The present invention relates to a combiner latch circuit for generation of one phase differential signal pair or two phase differential signal pairs. The combiner latch circuit comprises an input circuit configured to select a state of the output circuit from a group of: a fourth state comprising the differential output X=1, Y=0, a fifth state comprising the differential output X=0, Y=1. The input circuit is further configured to select the fourth state if the input A=0 and the input B=1 and the clock input encounter a leading edge from 0 to 1 and the output circuit is in the fifth state, and select the fifth state if the input A=1 and the input B=0 and the clock input encounter a leading edge from 0 to 1 and the output circuit is in the fourth state.

A high-speed low-power-consumption trigger, which comprises a control signal generation circuit, an enabling unit, and a latch structure. The latch structure comprises two input ends, two output ends, two enabling ends, a second enabling end, and a ground end. The enabling unit comprises two enabling circuits. An output signal X of the control signal generation circuit and an external control signal D serve as input signals of the first enabling circuit. An output end of the first enabling circuit is connected to the first enabling end. The output signal X of the control signal generation circuit and a phase-inverted signal DB of the external control signal D serve as input signals of the second enabling circuit. An output end of the second enabling circuit is connected to the second enabling end.

Various circuit techniques for implementing ultra high speed circuits use current-controlled CMOS (C.sup.3MOS) logic fabricated in conventional CMOS process technology. An entire family of logic elements including inverter/buffers, level shifters, NAND, NOR, XOR gates, latches, flip-flops and the like are implemented using C.sup.3MOS techniques. Optimum balance between power consumption and speed for each circuit application is achieve by combining high speed C.sup.3MOS logic with low power conventional CMOS logic. The combined C.sup.3MOS/CMOS logic allows greater integration of circuits such as high speed transceivers used in fiber optic communication systems.

A sense amplifier circuit includes: a charge module configured to charge a set signal node and a reset signal node according to a clock signal; and a sense module configured to sense and amplify a differential input signal according to the clock signal; where, the sense module includes a first amplification circuit, a second amplification circuit, and a cross hopping transfer circuit cross-connected between the first amplification circuit and the second amplification circuit. The cross hopping transfer circuit is configured to transfer a valid signal of a newly started amplification circuit to another amplification circuit if sensing is completed and the differential input signal hops, such that a set signal/reset signal remains unchanged. A flip-flop includes the sense amplifier circuit.

A strobe generation circuit includes: a main hybrid multiplexing circuit outputting a main pull-up signal and a main pull-down signal to first and second nodes, respectively, the main pull-up and pull-down signals being selectively controlled based on first pull-up and pull-down control signals generated by removing an input loading of main data; a sub hybrid multiplexing circuit outputting a sub pull-up signal and a sub pull-down signal to the first and second nodes, respectively, the sub pull-up and pull-down signals being selectively controlled based on second pull-up and pull-down control signals generated by removing an input loading of sub data; a latch circuit latching a signal of the first node and a signal of the second node to output a first latch signal and a second latch signal; and an output driver outputting a strobe signal according to the first and second latch signals.

A comparator includes a pair of back-to-back negative-AND (NAND) gates and a delay circuit coupled to the pair of back-to-back NAND gates. The delay circuit is configured to modulate a triggering clock signal by an input voltage to generate a delayed clock signal with a delay that is based on the input voltage. Each of the pair of back-to-back NAND gates is configured to receive the delayed clock signal and generate a comparator output signal based on the delayed clock signal.

An object is to provide a level shift circuit that operates stably. A semiconductor device includes a level shift circuit including first to fourth transistors and a buffer circuit. One of a source and a drain (S/D) of the first transistor is connected to one of a source and a drain of the second transistor. The other of the source and the drain of the second transistor is connected to one of a source and a drain of the third transistor. A gate of the first transistor and a gate of the fourth transistor are connected to the other of the source and the drain of the second transistor and the one of the source and the drain of the third transistor. A gate of the third transistor is connected to a wiring to which an input signal is input. An input terminal of the buffer circuit is connected to one of a source and a drain of the fourth transistor. An output terminal of the buffer circuit is connected to a gate of the second transistor and a wiring to which an output signal is output.

An Analog to Digital (ADC) is provided, where the ADC may include a sample and hold circuitry to sample an analog input signal, and a summation block to iteratively generate a subtraction signal. The subtraction signal may be based on a difference between the analog input signal and a feedback signal. The ADC may further include a common input stage to receive the subtraction signal, and a plurality of comparison and latch circuitries arranged in parallel, where individual ones of the plurality of parallel comparison and latch circuitries may sequentially receive an output of the common input stage.

A regeneration circuit includes a first inverting circuit, a second inverting circuit, a first transistor coupled to an input of the second inverting circuit, and a second transistor coupled to an input of the first inverting circuit. The regeneration circuit also includes a third transistor including a gate coupled to a gate of the first transistor, a first switch configured to couple the third transistor to the input of the second inverting circuit based on a voltage of the first inverting circuit, a fourth transistor including a gate coupled to a gate of the second transistor, and a second switch configured to couple the fourth transistor to the input of the first inverting circuit based on a voltage of the second inverting circuit.

A flip-flop includes a first input circuit, a first NOR logic gate, a stacked gate circuit, a first NAND logic gate and an output circuit. The first input circuit generates a first signal responsive to at least a first data signal, a first or a second clock signal. The first NOR logic gate is coupled between a first and a second node, and generates a second signal responsive to the first signal and a first reset signal. The stacked gate circuit is coupled between the first and a third node, and generates a third signal responsive to the first signal. The first NAND logic gate is coupled between the third and a fourth node, and generates a fourth signal responsive to the third signal and a second reset signal. The output circuit is coupled to the fourth node, and generates a first output signal responsive to the fourth signal.