B41J2202/03

LIQUID DISCHARGE HEAD AND LIQUID DISCHARGE DEVICE

A liquid discharge head includes an individual electrode that is individually provided for the plurality of pressure chambers, a common electrode that is commonly provided for the plurality of pressure chambers, a piezoelectric body that is provided between the individual electrode and the common electrode for applying pressure to liquid in the pressure chambers, a drive wiring that is electrically coupled to the individual electrode and the common electrode, and applies a voltage for driving the piezoelectric body, a detection resistor that is formed of the same material as any of the individual electrode, the common electrode, and the drive wiring for detecting temperature of the liquid in the pressure chambers, and a first layer that is provided on a surface opposite to a surface facing the pressure chamber substrate in the detection resistor, and has a lower thermal conductivity than the detection resistor.

LIQUID DISCHARGE HEAD
20230166504 · 2023-06-01 ·

A liquid discharge head is provided, including a channel unit and a piezoelectric actuator stacked on the channel unit. The channel includes a channel including a nozzle and a pressure chamber. The piezoelectric actuator includes a piezoelectric element which includes a piezoelectric layer; a constant electric potential electrode arranged between the piezoelectric layer and the channel unit; and a driving electrode arranged on a surface of the piezoelectric layer opposite to the constant electric potential electrode. A relational expression of 0.5107α + 18.476 < β < 0.7326α + 54.409 is fulfilled assuming that α represents a length in a transverse direction orthogonal to both of one direction and a stacking direction of the pressure chamber and β represents a length in the transverse direction of the driving electrode.

LIQUID DISCHARGE HEAD AND LIQUID DISCHARGE DEVICE
20230166497 · 2023-06-01 ·

A liquid discharge head includes an individual electrode, a common electrode, a piezoelectric body that is provided between the individual electrode and the common electrode for applying pressure to liquid in the pressure chambers, a drive wiring that applies a voltage so as to drive the piezoelectric body, a detection resistor that is formed of the same material as any of the individual electrode, the common electrode, and the drive wiring for detecting temperature of the liquid in the pressure chambers, and a sealing substrate that has a wall portion and a ceiling portion, and protects the piezoelectric body by the wall portion and the ceiling portion. The detection resistor is provided to have a part overlapping the wall portion which is shorter than a part not overlapping the wall portion when viewed along a lamination direction of the piezoelectric body, the individual electrode, and the common electrode.

DIELECTRIC THIN FILM, DIELECTRIC THIN FILM ELEMENT, PIEZOELECTRIC ACTUATOR, PIEZOELECTRIC SENSOR, HEAD ASSEMBLY, HEAD STACK ASSEMBLY, HARD DISK DRIVE, PRINTER HEAD AND INKJET PRINTER DEVICE

Provided is a dielectric thin film including a metal oxide. The metal oxide includes bismuth, sodium, barium, and titanium, at least a part of the metal oxide is a tetragonal crystal having a perovskite structure, and a (100) plane of at least a part of the tetragonal crystal is oriented in a normal direction do of a surface of the dielectric thin film 3.

Piezoelectric material, piezoelectric element, and electronic apparatus

A piezoelectric material contains a main component containing a perovskite-type metal oxide represented by general formula (1), a first sub-component containing Mn, and a second sub-component containing Bi or Bi and Li. A Mn content relative to 100 parts by weight of the metal oxide is 0.500 parts by weight or less (including 0 parts by weight) in terms of metal, a Bi content relative to 100 parts by weight of the metal oxide is 0.042 parts by weight or more and 0.850 parts by weight or less in terms of metal, and a Li content relative to 100 parts by weight of the metal oxide is 0.028 parts by weight or less (including 0 parts by weight) in terms of metal:
(Ba.sub.1−x−yCa.sub.xSn.sub.y).sub.α(Ti.sub.1−zZr.sub.z)O.sub.3 (where 0.020≦x≦0.200, 0.020≦y≦0.200, 0≦z≦0.085, 0.986≦α≦1.100)  General formula (1).

Liquid-ejecting head, liquid-ejecting apparatus, piezoelectric element, and piezoelectric material

A liquid-ejecting head includes a pressure-generating chamber communicating with a nozzle opening, and a piezoelectric element. The piezoelectric layer contains a perovskite complex oxide containing Bi, La, Fe, and Mn and is ferroelectric.

COATING LIQUID FOR FORMING PIEZOELECTRIC THIN FILM, METHOD OF PRODUCING COATING LIQUID FOR FORMING PIEZOELECTRIC THIN FILM, PIEZOELECTRIC THIN FILM, METHOD OF MANUFACTURING PIEZOELECTRIC THIN FILM, AND LIQUID EJECTION HEAD

Provided is a coating liquid for forming a piezoelectric thin film containing lead zirconate titanate, the coating liquid including a complex precursor containing at least three kinds of metal elements of Pb, Ti, and Zr, the coating liquid being free from an exothermic peak at a temperature of 450° C. or more, or having a heat generation amount at a temperature of from 400° C. to 450° C., which is larger than a heat generation amount at a temperature of from 450° C. to 500° C., in differential thermal analysis of the coating liquid.

ELECTROMECHANICAL-TRANSDUCING ELECTRONIC COMPONENT, LIQUID DISCHARGE HEAD, LIQUID DISCHARGE DEVICE, AND LIQUID DISCHARGE APPARATUS
20170291419 · 2017-10-12 · ·

An electromechanical-transducing electronic component includes at least one element array of electromechanical transducer elements. A piezoelectric material of each transducer element is made of a composite oxide having a perovskite structure preferentially oriented to at least one of (100) and (001) planes and has a drop of diffraction intensity in a rocking curve corresponding to at least one of (200) and (002) planes measured at a position (2θ=θmax) of a diffraction peak intensity P where the diffraction intensity is largest in a diffraction intensity peak corresponding to the at least one of the (200) and (002) planes out of diffraction intensity peaks measured by an X-ray diffraction θ-2θ method. ΔP/P.sub.AVE is 20% or less where P.sub.AVE represents an average of the intensity P in the element array in the piezoelectric material of each transducer element and ΔP represents a maximum difference of the intensity P in the array.

Piezoelectric material, piezoelectric element, and electronic apparatus

The present invention provides a piezoelectric material not containing lead and potassium, having a high relative density, a high Curie temperature, and a high mechanical quality factor, and exhibiting good piezoelectricity. The piezoelectric material contains 0.04 percent by mole or more and 2.00 percent by mole or less of Cu relative to 1 mol of metal oxide represented by General formula (1) below.
((Na.sub.1-zLi.sub.z).sub.xBa.sub.1-y)(Nb.sub.yTi.sub.1-y)O.sub.3 (in Formula, 0.70≦x≦0.99, 0.75≦y≦0.99, and 0<z<0.15, and x<y)  General formula (1)

Lead-free piezoelectric material

A lead-free piezoelectric ceramic material has the general chemical formula xBiCoO3-y(Bi0.5Na0.5)TiO3-z(Bi0.5K0.5)TiO3, xBiCoO3-y(Bi0.5Na0.5)TiO3-zNaN-bO3, xBiCoO3-y(Bi0.5Na0.5)TiO3-zKNbO3, xBiCoO3-yBi(Mg0.5Ti0.5)O3-z(Bi0.5Na0.5)TiO3, xBiCoO3-yBa-TiO3-z(Bi0.5Na0.5)TiO3, or xBiCoO3-yNaNbO3-zKNbO3; wherein x+y+z=1, and x, y, z≠0.