A device for measuring the straightness of a rod-like work piece includes a support for the rod-like work piece. The support has multiple sections, each of which has a support surface. At least one force sensor is provided to measure the force applied by the work piece onto the support surface in a direction that extends essentially transverse to gravitational acceleration.

A workpiece holding fixture is provided herein. The workpiece holding fixture includes a baseplate including an engagement surface. A first static riser including a position control member is configured to removably couple a workpiece to the first static riser. A second static riser includes a rotation control member and is configured to removably couple the workpiece to the second static riser. A dynamic riser is configured to abut the workpiece, the dynamic riser being movable by a spindle.

A workpiece holding fixture is provided herein. The workpiece holding fixture includes a baseplate including an engagement surface. A first static riser including a position control member is configured to removably couple a workpiece to the first static riser. A second static riser includes a rotation control member and is configured to removably couple the workpiece to the second static riser. A dynamic riser is configured to abut the workpiece, the dynamic riser being movable by a spindle.

A workpiece fixture assembly is provided herein. The workpiece fixture assembly includes a baseplate including an engagement surface. First and second static risers are configured to maintain a position of a workpiece. The first static riser includes a first gage bore thereon. A dynamic riser is configured to abut the workpiece and has a second gage bore thereon. A numerical control machine has a probe to measure an offset distance between the first and second gage bores. A linearly actuable workpiece support is disposed on the baseplate.

An eyeglass lens processing apparatus for processing a periphery of an eyeglass lens includes: a lens chuck shaft configured to chuck the eyeglass lens; a shaft angle changing portion configured to change a shaft angle of the lens chuck shaft; a first processing tool unit including at least one spindle at which a first processing tool is provided; a second processing tool unit that is disposed to oppose the first processing tool unit and that includes at least one spindle at which a second processing tool is provided; and a controller configured to change one of the first and second processing tool unit to be used for processing the eyeglass lens to the other of the first and second processing tool by controlling driving of the shaft angle changing portion to change the shaft angle of the lens chuck shaft.

A support base supports a plate-shaped workpiece. The support base includes a flat plate-shaped box member having a support face for supporting a workpiece and a placement face that is a face on the opposite side to the support face and is placed on a holding face of a chuck table, a temperature measurement unit accommodated in the box member, and a battery accommodated in the box member and serving as a power supply for the temperature measurement unit. The temperature measurement unit includes a temperature measuring instrument that measures a temperature at the support face, and a recording unit that records the temperature measured by the temperature measuring instrument.

A support base supports a plate-shaped workpiece. The support base includes a flat plate-shaped box member having a support face for supporting a workpiece and a placement face that is a face on the opposite side to the support face and is placed on a holding face of a chuck table, a temperature measurement unit accommodated in the box member, and a battery accommodated in the box member and serving as a power supply for the temperature measurement unit. The temperature measurement unit includes a temperature measuring instrument that measures a temperature at the support face, and a recording unit that records the temperature measured by the temperature measuring instrument.

A stub of a via formed in a printed circuit board is backdrilled to a predetermined depth. A capacitance probe is positioned within the via. Then the capacitance probe is used to obtain a test capacitance measurement. The test capacitance measurement is compared to a predetermined baseline capacitance measurement. Residual conductive plating material in the backdrilled stub causes the test capacitance measurement to exceed the predetermined baseline capacitance measurement. An indication is made that the predetermined baseline capacitance measurement has been exceeded.

A stub of a via formed in a printed circuit board is backdrilled to a predetermined depth. A capacitance probe is positioned within the via. Then the capacitance probe is used to obtain a test capacitance measurement. The test capacitance measurement is compared to a predetermined baseline capacitance measurement. Residual conductive plating material in the backdrilled stub causes the test capacitance measurement to exceed the predetermined baseline capacitance measurement. An indication is made that the predetermined baseline capacitance measurement has been exceeded.

A manufacturing system including a base and multiple work machine modules that are arranged in an arrangement direction on base to be attachable to and detachable from base, in which one wheel of a pair provided on work machine module is engaged with one rail of a pair provided on base in a state in which positional deviation in the arrangement direction is prohibited, and the other wheel of the pair is engaged with the other rail of the pair in a state in which positional deviation is permitted in the arrangement direction, thereby the position of work machine modules on the base in the arrangement direction is specified, and work machine modules are fixed at a setting position on the base to be restricted so as to be drawn toward the base by a module fixing mechanism that is provided on the base.