An X-ray diagnosis apparatus according to an embodiment includes an X-ray tube, judging circuitry, and grid controlling circuitry. The X-ray tube is configured to radiate X-rays. The judging circuitry is configured to judge whether a voltage should be applied to a grid of the X-ray tube or not, in accordance with a radiation condition. The grid controlling circuitry is configured to apply the voltage to the grid, if the judging circuitry has determined that the voltage should be applied.

An X-ray diagnosis apparatus according to an embodiment includes an X-ray tube, judging circuitry, and grid controlling circuitry. The X-ray tube is configured to radiate X-rays. The judging circuitry is configured to judge whether a voltage should be applied to a grid of the X-ray tube or not, in accordance with a radiation condition. The grid controlling circuitry is configured to apply the voltage to the grid, if the judging circuitry has determined that the voltage should be applied.

The present invention relates to an X-ray imaging apparatus that includes a bias voltage source that provides a bias voltage to pixels that detect X-rays and an automatic exposure control (AEC) processing unit that detects a current flowing between the bias voltage source and the pixels and outputs an AEC signal.

An X-ray projection of a region of examination and an associated X-ray parameter are received via an interface, the X-ray projection including X-ray intensities in a first pixel set. The X-ray parameter relates to at least one X-ray voltage from an X-ray source. Scattered radiation intensity is determined in a second pixel set, the second pixel set being a subset of the first pixel set. A first calculation of first exposure parameters in the second pixel set then occurs, each of the first exposure parameters in a pixel of the second pixel set being based on the X-ray intensity in the pixel and the scattered radiation intensity in the pixel. Furthermore, a second calculation of a scalar second exposure parameter occurs based on the first exposure parameters and an adjustment of the X-ray parameter is performed by comparing the scalar second exposure parameter with a reference value.

A radiation imaging system includes a two-dimensional array in which a plurality of elements which detect radiation are two-dimensionally arrayed. The plurality of elements includes a plurality of detectors usable for exposure control of stopping radiation irradiation in accordance with a fact that a radiation irradiation dose has reached a target irradiation dose. The radiation imaging system includes a controller configured to determine, based on a setting of a reading manner of signals from the plurality of detectors, a minimum irradiation time required from the start of radiation irradiation until the stop of radiation irradiation according to signals from the two-dimensional array and perform an error process when the minimum irradiation time exceeds a reference irradiation time.

A radiation imaging system includes a two-dimensional array in which a plurality of elements which detect radiation are two-dimensionally arrayed. The plurality of elements includes a plurality of detectors usable for exposure control of stopping radiation irradiation in accordance with a fact that a radiation irradiation dose has reached a target irradiation dose. The radiation imaging system includes a controller configured to determine, based on a setting of a reading manner of signals from the plurality of detectors, a minimum irradiation time required from the start of radiation irradiation until the stop of radiation irradiation according to signals from the two-dimensional array and perform an error process when the minimum irradiation time exceeds a reference irradiation time.

A sensor panel of an electric cassette is provided with detection pixels for AEC to stop X-ray irradiation when an accumulated dose of the X-rays reaches a target dose. A plurality of small blocks each containing a plurality of the detection pixels for calculating the accumulated dose are disposed in each of a plurality of large blocks obtained by dividing an imaging area. The small blocks are disposed so as not to be overlapped with each other in a Y direction.

A sensor panel of an electric cassette is provided with detection pixels for AEC to stop X-ray irradiation when an accumulated dose of the X-rays reaches a target dose. A plurality of small blocks each containing a plurality of the detection pixels for calculating the accumulated dose are disposed in each of a plurality of large blocks obtained by dividing an imaging area. The small blocks are disposed so as not to be overlapped with each other in a Y direction.

An X-ray projection of a region of examination and an associated X-ray parameter are received via an interface, the X-ray projection including X-ray intensities in a first pixel set. The X-ray parameter relates to at least one X-ray voltage from an X-ray source. Scattered radiation intensity is determined in a second pixel set, the second pixel set being a subset of the first pixel set. A first calculation of first exposure parameters in the second pixel set then occurs, each of the first exposure parameters in a pixel of the second pixel set being based on the X-ray intensity in the pixel and the scattered radiation intensity in the pixel. Furthermore, a second calculation of a scalar second exposure parameter occurs based on the first exposure parameters and an adjustment of the X-ray parameter is performed by comparing the scalar second exposure parameter with a reference value.

An X-ray projection of a region of examination and an associated X-ray parameter are received via an interface, the X-ray projection including X-ray intensities in a first pixel set. The X-ray parameter relates to at least one X-ray voltage from an X-ray source. Scattered radiation intensity is determined in a second pixel set, the second pixel set being a subset of the first pixel set. A first calculation of first exposure parameters in the second pixel set then occurs, each of the first exposure parameters in a pixel of the second pixel set being based on the X-ray intensity in the pixel and the scattered radiation intensity in the pixel. Furthermore, a second calculation of a scalar second exposure parameter occurs based on the first exposure parameters and an adjustment of the X-ray parameter is performed by comparing the scalar second exposure parameter with a reference value.