer is configured to quantize the first sampled signal by using the integrated quantization error as a reference voltage to generate a digital output signal.