An image sensor includes a pixel array; a logic circuit configured to convert an image signal generated from the pixel array during a first period into image data; and a memory. The image data may be written in the memory during a second period, of which at least a portion overlaps the first period. The logic circuit may write dummy data in the memory during a third period overlapping the first period and not overlapping the second period.

An image sensor capable of obtaining a high dynamic range without reducing a frame rate. An image sensor includes a pixel region where a plurality of pixels each including a sensor element that detects a naturally occurring physical quantity and converts the physical quantity into an electric signal are arranged in a row direction and a column direction, a row selection unit that selects any of the pixels in the pixel region in units of rows and contributes to readout of the electric signal from each of the pixels and resetting of an accumulated charge, a pixel readout unit that reads out the electric signal from each of the pixels selected by the row selection unit in column-parallel, and a column selection unit that selects the pixel in any column from a pixel row selected by the row selection unit and controls a charge accumulation amount of the selected pixel.

An optical imaging system for pickup, sequentially arranged from an object side to an image side, comprising: the first lens element with positive refractive power having a convex object-side surface, the second lens element with refractive power, the third lens element with refractive power, the fourth lens element with refractive power, the fifth lens element with refractive power; the sixth lens element made of plastic, the sixth lens with refractive power having a concave image-side surface with both being aspheric, and the image-side surface having at least one inflection point.

The invention relates to charge-coupled TDI image sensors for the observation of one and the same image strip by multiple rows of pixels in succession with summation of the electric charge generated by an image point, for a row duration (T.sub.L ), in the pixels of the same rank of the various rows. According to the invention, the pixels are subdivided, in the direction of movement, into at least two adjacent portions (SUBa.sub.i,j, SUBb.sub.i,j), each portion comprising at least one charge storage area that is independent of the storage areas of the other portion while allowing a transfer of charge from the first portion to the second, one of the portions (SUBa.sub.i,j) being masked against light and the other portion (SUBb.sub.i,j) not being masked. The unmasked portion comprises a charge removal structure which is activated at a variable moment in time defining a start of actual integration that is independent of the start of a period of observing the image strip. It is thus possible to define a time of exposure to light T.sub.INT that does not depend on the relative speed of movement of the sensor and of the image, unlike the typical charge-coupled TDI sensors in which the duration of exposure is equal to the row period T.sub.L (linked to the speed of movement).

A solid-state imaging device includes a photoelectric conversion unit, a light shielding unit and a transfer transistor. The photoelectric conversion unit generates charges by photoelectrically converting light. The light shielding unit is formed by engraving a semiconductor substrate on which the photoelectric conversion unit is formed, so as to surround an outer periphery of the photoelectric conversion unit. The transfer transistor transfers charges generated in the photoelectric conversion unit. During a charge accumulation period in which charges are accumulated in the photoelectric conversion unit, a potential that repels the charges is supplied to the light shielding unit and a gate electrode of the transfer transistor. During a charge transfer period in which charges are transferred from the photoelectric conversion unit, a potential that repels the charges is supplied to the light shielding unit and a potential that attracts the charges is supplied to the gate electrode of the transfer transistor.

An inspection device for inspecting an inspection object portion in a PTP sheet, the inspection device including: an irradiator that irradiates the inspection object portion with light; an imaging device that takes an image of the inspection object portion irradiated with the light; a processor that detects a defect in the inspection object portion from the taken image by using a predetermined luminance threshold value, and determines whether the inspection object portion is non-defective; a verification image generating circuit that generates a verification image in which a virtual defective image is placed in a non-defective image; and a threshold value verifier that causes the processor to determine whether the inspection object portion is non-defective or defective by using the verification image, in place of the image taken by the imaging device, and to verify the luminance threshold value based on a determination result by the processor.

A spot detecting apparatus includes a photographing part and a spot detecting part. The photographing part photographs, in a first resolution, an image displayed on a display panel to output first resolution image data, and photograph, in a second resolution, the image displayed on the display panel to output second resolution image data, where the second resolution is higher than the first resolution, and the image displayed on the display panel includes a first spot greater than or equal to a reference size and a second spot less than the reference size. The spot detecting part receives the first resolution image data and the second resolution image data, and subtracts the first resolution image data from the second resolution image data to detect the second spot.

An imaging device includes: a light source emitting light based on a first pulse; a solid-state imaging element including pixel units and exposing the light based on a second pulse; and a signal processor. Each pixel unit includes a photoelectric converter and charge accumulating units, and generates first to third signal charges by first to third exposure processes in this order to be accumulated in the charge accumulating units. Each of the first and third exposure processes is based on the second pulse delayed from the first pulse by a first period, and the second exposure process is based on the second pulse delayed from the first pulse by a second period. A total period of the first and third exposure processes is equal to that of the second exposure process. The signal processor calculates a distance signal for each pixel unit by using the first to third signal charges.

An electronic device that includes a vision system carried by a bracket assembly is disclosed. The vision system may include a first camera module that captures an image of an object, a light emitting element that emits light rays toward the object, and a second camera module that receives light rays reflected from the object. The light rays may include infrared light rays. The bracket assembly is designed not only carry the aforementioned modules, but to also maintain a predetermined and fixed separation between the modules. The bracket assembly may form a rigid, multi-piece bracket assembly to prevent bending, thereby maintaining the predetermined separation. The electronic device may include a transparent cover designed to couple with a housing. The transparent cover includes an alignment module designed to engage a module and provide a moving force that aligns the bracket assembly and the modules to a desired location in the housing.

An optical phase profilometry system includes a first operative coaxial camera-projector pair aligned at a first angle relative to a target surface that projects a first illumination on the target surface and a second operative coaxial camera-projector pair aligned at a second angle relative to the target surface that projects a second illumination on the target surface. Wherein the first and second angles are equal and opposite to one another relative to the target surface such that the second operative coaxial camera-projector pair is configured to capture a first reflection from the first illumination and the first operative coaxial camera-projector pair is configured to capture a second reflection from the second illumination. The optical phase profilometry system further includes a controller configured to, based on the captured first and second reflections, generate a first and second estimation of the target surface and combine them to generate a dimensional profile of the target surface.