B08B3/04

METHOD FOR WASHING ALUMINUM NITRIDE SINGLE CRYSTAL SUBSTRATE, METHOD FOR PRODUCING ALUMINUM NITRIDE SINGLE CRYSTAL LAYERED BODY, AND METHOD FOR PRODUCING ALUMINUM NITRIDE SINGLE CRYSTAL SUBSTRATE, AND ALUMINUM NITRIDE SINGLE CRYSTAL SUBSTRATE
20230227997 · 2023-07-20 · ·

A method for washing an aluminum nitride single crystal substrate, the aluminum nitride single crystal substrate including: an aluminum-polar face; and a nitrogen-polar face opposite to the aluminum-polar face, the method including: (a) scrubbing a surface of the nitrogen-polar face.

METHOD FOR WASHING ALUMINUM NITRIDE SINGLE CRYSTAL SUBSTRATE, METHOD FOR PRODUCING ALUMINUM NITRIDE SINGLE CRYSTAL LAYERED BODY, AND METHOD FOR PRODUCING ALUMINUM NITRIDE SINGLE CRYSTAL SUBSTRATE, AND ALUMINUM NITRIDE SINGLE CRYSTAL SUBSTRATE
20230227997 · 2023-07-20 · ·

A method for washing an aluminum nitride single crystal substrate, the aluminum nitride single crystal substrate including: an aluminum-polar face; and a nitrogen-polar face opposite to the aluminum-polar face, the method including: (a) scrubbing a surface of the nitrogen-polar face.

Washing device and system for smoking devices
11707086 · 2023-07-25 ·

A washing device and system is herein disclosed. The washing device includes a washing tub, a shaking system, a plate bracket, a first plate, a second plate, and a controller. The shaking system is mounted at a lower end of the washing tub. The plate bracket is mounted on the shaking system. The first plate defines a first set of holes and is movably mounted to a first side of the plate bracket. The second plate defines a second set of holes and is movably mounted to a second side of the plate bracket. The controller is operable to selectively activate and control the shaking system. In use, the first plate and the second plate support a smoking device therebetween, with cleaning fluid being agitated via the shaking system to clean the smoking device.

INSERT ASSEMBLY FOR FOAMING DEVICE
20230226505 · 2023-07-20 ·

An insert assembly for a foam generating device includes a first insert and a second insert with a channel defined therethrough. Inserts may be formed by two shell halves that are coupleable to one another to define the channel. A plurality of ribs extends along an interior surface of the channel. Pad structures defined by porous media are provided in the channel and gripped by the plurality of ribs. The pads receive cleaning solution passing through the channel and cause foam to be generated by breaking-up the cleaning solution and agitating. The ribs may be arranged horizontally relative to a longitudinal axis of the insert assembly and retain the pads within the device. Inserts may be arranged in series along a longitudinal axis of the foam generating device with the pad structures arranged within the channel.

Injector needle cleaning apparatus and method
11701692 · 2023-07-18 · ·

The present disclosure is a food injection needle cleaning system and method. The food injection needle cleaning system comprises a cleaning fluid tank coupled to high-pressure pump configured to pump cleaning fluid through at least one inlet, a channel, and at least one outlet of a food injection needle to dislodge and remove debris as well as sanitize the needle. The present disclosure comprises a high-pressure chamber configured to secure the food injection needle and seal around the needle such that fluid enters the needle through an inlet of the high-pressure chamber and exits the needle through a waste line.

APPARATUS AND METHOD FOR WAFER CLEANING

The present disclosure relates to an apparatus and a method for wafer cleaning. The apparatus can include a wafer holder configured to hold a wafer; a cleaning nozzle configured to dispense a cleaning fluid onto a first surface (e.g., front surface) of the wafer; and a cleaning brush configured to clean a second surface (e.g., back surface) of the wafer. Using the cleaning fluid, the cleaning brush can clean the second surface of the wafer with a scrubbing motion and ultrasonic vibration.

SUBSTRATE PROCESSING APPARATUS
20230019111 · 2023-01-19 ·

A substrate processing apparatus of an embodiment includes a nozzle plate and a support configured to support a substrate at a predetermined distance from the nozzle plate with a first surface of the substrate facing the nozzle plate. A processing liquid supply unit is configured to supply a processing liquid to a second surface of the substrate that is opposite to the first surface. A first supply unit is configured to supply a first fluid from a first supply port in the nozzle plate. A second supply unit is configured to supply a second fluid from a second supply port closer to a outer edge of the nozzle plate than the first supply port.

SUBSTRATE PROCESSING APPARATUS
20230019111 · 2023-01-19 ·

A substrate processing apparatus of an embodiment includes a nozzle plate and a support configured to support a substrate at a predetermined distance from the nozzle plate with a first surface of the substrate facing the nozzle plate. A processing liquid supply unit is configured to supply a processing liquid to a second surface of the substrate that is opposite to the first surface. A first supply unit is configured to supply a first fluid from a first supply port in the nozzle plate. A second supply unit is configured to supply a second fluid from a second supply port closer to a outer edge of the nozzle plate than the first supply port.

SUBSTRATE CLEANING DEVICE, SUBSTRATE CLEANING SYSTEM, SUBSTRATE PROCESSING SYSTEM, SUBSTRATE CLEANING METHOD AND SUBSTRATE PROCESSING METHOD

An upper holding device holds a substrate in a horizontal attitude without rotating the substrate. A lower holding device rotates a substrate while holding the substrate by suction. A substrate held by the upper holding device is cleaned with use of a cleaning liquid, and a substrate held by the lower holding device is cleaned with use of a cleaning liquid. Gas in a processing space is exhausted by exhaust equipment of a factory through an exhaust system. When a substrate is held by the upper holding device, gas in the processing space is not exhausted or gas in the processing space is exhausted at a first flow rate. Gas in the processing space is exhausted at a second or third flow rate that is higher than the first flow rate when the substrate is held by the lower holding device.

SUBSTRATE CLEANING DEVICE, SUBSTRATE CLEANING SYSTEM, SUBSTRATE PROCESSING SYSTEM, SUBSTRATE CLEANING METHOD AND SUBSTRATE PROCESSING METHOD

An upper holding device holds a substrate in a horizontal attitude without rotating the substrate. A lower holding device rotates a substrate while holding the substrate by suction. A substrate held by the upper holding device is cleaned with use of a cleaning liquid, and a substrate held by the lower holding device is cleaned with use of a cleaning liquid. Gas in a processing space is exhausted by exhaust equipment of a factory through an exhaust system. When a substrate is held by the upper holding device, gas in the processing space is not exhausted or gas in the processing space is exhausted at a first flow rate. Gas in the processing space is exhausted at a second or third flow rate that is higher than the first flow rate when the substrate is held by the lower holding device.