A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.

A method is disclosed, which comprises estimating a first value of a parameter of a component, prior to a use of the component in a reactor. In an example, the parameter of the component is to change during the use of the component in the reactor. The component may be treated, subsequent to the use of the component in the reactor. A second value of the parameter of the component may be estimated, subsequent to treating the component. The second value may be compared with the first value, where a reuse of the component in the reactor is to occur in response to the second value being within a threshold range of the first value.

According to one embodiment, a chuck cleaner includes a support, an adhesive layer, and a support substrate. The support includes a first portion, a second portion, and a third portion provided between the first portion and the second portion. The support substrate is provided between the support and the adhesive layer. The support substrate includes a first region fixed to the first portion, a second region fixed to the second portion, a third region provided between the first region and the second region and having variable distance from the third portion, a fourth region provided between the first region and the third region and separated from the support, and a fifth region provided between the second region and the third region and separated from the support.

In an example of the disclosure, a blanket servicing system includes a rotatably mounted endless cleaning surface and a scraper. The endless cleaning surface is to have a first engagement with a blanket to obtain a layer of thermoplastic print agent from the blanket. The endless cleaning surface is to have a second engagement with the blanket to receive residue from the blanket onto the layer of thermoplastic print agent. The scraper is to scrape the endless cleaning surface to transfer the residue from the endless cleaning surface to a collection element.

A mask for cleaning a lithography apparatus includes a mask substrate and a coating provided on a surface of the mask substrate. The coating is configured to trap particulate contaminant matter from the lithography apparatus. A method of cleaning a lithography tool is also provided preparing a cleaning mask including a particle trapping layer formed on a substrate. The method includes transferring the cleaning mask through a mask transferring route of the lithography tool. Subsequently, the method includes analyzing a particle trapped by the particle trapping layer.

The present technology relates to systems and methods for cleaning a compression molding system. In particular, a system including a first roller carrying a cleaning tape is provided. The system further includes a second roller configured to dispense the cleaning tape along a compression molding structure. The tape is removably adhered to the structure and subsequently removed, thereby removing foreign debris such as dust and/or other particles from the compression molding structure.

A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.

A system and method for cleaning a media transport device includes a cleaning card having a first end portion and a second end portion. The system may also include a handled cleaning card holder. The handled cleaning card holder is configured to secure the cleaning card at a first end portion and allow access to the second end portion of the cleaning card for use in cleaning. The cleaning card may configured to be rotatable at least 180° within or upon the handled cleaning card holder, or it may be rotated by hand to be used in at least two directions.

Aspects and techniques of the present disclosure relate to a fiber optic connector assembly including a fiber optic connector with a front end and a back end. A ferrule positioned at the front end. The ferrule has a distal end face with a central region and recessed regions on opposite sides of the central region. The assembly includes a dust cap mounted on the ferrule. The dust cap has an open end and an opposite closed end. The fiber optic connector assembly also includes a tape member that covers the central region of the ferrule. The tape member can be secured to the dust cap such that when the dust cap is removed, the tape member simultaneously comes off with the dust cap.

An optical connector cleaning tool includes: a tool body; and an extension that moves relatively with respect to the tool body. The extension extends out of the tool body and includes a head that presses a cleaning element formed with a tape-like adhesive element onto an optical connector. A relative movement of the extension with respect to the tool body carries the cleaning element to the head, and after carrying the cleaning element to the head, enables the cleaning element to contact the optical connector.