B24B49/02

AN AUTOMATIC GEMSTONE POLISHING ROBOT

The present disclosure provides a fully automatic gemstone polishing robot. An aspect of the present disclosure provides an automatic gemstone polishing robot comprising: a gemstone polishing unit, comprising a gemstone holding unit for supporting a gemstone in contact with an abrasive surface, and configured to polish said gemstone in a plurality of iterations based on a feedback signal; an image capturing unit to capture, in one or more of the plurality of iterations, at least one image of the gemstone; and an image processing unit, which when executed by one or more processors, analyzes said at least one image of the gemstone with respect to one or a plurality of gemstone parameters, wherein the image processing unit is further configured to compare the one or a plurality of analyzed gemstone parameters with one or a plurality of pre-determined gemstone parameters to generate the feedback signal to be transmitted to the gemstone polishing unit. Another aspect of the present disclosure relates to a method of polishing a gemstone utilizing the automatic gemstone polishing robot.

METHOD FOR PROCESSING AN UNFINISHED OPTICAL LENS MEMBER
20200230775 · 2020-07-23 · ·

A method implemented by computer for processing an unfinished optical lens member for manufacturing an optical lens, the unfinished optical lens member having an unfinished surface and an aspherical finished surface having a first reference system with a first reference point, and the optical lens to be manufactured including first and second surfaces, the first surface including a second reference system with a second reference point and included in the aspherical finished surface of the lens member, the method including: providing an unfinished optical lens member data; providing an optical function; providing a reference point position; providing an optical lens parameter; determining a reference system; determining a first surface dataset; and determining a second surface dataset.

METHOD FOR PROCESSING AN UNFINISHED OPTICAL LENS MEMBER
20200230775 · 2020-07-23 · ·

A method implemented by computer for processing an unfinished optical lens member for manufacturing an optical lens, the unfinished optical lens member having an unfinished surface and an aspherical finished surface having a first reference system with a first reference point, and the optical lens to be manufactured including first and second surfaces, the first surface including a second reference system with a second reference point and included in the aspherical finished surface of the lens member, the method including: providing an unfinished optical lens member data; providing an optical function; providing a reference point position; providing an optical lens parameter; determining a reference system; determining a first surface dataset; and determining a second surface dataset.

AUTOMATIC GRINDING APPARATUS

Provided is an automatic grinding apparatus, comprising a grinding wheel, a support, a feeding device, a control device, a first detector, a second detector, a third detector, and a fourth detector, wherein the control device is further configured to, before processing using the grinding wheel is started, calculate a range in which the grinding wheel and the support are relatively moved on the basis of information on positions of a surface of a workpiece and an outer peripheral end portion and an end surface of the grinding wheel detected by the first detector, the second detector, the third detector, and the fourth detector, to move the grinding wheel or the support by controlling the feeding device, and to automatically start the processing using the grinding wheel.

TOOL DEVICE AND METHOD FOR MEASURING A CONDITION OF A MACHINING TOOL
20200189061 · 2020-06-18 ·

A tool device (1) for machining a workpiece (4) by cutting, milling, drilling or grinding, comprising a sensor (20) for detecting a condition of the tool device (1) during machining, wherein the sensor (20) is connectable to a receiving unit (40), which transmits data to an analysis unit (50) for analyzing the received data. The sensor (20) is configured as a fiber optic sensor (20) comprising at least one optical fiber (26) providing an incident optical path (22) and a reflected optical path (24) for a light beam emitted by a connectable light source (30) and with a distal end thereof lying in a surface (14, 74) of the tool device (1) such that the optical path length can be measured.

SUBSTRATE PROCESSING SYSTEM AND SUBSTRATE PROCESSING METHOD
20240017375 · 2024-01-18 ·

A substrate processing system configured to process a combined substrate in which a first substrate and a second substrate are bonded to each other includes a processing apparatus configured to grind the first substrate; a first thickness measuring apparatus configured to measure a thickness of the first substrate before being ground by the processing apparatus and a total thickness of the combined substrate including the first substrate; and a second thickness measuring apparatus configured to measure the thickness of the first substrate after being ground by the processing apparatus.

SUBSTRATE PROCESSING SYSTEM AND SUBSTRATE PROCESSING METHOD
20240017375 · 2024-01-18 ·

A substrate processing system configured to process a combined substrate in which a first substrate and a second substrate are bonded to each other includes a processing apparatus configured to grind the first substrate; a first thickness measuring apparatus configured to measure a thickness of the first substrate before being ground by the processing apparatus and a total thickness of the combined substrate including the first substrate; and a second thickness measuring apparatus configured to measure the thickness of the first substrate after being ground by the processing apparatus.

METHOD FOR CONTROLLING DWELL TIME DURING PROCESSING TO OPTICAL COMPONENT
20200147753 · 2020-05-14 ·

A method for smoothing a dwell time during a processing to an optical component belongs to the field of processing optical components, and solves a problem of an adverse effect of dwell time jumps on a stability of the machine tool during processing. The method achieves a smoothing treatment to the dwell time by a diffusion transformation to the distribution of the conventionally calculated dwell time using a time diffusion model. After the smoothing treatment to the dwell time, the difference between times at adjacent discrete points is relatively small, thereby achieving a smooth transition between adjacent discrete points, and limiting the effect of the polishing tool on machine stability due to its frequent acceleration and deceleration during processing.

METHOD FOR CONTROLLING DWELL TIME DURING PROCESSING TO OPTICAL COMPONENT
20200147753 · 2020-05-14 ·

A method for smoothing a dwell time during a processing to an optical component belongs to the field of processing optical components, and solves a problem of an adverse effect of dwell time jumps on a stability of the machine tool during processing. The method achieves a smoothing treatment to the dwell time by a diffusion transformation to the distribution of the conventionally calculated dwell time using a time diffusion model. After the smoothing treatment to the dwell time, the difference between times at adjacent discrete points is relatively small, thereby achieving a smooth transition between adjacent discrete points, and limiting the effect of the polishing tool on machine stability due to its frequent acceleration and deceleration during processing.

METHOD OF MANUFACTURE INCLUDING POLISHING PAD MONITORING METHOD AND POLISHING APPARATUS INCLUDING POLISHING PAD MONITORING DEVICE

In a method of manufacture, a displacement sensor is provided over a conditioner disk. The conditioner disk is rotated to perform a conditioning process on a polishing surface of a polishing pad. A displacement of the rotating conditioner disk is detected using the displacement sensor during the conditioning process. A height of the conditioner disk is calculated from the detected displacement. An end point of the conditioning process is determined on the polishing surface based on the calculated height.