An infrared detector system is described which includes a detector diode array 3 and a non volatile memory 1. The non volatile memory 1 can use CMOS Silicon Fuse technology which can be polysilicon devices that are programmed using voltage-current-time profiles suitable for the silicon process technology, such that when applied will cause the polysilicon element to heat up rapidly and melt. This results in the fuse element going open circuit, just like blowing a known fuse. The fuse can act as a logic element that has a one time, user programmable and permanent logic state. An array of such memory cells is can be mapped to a sub pixel diode detector array.

The present technology relates to a signal processing apparatus, a control method, an image pickup element, and an electronic device which make it possible to suppress RTS noise. The signal processing apparatus of the present technology may include an amplifying transistor and a short-circuit unit. The amplifying transistor amplifies a signal input to a gate, and the short-circuit unit is capable of short-circuiting the gate of the amplifying transistor to a potential which reduces a gate-to-source voltage of the amplifying transistor. For example, it is determined whether the amplifying transistor is in a period of a non-operating state, and when the amplifying transistor is determined to be in the period of a non-operating state, the gate of the amplifying transistor may be short-circuited. The present technology can be applied, for example, to an image pickup element and an electronic device.

An image pickup apparatus capable of obtaining a smooth video image and of reducing deterioration in the vertical resolution and an image stabilization performance. An image pickup device has a valid pixel area for obtaining an image signal, an optical black area for an optical black correction, and an amplifier unit that amplifies an output from the pixel area and outputs an image signal. A gain adjustment unit adjusts gain of the image signal. A reading control unit changes a gain value in the amplifier unit, changes the numbers of lines in the areas, and performs reading control of the image pickup device, when a control gain value in the gain adjustment unit exceeds a reference value. A change unit changes a time constant of a correction filter used for the optical black correction when the control gain value exceeds the specified reference value.

An imaging sensor includes multiple light-receiving elements, which are for multiple colors, configured to conduct photoelectric conversion and multiple power supply lines configured to supply a power supply voltage from a power supply source to the light-receiving elements. The light-receiving elements of each of the colors are aligned in one direction. Portions extending between the power supply source and the respective light-receiving elements of the multiple power supply lines are substantially identical in shape on at least a per-color basis.

An image sensor capable of preventing generation of a line-type defect is disclosed. The image sensor includes a row driver, a pixel array, an analog signal processor, a data mapping buffer and a row data buffer. The pixel array has a layout configuration having a nonlinear pattern for a row path and a column path, receives optical signals and converts the optical signals into electric signals, and outputs the electric signals as image signals in response to the pixel control signals. The analog signal processor performs analog-to-digital conversion on the image signals to generate first signals. The data mapping buffer compensates position errors caused by the layout configuration of the zigzag pattern for the first signals to generate a second signals.

In one application, an imaging device includes an image sensor having an array of pixels, and a mask coupled with the image sensor. The mask is configured to darken a plurality of isolated pixels or groups of pixels interspersed within the array of pixels. The imaging device also includes a processor coupled with the image sensor and configured to receive image data from the image sensor, and determine a dark current fixed pattern noise based on the image data received from the plurality of darkened pixels or groups of pixels.

A phase difference AF processing unit (19) compares subject images between a region R1 and a region Rj (j=2 to m) in an AF area (53), and determines a phase difference detection pixel (52A, 52B) as a detection signal addition target with respect to a phase difference detection pixel (52A, 52B) in the region R1 among phase difference detection pixels (52A, 52B) in the region Rj. Further, the phase difference AF processing unit (19) adds up detection signals with respect to the phase difference detection pixels (52A, 52B) in the region R1 and the phase difference detection pixels (52A, 52B) which are addition targets, and generates a defocus amount (Df1) from a result of a correlation operation using detection signals after addition. A system control unit (11) drives a focus lens according to the defocus amount (Df1) to perform a focusing control.

A radiation imaging apparatus that forms a part of a radiation imaging system is provided. The apparatus includes a sensor unit having a conversion element configured to convert radiation into charges and a switch element configured to transfer the charges. The sensor unit is configured to obtain a radiation image in accordance with radiation that enters the conversion element. The apparatus further includes a control unit configured to control the sensor unit so as to perform one of a plurality of operations. The plurality of operations includes an imaging waiting operation of repetitively switching ON/OFF the switch element, and a standby operation of controlling so as to make a change amount of voltage for controlling the switch element smaller than that of the imaging waiting operation. The control unit executes the standby operation based on a predetermined signal from outside.

A solid-state imaging device includes: a valid area including pixels that are not shielded from light; a first light-blocked area and a second light-blocked area each including pixels that are shielded from light; an analog-to-digital converting unit to convert the electric charge accumulated by the pixels belonging to the first light-blocked area, the valid area, and the second light-blocked area, to image data at a time; a signal reading unit to read light-blocked data obtained from the first light-blocked area and the second light-blocked area, and valid data obtained from the valid area, in units of pixels; a reference black level estimating unit to estimate a reference black level of the light-blocked data; and a level correction unit to correct, based on the estimated reference black level, a size of the valid data obtained simultaneously with the light-blocked data used in estimating the reference black level.

.[.The present invention relates to an.]. .Iadd.An .Iaddend.image processing apparatus which can restore, from a color and sensitivity mosaic image acquired using a CCD image sensor of the single plate type or the like, a color image signal of a wide dynamic range wherein the sensitivity characteristics of pixels are uniformized and each of the pixels has all of a plurality of color components .Iadd.is provided.Iaddend.. A sensitivity uniformization section uniformizes the sensitivities of pixels of a color and sensitivity mosaic image to produce a color mosaic image, and a color interpolation section interpolates color components of the pixels of the color mosaic image M to produce output images R, G and B. The .[.present invention.]. .Iadd.image processing apparatus .Iaddend.can be applied to a digital camera which converts a picked up optical image into a color image signal of a wide dynamic range.