The present disclosure generally relates to integrated devices with a conductive barrier structure. In an example, a semiconductor device includes a substrate, a conductive barrier structure, a channel layer, a barrier layer, a gate, and a conductive structure. The substrate is of a first semiconductor material. The conductive barrier structure is on the substrate. The channel layer is of a second semiconductor material and is on the conductive barrier structure. The barrier layer is on the channel layer, and the channel layer is between the barrier layer and the conductive barrier structure. The gate is over the barrier layer opposing the channel layer. The conductive structure is electrically coupled between the conductive barrier structure, the channel layer, and the barrier layer.

A 3D semiconductor device including: a first level including a first single crystal layer and first transistors, which each include a single crystal channel; a first metal layer with an overlaying second metal layer; a second level including second transistors, overlaying the first level; a third level including third transistors, overlaying the second level; a fourth level including fourth transistors, overlaying the third level, where the second level includes first memory cells, where each of the first memory cells includes at least one of the second transistors, where the fourth level includes second memory cells, where each of the second memory cells includes at least one of the fourth transistors, where the first level includes memory control circuits, where second memory cells include at least four memory arrays, each of the four memory arrays are independently controlled, and at least one of the second transistors includes a metal gate.

According to one aspect of the present disclosure, a semiconductor device includes a substrate having a first type dopant. In some embodiments, the semiconductor device also includes an epitaxial layer above the substrate, having a second type dopant and a top region. In some embodiments, the semiconductor device also includes a trench in the top region of the epitaxial layer; at least one doped ring implanted in the epitaxial layer below the trench; and a dielectric material filling within the trench. In some embodiments, there is a twelve-sided body tie in the epitaxial layer, wherein the sides of the twelve-sided body tie are not all equal to each other.

A semiconductor device includes a semiconductor substrate having an element region and a terminal region located around the element region. The terminal region includes multiple guard rings and multiple first diffusion regions. When the semiconductor substrate is viewed in a plan view, one of the first diffusion regions is arranged correspondingly to one of the guard rings, and each of the guard rings is located in corresponding one of the first diffusion regions. A width of each of the first diffusion regions is larger than a width of corresponding one of the guard rings.

A semiconductor device includes a substrate, a dummy gate structure, and a gate structure. The substrate has a dummy gate trench and a gate trench, and includes a first well region, a second well region and a source region. The first well region is formed by doping at least one element from a first element group, and has a first conductive channel. The second well region is formed by doping at least one element from a second element group, the second well region is on the first well region and has a second conductive channel, a polarity of the second conductive channel is opposite to that of the first conductive channel. The dummy gate structure is in the dummy gate trench of the substrate, and a portion of the dummy gate structure is in the first well region. The gate structure is between the adjacent dummy gate structures.

A power semiconductor device includes a semiconductor substrate, a drift layer, a well region, a doped region, two dummy trenches, a gate structure and a dielectric layer. The semiconductor substrate is doped to have a first conductive channel. The drift layer on the semiconductor substrate is doped to have the first conductive channel. The well region on the drift layer is doped to have a second conductive channel having a polarity opposite to that of the first conductive channel. The doped region on the well region is doped to have the first conductive channel. Two dummy trenches pass through the doped region and the well region. Each of the dummy trenches has a dummy gate. The gate structure has a real gate and is between the dummy trenches. The dielectric layer isolates the dummy gate and the real gate from the doped region, the well region and the drift layer.

A semiconductor device includes a gate electrode embedded in each of a plurality of first trenches through an insulating film. The gate electrode includes a first gate electrode electrically connected to a first gate pad and a second gate electrode electrically connected to a second gate pad. A charge period and a discharge period of gate capacitance parasitic on the second gate electrode are shorter than a charge period and a discharge period of gate capacitance parasitic on the first gate electrode, respectively.

A semiconductor device according to one or more embodiments is disclosed. A first semiconductor region includes a first semiconductor region, a second semiconductor region, a third semiconductor region, a first trench and a fourth semiconductor region. A second semiconductor region includes a fifth semiconductor region, a sixth semiconductor region, a second trench, and a second inner trench electrode. A dummy region includes a seventh semiconductor region that is arranged on the first semiconductor region between the first semiconductor region and the second semiconductor region, a third trench penetrating the seventh semiconductor region in a depth direction; and a third inner trench electrode electrically connected to the first inner trench electrode through a third insulating film in the third trench.

A method for manufacturing a semiconductor device is provided. The method includes forming a trench in a substrate; disposing an upper gate electrode in the trench; disposing a first dielectric layer on the upper gate electrode in the trench; and disposing a capping layer on the first dielectric layer in the trench.

A semiconductor component, in particular a transistor. The semiconductor component includes: source and drain layers doped according to a first type, a channel layer located vertically between the source layer doped and the drain layer, and a gate trench, which extends vertically from the source layer to the drain layer and adjoins the channel layer and at least a portion of the source layer. A first shielding region doped according to a second type, extends vertically from the source layer, or a semiconductor surface adjoining it, to the drain layer, and a second shielding region doped according to the second type, is arranged vertically below a bottom of the gate trench, wherein the gate trench and the second shielding region are designed such that, in one or more delimited regions, the second shielding region extends horizontally at least to the first shielding region.