An analog to digital converter (ADC) comprising: a delay circuit having a complementary signal output; a first comparator having an input coupled to the complementary signal output of the delay circuit, the first comparator having a first output and a second output; a first dummy comparator having a first dummy input coupled to the first output and a second dummy input coupled to the second output, the first dummy comparator having a dummy output; a first interpolation comparator having an interpolation output and a first interpolation input coupled to the first output; a second dummy comparator having an input coupled to the interpolation output; and a second interpolation comparator having a second interpolation input and a third interpolation input, the second interpolation input coupled to the interpolation output and the third interpolation input coupled to the dummy output.

Comparator circuitry for use in a comparator to capture differences between magnitudes of a pair of comparator input signals in a series of capture operations defined by a reset signal, the circuitry comprising: latch circuitry, comprising a pair of latch input transistors which form corresponding parts of first and second current paths of the latch circuitry respectively, which current paths extend in parallel between high and low voltage sources, a pair of latch output nodes at corresponding positions along the first and second current paths of the latch circuitry respectively, and timing circuitry; and gain-stage circuitry, comprising a pair of cross-coupled gain-stage output transistors connected along respective first and second current paths of the gain-stage circuitry which extend in parallel between high and low voltage sources, and a pair of diode-connected gain-stage output transistors connected in parallel with the pair of cross-coupled gain-stage output transistors, respectively.

A comparator includes a pair of back-to-back negative-AND (NAND) gates and a delay circuit coupled to the pair of back-to-back NAND gates. The delay circuit is configured to modulate a triggering clock signal by an input voltage to generate a delayed clock signal with a delay that is based on the input voltage. Each of the pair of back-to-back NAND gates is configured to receive the delayed clock signal and generate a comparator output signal based on the delayed clock signal.

According to one embodiment, there is provided a semiconductor integrated circuit including a first line, a second line, a third line, a fourth line, a latch circuit, a first offset adjustment circuit, and a second offset adjustment circuit. The second line forms a differential pair with the first line. The fourth line forms a differential pair with the third line. The latch circuit has a first input node, a second input node, a first output node, and a second output node. The first input node is electrically connected to the first line. The second input node is electrically connected to the second line. The first output node is electrically connected to the third line. The second output node is electrically connected to the fourth line. The first offset adjustment circuit is electrically connected between the first line and the third line. The second offset adjustment circuit has a circuit configuration equivalent to the first offset adjustment circuit. The second offset adjustment circuit is electrically connected between the second line and the fourth line.

A memory device including an interface to receive one or more clock signals and one or more data signal a dual-sensing stage dual-tail latch arranged at the interface. The dual-sensing stage dual-tail latch includes a sensing stage to sense a differential voltage between a first signal and a second signal and to provide a first differential voltage output and a second differential voltage output to a first node and a second node, respectively. The dual-sensing stage dual-tail latch includes a complimentary sensing stage arranged in parallel with the sensing stage and to sense the differential voltage between the first signal and the second signal, where a first complimentary differential output voltage and a second complimentary differential output of the complimentary sensing stage are coupled to the first node and the second node. The dual-sensing stage dual-tail latch includes a latch stage to receive the outputs from the first node and the second node.

The present invention corresponds to a method and a circuit for compensating the offset voltage of electronic circuits, where the circuit implementing the method comprises: a dynamic comparator (1); a phase detector (6) connected to the dynamic comparator (1), the phase detector (6); a finite-state machine (9) connected to the phase detector (4), a first digital-analog converter (12) connected to an output of the finite-state machine (9); a second digital-analog converter (13) connected to another output (11) of the finite-state machine (9); a polarization block (14) with a first input (15) connected to the output of the first digital-analog converter (12) and a second input (16) connected to the output of the second digital-analog converter (13); where the polarization block (14) polarizes an electronic circuit (17) and the dynamic comparator (1), the phase detector (6), and the finite-state machine (9) are connected to a clock signal (3). The method is characterized by the following steps: a) connecting a dynamic comparator to the output of the electronic circuit; b) measuring the phase change of the dynamic comparator outputs of step a by means of a phase detector; c) controlling the output signals of a finite-state machine according to the phase detector output of step b, which can be coded forward, backward or in phase; c) converting the output of the finite-state machine of step c to an analog signal using two digital-analog converters; d) connecting the output of the two digital-analog converters of step d to the control terminal of the electronic circuit polarization block; and, e) modifying the polarization current of the electronic circuit polarization block by means of the output signals of the two digital-analog converters connected in step e.

The invention relates to a high-speed decision device that comprises a first branch and a second branch that are connected in parallel between a power supply end and a clock signal input end; wherein the first branch is used for providing a normal-phase input end, and the second branch is used for providing an inverted-phase input end; a first adjusting point and a second adjusting point are arranged; and an adjusting branch is arranged between the first adjusting point and the second adjusting point, and the adjusting branch is used for adjusting the response speed when the clock signal changes. The benefit of the invention is that the response time of the circuit is further improved, the resolution of the high-speed decision device is improved, and the clock and data recovery performance of the high-speed decision device is further improved.

Comparators are implemented in many circuits, including analog-to-digital converters (ADCs). Some ADCs demand high bandwidth, low power consumption, and high speed. To address these requirements, a comparator circuit can be implemented without a separate pre-amplifier, where a sampling network drives a latch directly. Specifically, the comparator circuit integrates a pre-amplifier within the latch in a manner that ensures low power and high speed operation.

Comparators are implemented in many circuits, including analog-to-digital converters (ADCs). Some ADCs demand high bandwidth, low power consumption, and high speed. To address these requirements, a comparator circuit can be implemented without a separate pre-amplifier, where a sampling network drives a latch directly. Specifically, the comparator circuit integrates a pre-amplifier within the latch in a manner that ensures low power and high speed operation.

An Analog to Digital (ADC) is provided, where the ADC may include a sample and hold circuitry to sample an analog input signal, and a summation block to iteratively generate a subtraction signal. The subtraction signal may be based on a difference between the analog input signal and a feedback signal. The ADC may further include a common input stage to receive the subtraction signal, and a plurality of comparison and latch circuitries arranged in parallel, where individual ones of the plurality of parallel comparison and latch circuitries may sequentially receive an output of the common input stage.