A cutting apparatus includes a cutting unit that has a spindle with an annular cutting blade mounted to a tip part of the spindle through a blade mount, and a determining unit. The determining unit has a second flow path that is connected to a first flow path in a mounter of the blade mount for causing a negative or positive pressure to act on the first flow path, a measuring device that obtains a measured value of at least one of a pressure and a flow rate in the second flow path, and a screw-engaged state determining section that determines that a screw-engaged state of a fixed nut with a boss section of the mounter where the cutting blade is disposed is defective in a case where the measured value when the negative or positive pressure acts on the first flow path indicates an abnormal value.

In accordance with the following step of a method of manufacturing a MOSFET, a first cutting step of cutting a silicon carbide wafer along a plane substantially parallel to a {11-20} plane is performed. After the first cutting step, a second cutting step of cutting the silicon carbide wafer along a plane substantially perpendicular to the {11-20} plane and substantially perpendicular to the first main surface is performed.

A protective member forming apparatus includes an integrating unit that integrates a resin sheet held by a chuck table with a wafer by a resin, a conveying unit that conveys the wafer, and a cutting unit that holds, by a cutting table, the wafer integrated with the resin sheet conveyed by the conveying unit and cuts the resin sheet by a cutting section along the wafer. The cutting unit includes a detection unit that images the wafer by a camera and detects a position of a periphery of the wafer, and a control unit that causes cutting of the resin sheet by the cutting section to be performed only in the case where a peripheral edge of the wafer detected coincides with a track of a cutter blade of the cutting section when the preset resin sheet is cut.

Examples of gemstone verification are described herein. In one example, for processing a gemstone, pre-stored marking coordinates associated with a gemstone ID are obtained, the pre-stored marking coordinates generated during planning phase of the processing. Further, real-time marking coordinates for the gemstone to be processed are also obtained. An identity of the gemstone is verified based on a comparison of the pre-stored marking coordinates with the real-time marking coordinates. Further, information, including cutting parameters, associated with the gemstone ID of the gemstone is retrieved in response to a valid verification of the identity of the gemstone, for processing the gemstone.

A cutting apparatus includes a width measuring unit for measuring the width of a grooving groove formed in a wafer by laser grooving and the width of a cut groove formed by a cutting blade. The width measuring unit includes an imaging camera for imaging the grooving groove and the cut groove, and an illuminating unit for illuminating an area to be imaged by the imaging camera with light supplied in a predetermined light quantity. Therefore, when first light is radiated from the illuminating unit, a first image in which the grooving groove is sharply imaged can be imaged by the imaging camera, whereas when second light is radiated from the illuminating unit, a second image in which the cut groove is clearly imaged can be imaged by the imaging camera. Consequently, the grooving groove and the cut groove can be easily distinguished from each other.

Semiconductor wafers are produced from a workpiece by means of a wire saw, by feeding the workpiece through an arrangement of wires tensioned between wire guide rollers and divided into wire groups, the wires moving in a running direction producing kerfs as wires engage the workpiece. For each of the wire groups, a placement error of the kerfs of the wire groups determined, and for each of the wire groups compensating movements of the wires of the wire group are induced as a function of the placement error, in a direction perpendicular to the running direction of the wires during feeding of the workpiece through the arrangement of wires, by activating at least one drive element.

Semiconductor wafers with improved geometry are produced from a workpiece by processing the workpiece by means of a wire saw, by feeding the workpiece through an arrangement of wires which are tensioned between wire guide rollers and move in a running direction; producing kerfs when the wires engage into the workpiece; determining a placement error of the kerfs; and inducing a compensating movement of the workpiece as a function of the determined placement error along a longitudinal axis of the workpiece during the feeding of the workpiece through the arrangement of wires.

The feeding unit includes a base plate, and a cross member. The base plate receives the gemstones, affixed to the gemstone holders. The cross member is an automated moving member, configured such that a home position of the cross member coincides with a pre-defined point on the base plate. Accordingly, the gemstone, along with its gemstone holder, when received at the base plate is picked up by the cross member, specifically, by the first gripping member and the second gripping member, by a detachable contact established between the gemstone holder and the cross member, such that the cross member transfers the gemstone holder positioned on the base plate to a pre-defined position on the feeding unit.

A variable-step-distance micro-milling repair cutter path generating method for damage points on a surface of an optical crystal related to a field of optical material and optical element surface repair and includes steps of establishing a mathematical model of a repair profile; determining discrete contact points between a cutter and the repair profile to obtain a cutter contact control point set by a GPR path generating method to control a movement trend of a pseudo-random path; interpolating the cutter position control point set into a spatial curve by a NURBS modeling method; creating a UG curve in a UG software according to the mathematical model, and using the UG curve as the repair path to perform a machining process simulation. The method has good elimination effects on cutter marks with constant period and improves the ability of the KDP crystal to resist strong laser damage.

The present disclosure provides a method and a device for cutting a solar silicon wafer, and a storage medium, which relate to the technical field of crystalline silicon cutting and can solve a problem of high labor intensity of operators caused by repeated operation in solar silicon wafer cutting, improve production efficiency and reduce misoperation. A technical solution is specifically as follows: loading materials to be cut to a section cutter (101); adjusting a cutting wire mesh according to preset requirements, starting a cutting procedure when cutting conditions are met, and cutting the materials to be cut (102); generating prompt information for completed cutting after the cutting is completed (103); and unloading cut materials from the section cutter according to the prompt information for the completed cutting (104). The present disclosure is used for silicon wafer cutting.