Patent classifications
B07C5/3416
ARTICLE INSPECTION VERIFICATION SYSTEM
There is provided an article inspection verification system provided in an article inspection line including a plurality of article inspection devices that determine whether an inspection target article is a non-defective product or a defective product. The article inspection verification system includes physical effect generators that generate a physical effect that causes the inspection target article to be determined to be the defective product while the inspection target article passes through inspection sections corresponding each of article inspection devices, and a physical effect control unit that stores generation conditions of the physical effect by the physical effect generators and drives the physical effect generators in accordance with the generation conditions during an operation of the article inspection line.
METHOD AND SYSTEM FOR SORTING OF DIAMONDS
A system for sorting of diamonds is provided. The system comprises a conveying system including a conveyer belt to transport material sample including diamonds. Further, the system comprises an x-ray source configured to fire x-rays at the material sample. Furthermore, the system comprises an x-ray luminescence (XRL) detector configured to measure radiated intensity of the x-rays from the material sample. Additionally, the system comprises an x-ray transmission (XRT) detector configured to measure transmitted intensity of the x-rays through the material sample. Also, the system comprises a processor that is configured to: receive the radiated intensity and the transmitted intensity from the XRL detector and the XRT detector respectively; process the radiated intensity and the transmitted intensity to determine an equivalent absorption coefficient; and identify the material sample as diamond based on a comparison of the equivalent absorption coefficient and a pre-stored model species absorption coefficient.
Sorting materials using pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods
A system and method of sorting mineral streams, for example laterite mineral ores, into appropriately classified valuable and waste streams for maximum recovery of value from the mineral stream, e.g., a stream of minerals includes receiving response data indicating reflected, absorbed or backscattered energy from a mineral sample exposed to a sensor, where the mineral sample is irradiated with electromagnetic energy. The system determines spectral characteristics of the mineral sample by performing spectral analysis on the response data of the mineral sample and identifies a composition of the mineral sample by comparing the spectral characteristics of the mineral sample to previously developed spectral characteristics of samples of known composition. The system then generates a sort decision for the mineral sample based on the comparison, where the sort decision is used in diverting the mineral sample to a desired destination e.g. pyrometallurgical treatment stages, or to a waste stream.
Method for classifying light-emitting semiconductor components and image sensor application having an image sensor and a semiconductor element
The invention relates to a method for classifying a light-emitting semiconductor component (301) for an image sensor application, wherein the semiconductor component (301) is designed as a light source for an image sensor (302), comprising the following steps: providing the light-emitting semiconductor component (301); determining at least one of the following parameters of the light emitted with an emission spectrum by the light-emitting semiconductor component (301) during operation: R=∫qR(λ).Math.S(λ)dλ.Math.texp, G=∫qG(λ).Math.S(λ)dλ.Math.texp, B=∫qB(λ).Math.S(λ)dλ.Math.texp, wherein qR(λ), qG(λ), and qB(λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor (302), S(λ) is the emission spectrum of the light-emitting semiconductor component (301), texp is an exposure time, and λ designates a wavelength; classifying the light-emitting semiconductor component (301) into a class from a group of classes, which are characterized by different value ranges of at least one parameter that depends on at least one of the parameters R, G, and B. The invention further relates to an image sensor application.
Methods and systems for smart battery collection, sorting, and packaging
A method includes irradiating an energy storage device using an input radiation characterized by a first electromagnetic spectrum and detecting an output radiation reflected or backscattered by the energy storage device. The method also includes determining a second electromagnetic spectrum of the output radiation and comparing the second electromagnetic spectrum with a reference electromagnetic spectrum. The method further includes generating a sorting instruction based on comparison of the second electromagnetic spectrum with the reference electromagnetic spectrum.
METHOD FOR PRE-DETECTING DEFECTIVE POROUS POLYMER SUBSTRATE FOR SEPARATOR
Disclosed is a method for pre-detecting a defective porous polymer substrate for a separator, including selecting a porous polymer substrate having a plurality of pores; observing the selected porous polymer substrate with a scanning electron microscope (SEM) to obtain an image of the porous polymer substrate; quantifying the average value of pore distribution index (PDI); correcting the quantified average value of pore distribution index to obtain the corrected average value of pore distribution index; determining whether or not the corrected average value of pore distribution index is 60 a.u. (arbitrary unit) or less; and classifying the porous polymer substrate as a good product, when the corrected average value of pore distribution index is determined to be 60 a.u. or less, and classifying the porous polymer substrate as a defective product, when the corrected average value of pore distribution index is determined to be larger than 60 a.u.
Device for ejecting bad products from a product stream
A device for discharging bad products from a product stream, including a detection unit for detecting the product stream and a computer unit for receiving property data of the product stream from the detection unit and for identifying bad products in the product stream. The device includes a compressed air discharge unit controlled by the computer unit and a deflection element discharge unit for the passive discharge of bad products from the product stream. The computer unit divides the identified bad products into first-order and second-order bad products and controls the compressed air discharge unit so that it will actively discharge the first-order bad products, and also controls the deflection element discharge unit so that it will passively discharge the second-order bad products.
PADDY DISCRIMINATOR
A paddy discriminator includes a downflow gutter in which mixed grains including paddy and brown rice are aligned and flow down, a light emission source that irradiates the mixed grains discharged from the downflow gutter with light, and light receiving means capable of receiving reflected light and transmitted light from the mixed grains irradiated with light by the light emission source, wherein the light emission source includes first illumination means that is provided on a light receiving means side of the mixed grains and is capable of irradiating the mixed grains with light of a red component, and second illumination means that is provided on a side away from the light receiving means of the mixed grains and is capable of irradiating the mixed grains with light of a green component.
Detection of non-XR/MD detectable foreign objects in meat
Disclosed is an inspection system having a background positioned adjacent an inspection zone; and an image capturing device configured to receive background electromagnetic radiation (EMR) from the background and from the inspection zone, the inspection zone being configured and arranged to receive material for transport into the inspection zone; wherein the background has a background property defined by a background emission, a background absorbance, and a background reflectance, the background property being matched in EMR to a material EMR of material to be transported into the inspection zone, the material having a material property defined by a material emission, a material absorbance, and a material reflectance; and wherein the image capturing device is configured to detect a foreign object within material when transported into the inspection zone by deducting the background EMR from the material EMR.
Processing of laterite ores
This invention relates to a method for processing nickel laterite ore, including the steps of obtaining a mined laterite ore from a mining operation 42; and feeding the ore through a bulk sorter 44 comprising a sensor arrangement and a diverting mechanism that separates the ore into a beneficiated stream of nickel laterite ore 28 wherein the grade of nickel is higher than the grade of the ore fed into the bulk sorter for further processing 52 by leaching or smelting; one or more low grade fractions of ore 50 with a lower nickel grade than the beneficiated stream; and a waste fraction 46. This configuration efficiently separates lower grade patches in the run of mine ore, to either a low-grade stockpile or waste, and efficiently blends the selected high-grade ore to meet the specifications of the subsequent processing.