B29C2037/903

SYSTEM AND METHOD FOR ADDITIVE MANUFACTURING CONTROL

An additive manufacturing apparatus, a computing system, and a method for operating an additive manufacturing apparatus are provided. The method includes obtaining two or more images corresponding to respective build layers at a build plate, wherein each image comprises a plurality of data points comprising a feature and corresponding location at the build plate; removing variation between the features of the plurality of data points; and normalizing each feature to remove location dependence in the plurality of data points.

Imprint method, imprint apparatus, and method of manufacturing article
12330349 · 2025-06-17 · ·

The present invention provides an imprint method of forming a pattern of an imprint material on a substrate using a mold, comprising: performing preliminary curing in which the imprint material is cured to a first target hardness by irradiating the imprint material with first light, in order to execute alignment between the mold and the substrate; and performing, after the alignment, main curing in which the imprint material is cured to a second target hardness by irradiating the imprint material with second light, wherein before performing the preliminary curing, an irradiation light amount of the first light to be used in the preliminary curing is determined based on a curing time until the imprint material is cured to the first target hardness, the curing time being obtained by irradiating an imprint material with third light.

Blades of an axial turbine

A method for manufacturing a turbine blade comprising designing a turbine blade includes receiving initial geometrical and aerodynamic information of the turbine blade, obtaining the maximum amount of stress within a determined area of maximum stress, and obtaining a safety factor by dividing material yield stress of the turbine blade by the maximum amount of stress. The method further includes performing a first plurality of operations responsive to the safety factor being less than 1.5 and the determined area of maximum stress occurring at the junction of the blade airfoil and the blade root. The first plurality of operations includes creating a fillet at the junction of the blade airfoil and the blade root and increasing respective thickness of each airfoil slice of the plurality of airfoil slices with a distance from the junction of the blade airfoil and the blade root of no more than 15% of the blade airfoil length.

APPARATUS AND METHOD FOR MEASURING DEFECT IN MOLDED PRODUCT SURFACE

The present invention relates to a molded product surface defect measuring apparatus, which includes a sensor module configured to detect a signal for performing a door closing/opening event or a lighting-on/off event of the molded product surface defect measuring apparatus, a lighting module configured to emit light required for measuring a defect in a surface of a molded product, a camera module configured to photograph the surface of the molded product, and a processor configured to control the lighting module and the camera module to perform the measuring of the defect in the surface of the molded product.

Molding apparatus and article manufacturing method
12399425 · 2025-08-26 · ·

There is provided a molding apparatus that molds a composition on a substrate by using a mold, characterized by including a control unit configured to control a process of forming a film of the composition between a first surface of the mold and the substrate by bringing the first surface into contact with the composition, and a deforming unit configured to deform the first surface into a convex shape with respect to a substrate side by applying power to a second surface of the mold on an opposite side to the first surface, wherein the control unit controls the deforming unit in the process so as to make power applied to the second surface by the deforming unit after contact between the first surface and the composition larger than power applied to the second surface by the deforming unit before the contact between the first surface and the composition.

RESIN TRANSFER MOLDING IN COMPOSITE MANUFACTURING

A resin transfer molding system includes a resin transfer mold configured to mold a composite material via resin injection and curing, a pressure sensor configured to measure an in-mold pressure, a dielectric sensor configured to measure an in-mold degree of cure value, a resistance circuit configured to measure an in-mold flow front position, and a molding process control module configured to determine a molding process anomaly status by comparing a specified anomaly threshold to at least one of pressure data obtained from the at least one pressure sensor, degree of cure data obtained from the at least one dielectric sensor, or flow front position data obtained from the at least one resistance circuit, reduce an injection flow rate in response to a determination of a molding process anomaly, and maintain the injection flow rate in response to a determination of normal molding process operation without the molding process anomaly.

Apparatuses, systems, and methods for sample testing

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Apparatuses, systems, and methods for sample testing

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Apparatuses, systems, and methods for sample testing

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Apparatuses, systems, and methods for sample testing

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.