An assembly for lapping multiple row bars, the assembly including a carrier having at least one carrier bond pad, multiple row bars adjacent to each other in a stack, wherein a first row bar of the stack is positioned closer to the carrier than any of the other multiple row bars of the stack and comprises at least one row bar bond pad, an electrical connection between at least one of the carrier bond pads and at least one of the row bar bond pads of the first row bar, and at least one electrical trace extending through at least two of the multiple row bars and electrically connected to at least the first row bar and one additional row bar of the stack. An outermost row bar of the stack includes an outer surface and at least one electronic lapping guide.

Described are methods for processing microelectronic device substrates by a lapping step, e.g., a final lapping step, wherein the step includes the use of an elastomeric pressure-sensitive adhesive to secure the microelectronic device substrate to a carrier that holds the substrate to a surface of the carrier during the lapping step, and wherein the pressure-sensitive adhesive can be a non-polysilicone based adhesive having mechanical properties that include a tan delta that is below about 0.2.

A method of lapping multiple row bars provided in a stack, including the steps of electrically connecting at least one row bar bond pad of a first row bar to at least one carrier bond pad of a carrier, electrically connecting an outermost row bar of the stack to the first row bar of the stack by at least one electrical trace, wherein the outermost row bar comprises at least one electronic lapping guide, lapping an outer surface of the outermost row bar until a signal provided by the at least one electronic lapping guide of the outermost row bar reaches a predetermined value, terminating the lapping of the outermost row bar, and removing the outermost row bar from the stack to expose a second row bar, wherein the second row bar is electrically connected to the first row bar with the at least one electrical trace.

The present disclosure includes a lapping system that includes a temperature control system system to heat or cool the lapping plate while lapping. The temperature control system can include a closed circuit fluid system and/or one or more electrical resistive heating elements. In some embodiments that cooling system can control the temperature of the lapping plate during lapping to within +/5 C., or even +/5 C.

The present disclosure includes methods of lapping that include energizing one or more elements that are located proximal to a first magnetoresistive element in a transducer region and generate heat and cause the first magnetoresistive element to selectively expand in the lapping direction relative to one or more other magnetoresistive elements. The present disclosure also includes methods of lapping that use one or more thermal sensors located proximal to the first magnetoresistive element to help control lapping in the lapping direction. The present disclosure includes related lapping systems and sliders.

Embodiments of the present disclosure include methods and systems of lapping a row bar of sliders, where the systems and methods use externally mounted laser components to focus laser energy on an area of an individual slider that can absorb the laser energy in a manner to cause at least the write pole and/or reader to protrude more relative to one or more other slider components (e.g., a reader) during lapping.

A manufacturing method of a slider includes steps of: (a) providing a row bar with a plurality of slider elements connecting together; (b) lapping surfaces of the row bar so as to obtain a predetermined requirement; (c) lowering the temperature of the surfaces lapped in the step (b) before and/or during lapping; and (d) cutting the row bar into a plurality of sliders. The present invention can prevent a local high temperature generated on the magnetic head during lapping so that the performance of the magnetic head is improved.

Described are methods for processing microelectronic device substrates by a lapping step, e.g., a final lapping step, wherein the step includes the use of an elastomeric pressure-sensitive adhesive to secure the microelectronic device substrate to a carrier that holds the substrate to a surface of the carrier during the lapping step, and wherein the pressure-sensitive adhesive can be a non-polysilicone based adhesive having mechanical properties that include a tan delta that is below about 0.2.

Embodiments of the present disclosure demonstrate a lapping carrier system for a bar to be lapped. The lapping carrier system may be configured with a single piece insert whose bridge is separated from a plurality of joints of the carrier insert by a varying distance. The varying distance can be greater at a medial portion of the bridge than at an end portion of the bridge to collectively form a parabolic shape. In some embodiments, a lapping insert can include a bridge with its length longer than the bar. In some embodiments in a lapping insert, the centerline between the end joint edge and the end finger edge extends beyond the edge of bar.

A pad/trace line layout for a PMR writer structure having two or more writers on a slider, and a process for selecting the best of the multiple writers is disclosed. Each writer is individually probed with a spin stand test device to generate performance results including bit error rate (BER), and area density capability (ADC). After the best writer is determined, the slider is integrated in a HGA. Only the best writer is connected through trace lines to a preamp to enable functionality. At least one trace line has a plurality of arms that enable flexibility in connecting the best writer to the preamp while other arms are not connected. In some embodiments, all writers share a common W pad that is connected to the preamp through one of two trace lines while the other trace line has one of the plurality of arms connected to the best writer.