An embodiment of a method for real time material identification is described that comprises determining an approximate mass value for an unknown material from spectral information derived from mass spectral analysis of the unknown material; retrieving profile models that correspond to a known material from a data structure using the approximate mass value; fitting a sample profile for the unknown material from the spectral information to the profile models to generate a fit score for each fit, wherein the lowest fit score corresponds to the best fit; calculating a mass value from the best fitting profile model and the sample profile.

The invention relates to a method for evaluating a quality of preparations of analytical tissue sections for mass spectrometric imaging using a reference sample to be processed and measured alongside the analytical tissue sections, and a kit-of-parts for a mass spectrometric imaging experiment including such reference sample.

The invention relates to a method for evaluating a quality of preparations of analytical tissue sections for mass spectrometric imaging using a reference sample to be processed and measured alongside the analytical tissue sections, and a kit-of-parts for a mass spectrometric imaging experiment including such reference sample.

A sample preparation apparatus for an elemental analysis system comprising a sample combustion and/or reduction and/or pyrolysis arrangement for receiving a sample of material to be analyzed, and producing therefrom a sample gas flow containing atoms, molecules and/or compounds; a gas chromatography (GC) column into which the sample gas flow is directed; a heater for heating at least a part of the GC column; and a controller for controlling the heater. The controller is configured to control the heater so as to increase the temperature of at least the part of the GC column while the sample gas flow in the GC column elutes.

Implanting a material in a pattern hardens the material in the pattern for subsequent etching. When the region is etched, by ion beam sputtering, chemically enhanced charged particle beam etching, or chemical etching, a thicker structure remains because of the reduced etch rate of the hardened pattern. The invention is particularly useful for the preparation of thin lamella for viewing on a transmission electron microscope.

In a mass spectrometer, a mass-to-charge dispersive element separates received ions spatially according to their mass-to-charge ratios, to provide a dispersed ion beam thereby. An ion detection arrangement that detects the dispersed ion beam comprises: at least one primary ion detector, each detecting spatially separated ions having mass-to-charge ratios within a respective desired range and each providing a respective main beam signal based on its respective detected ions; and at least one secondary ion detector, each detecting ions having mass-to-charge ratios outside all of the desired ranges simultaneously with the at least one primary ion detector detecting the spatially separated ions and each providing a respective background signal based on its respective detected ions. At least one mass intensity measurement is provided for the received ions having a mass-to-charge ratio within the desired range, based on the at least one main beam signal and the at least one background signal.

In a mass spectrometer, a mass-to-charge dispersive element separates received ions spatially according to their mass-to-charge ratios, to provide a dispersed ion beam thereby. An ion detection arrangement that detects the dispersed ion beam comprises: at least one primary ion detector, each detecting spatially separated ions having mass-to-charge ratios within a respective desired range and each providing a respective main beam signal based on its respective detected ions; and at least one secondary ion detector, each detecting ions having mass-to-charge ratios outside all of the desired ranges simultaneously with the at least one primary ion detector detecting the spatially separated ions and each providing a respective background signal based on its respective detected ions. At least one mass intensity measurement is provided for the received ions having a mass-to-charge ratio within the desired range, based on the at least one main beam signal and the at least one background signal.

The invention relates to a method for evaluating a quality of preparations of analytical tissue sections for mass spectrometric imaging using a reference sample to be processed and measured alongside the analytical tissue sections, and a kit-of-parts for a mass spectrometric imaging experiment including such reference sample.

The invention relates to a method for evaluating a quality of preparations of analytical tissue sections for mass spectrometric imaging using a reference sample to be processed and measured alongside the analytical tissue sections, and a kit-of-parts for a mass spectrometric imaging experiment including such reference sample.

Method and systems for monitoring ion mobility spectrometers are provided. The method can include acquiring scan data, and generating a segment data set from the scan data. The method can further include deriving a subset of peak data from the segment data, where the subset of peak data has an associated set of peak metrics, and deriving a value from the subset of peak data associated with a criteria element of the associated set of peak metrics, where the criteria element has an associated range of values. The method can further include providing an indication in the event the value lies outside the associated range of values.