A display panel includes a base substrate, a first transistor, and a second transistor. The first transistor and the second transistor are formed on the base substrate. The first transistor includes a first active layer, a first gate electrode, a first source electrode, and a first drain electrode. The first active layer includes silicon. The second transistor includes a second active layer, a second gate electrode, a second source electrode, and a second drain electrode. The second active layer includes oxide semiconductor. A length of a channel region of the first transistor is L1. Along a direction perpendicular to the base substrate, a distance between the first gate electrode and the first active layer is D1. A length of a channel region of the second transistor is L2. Along the direction perpendicular to the base substrate, a distance between the second gate electrode and the second active layer is D2.

A semiconductor device which includes an oxide semiconductor and in which formation of a parasitic channel due to a gate BT stress is suppressed is provided. Further, a semiconductor device including a transistor having excellent electrical characteristics is provided. The semiconductor device includes a transistor having a dual-gate structure in which an oxide semiconductor film is provided between a first gate electrode and a second gate electrode; gate insulating films are provided between the oxide semiconductor film and the first gate electrode and between the oxide semiconductor film and the second gate electrode; and in the channel width direction of the transistor, the first or second gate electrode faces a side surface of the oxide semiconductor film with the gate insulating film between the oxide semiconductor film and the first or second gate electrode.

A light-emitting device capable of suppressing variation in luminance among pixels is provided. A light-emitting device includes a pixel and first and second circuits. The first circuit has a function of generating a signal including a value of current extracted from the pixel. The second circuit has a function of correcting an image signal by the signal. The pixel includes at least a light-emitting element and first and second transistors. The first transistor has a function of controlling supply of the current to the light-emitting element by the image signal. The second transistor has a function of controlling extraction of the current from the pixel. A semiconductor film of each of the first and second transistors includes a first semiconductor region overlapping with a gate, a second semiconductor region in contact with a source or a drain, and a third semiconductor region between the first and second semiconductor regions.

An array substrate includes a substrate, driving TFTs, and switch TFTs directly on the substrate. The driving TFT includes a buffer layer, a gate, a first gate insulator layer, a second gate insulator layer, and a metal oxide semiconductor layer stacked in that order on the substrate, and a source electrode and a drain electrode coupled to the metal oxide semiconductor layer. The switch TFT includes a buffer layer, a gate, a second gate insulator layer, and a metal oxide semiconductor layer stacked in that order on the substrate, and a source electrode and a drain electrode coupled to the metal oxide semiconductor layer.

Provided is a semiconductor device including a first transistor having an oxide semiconductor film, an interlayer film over the first transistor, and second transistor located over the interlayer film and having a semiconductor film including silicon. The interlayer film can include an inorganic insulator. The semiconductor film including silicon can contain polycrystalline silicon. The interlayer film can include an inorganic insulator.

A semiconductor device which includes an oxide semiconductor and in which formation of a parasitic channel due to a gate BT stress is suppressed is provided. Further, a semiconductor device including a transistor having excellent electrical characteristics is provided. The semiconductor device includes a transistor having a dual-gate structure in which an oxide semiconductor film is provided between a first gate electrode and a second gate electrode; gate insulating films are provided between the oxide semiconductor film and the first gate electrode and between the oxide semiconductor film and the second gate electrode; and in the channel width direction of the transistor, the first or second gate electrode faces a side surface of the oxide semiconductor film with the gate insulating film between the oxide semiconductor film and the first or second gate electrode.

A thin-film transistor array substrate for AMOLED and a manufacturing method thereof are disclosed. The thin-film transistor array substrate includes: a substrate; a plurality of thin-film transistor pixel units mounted on the substrate, each of which includes at least one driving thin-film transistor and at least one switching thin-film transistor; a first electrode pattern layer mounted on the substrate; an insulating layer mounted on the substrate and covering gates of the driving thin-film transistor and the switching thin-film transistor and the first electrode pattern layer; and a second electrode pattern layer mounted on the insulating layer and partially overlapped with the first electrode pattern layer to have an overlapping area and a non-overlapping area; the insulating layer has a larger thickness in the overlapping area and has a smaller thickness in the non-overlapping area.

According to one embodiment, a semiconductor device includes an insulating substrate, a first semiconductor layer formed of silicon and positioned above the insulating substrate, a second semiconductor layer formed of a metal oxide and positioned above the first semiconductor layer, a first insulating film formed of a silicon nitride and positioned between the first semiconductor layer and the second semiconductor layer, and a block layer positioned between the first semiconductor film and the second semiconductor layer, the block layer hydrogen diffusion of which is lower than that of the first insulating film.

An array substrate, a display panel, and a fabrication method of the array substrate are provided. The array substrate comprises a first thin film transistor including a metal oxide thin film transistor, and a second thin film transistor including an amorphous silicon thin film transistor. The first thin film transistor and the second thin film transistor are disposed above a substrate. The first thin film transistor is located in a display region of the array substrate, and the second thin film transistor is located in a peripheral circuit region of the array substrate.

An LTPS array substrate includes a plurality of LTPS thin-film transistors and a bottom transparent conductive layer, a protective layer, and a top transparent conductive layer. Each LTPS thin-film transistor includes a substrate, a patternized light shield layer, a buffering layer, a patternized poly-silicon layer, a gate insulation layer, a gate electrode line and a common electrode line, an insulation layer, a drain electrode and a source electrode, and a planarization layer that are formed to sequentially stack on each other. The light shield layer covers the scan line and the source/drain. The bottom transparent conductive layer, the protection layer, and the top transparent conductive layer are sequentially stacked on the planarization layer. The patternized poly-silicon layer includes a first portion and a second portion. The drain electrode includes an extension section extending therefrom and opposite to the second portion.