G06F17/50

METHODS AND SYSTEM TO REDUCE IMPERCEPTIBLE LAB EXPERIMENTS
20170364607 · 2017-12-21 ·

Methods may include defining operational parameters for an initial composition design; generating an initial composition design from the defined operational parameters; predicting the performance of the initial composition design using a statistical model; comparing the performance of the initial composition design with the operational parameters; optimizing the initial composition design according to the defined operational parameters; and outputting a final composition design. Methods may also include defining operational parameters for an initial composition design for a wellbore fluid; generating an initial composition design from the defined operational parameters; predicting the performance of the initial composition design using a statistical model; comparing the performance of the initial composition design with the operational parameters; optimizing the initial composition design according to the defined operational parameters; and outputting a final composition design.

INFORMATION PROCESSING APPARATUS, ISING DEVICE, AND INFORMATION PROCESSING APPARATUS CONTROL METHOD
20170364477 · 2017-12-21 · ·

Arithmetic circuits calculate d−1 energy values (h.sub.i2 to h.sub.id) indicating energies generated by 2-body to d-body coupling on the basis of a plurality of weight values indicating strength of 2-body to d-body coupling of 2 to d neurons including a first neuron whose output value is allowed to be updated and n-bit output values of n neurons. An adder circuit calculates a sum of these values, and a comparator circuit compares a value based on a sum of the sum and a noise value with a threshold, to determine the output value of the first neuron. An update circuit outputs n-bit updated output values in which one bit has been updated on the basis of a selection signal and the output value of the first neuron. The holding circuit holds the updated output values and outputs the updated output values as the n-bit output values used by the arithmetic circuits.

MULTIPLE-PASS RENDERING OF A DIGITAL THREE-DIMENSIONAL MODEL OF A STRUCTURE

A method is provided for rendering a scene including a digital three-dimensional (3D) model of a structure. The method includes traversing a scene graph composed of a hierarchical group of nodes representing respective 3D objects of the digital 3D model, and selecting nodes of the hierarchical group of nodes. The method includes adding a plurality of objects represented by the selected nodes to a render queue, performing a multiple-pass rendering of the plurality of 3D objects from the render queue. This includes in a pass of a plurality of passes, rendering a threshold portion but not all of the plurality of 3D objects to a framebuffer for output to a display device, with at least one of the plurality of 3D objects being left in the render queue after rendering the threshold portion. The method may also include a mesh simplification and/or z-occlusion.

Standard cell library and methods of using the same

A standard cell library and a method of using the same may include information regarding a plurality of standard cells stored on a non-transitory computer-readable storage medium, wherein at least one of the plurality of standard cells includes a pin through which an input signal or an output signal of the at least one standard cell passes and including first and second regions perpendicular to a stack direction. When the via is disposed in the pin, the second region can provide a resistance value of the via smaller than that of the first region. The standard cell library may further include marker information corresponding to the second region.

SYSTEMS AND METHODS FOR PROCESS DESIGN AND ANALYSIS
20170364618 · 2017-12-21 ·

Systems and methods for process design and analysis of processes that result in products or analytical information are provided. A hypergraph data store is maintained and comprises versions of each process. A version comprises a hypergraph with nodes, for stages of the process, and edges. Stages have parameterized resource inputs associated with stage input properties, and input specification limits. Stages have resource outputs with output properties and output specification limits. Edges link the outputs of nodes to the inputs of other nodes. A run data store is maintained with a plurality of process runs, each run identifying a process version, values for the inputs of nodes in the corresponding hypergraph, their input properties, resource outputs of the nodes, and obtained values of output properties of the resource outputs. When a query identifies one or more inputs and/or outputs present in the run data store, they are formatted for analysis.

SELF-CONTAINED RECONFIGURABLE PERSONAL LABORATORY
20170363678 · 2017-12-21 ·

A personal laboratory includes a self-contained, miniaturized, portable kit that provides for design, testing, and automated assembling, dissembling, and reassembling of a physical system (rather than a simulation) with flexibility as to the variety of configurations of components that may be designed and assembled, and easy integration of complex components. The personal laboratory includes a reconfigurable system, the reconfigurable system includes a plurality of functional components, and a plurality of connectors configured for operatively connect respective functional components to other functional components; a stimulus generator configured to apply a stimulus to the reconfigurable system; and a measurement system configured to measure a response to the applied stimulus generated by the reconfigurable system. In the context of electronic circuits, the reconfigurable system is a reconfigurable circuit, the functional components are circuit elements and the connectors are electrical connectors.

PHOTORESIST DESIGN LAYOUT PATTERN PROXIMITY CORRECTION THROUGH FAST EDGE PLACEMENT ERROR PREDICTION VIA A PHYSICS-BASED ETCH PROFILE MODELING FRAMEWORK

Disclosed are methods of generating a proximity-corrected design layout for photoresist to be used in an etch operation. The methods may include identifying a feature in an initial design layout, and estimating one or more quantities characteristic of an in-feature plasma flux (IFPF) within the feature during the etch operation. The methods may further include estimating a quantity characteristic of an edge placement error (EPE) of the feature by comparing the one or more quantities characteristic of the IFPF to those in a look-up table (LUT, and/or through application of a multivariate model trained on the LUT, e.g., constructed through machine learning methods (MLM)) which associates values of the quantity characteristic of EPE with values of the one or more quantities characteristics of the IFPF. Thereafter, the initial design layout may be modified based on at the determined quantity characteristic of EPE.

METHOD OF CALCULATING PROCESSED DEPTH AND STORAGE MEDIUM STORING PROCESSED-DEPTH CALCULATING PROGRAM
20170364624 · 2017-12-21 · ·

A method of calculating a form according to an embodiment relates to a method of calculating a processed depth of a material to be etched when the material to be etched is etched using a mask material. The method comprises calculating a first opening solid angle Ω1 based on an opening of a mask pattern, the first opening solid angle Ω1 defining an incident quantity of ions contributing to etching, and calculating a second opening solid angle Ω2 based on an opening of a mask pattern, the second opening solid angle Ω2 defining an incident quantity of depositions. A processed depth at a process point where the material to be etched is etched is calculated based on a linear equation using the first opening solid angle Ω1 and the second opening solid angle Ω2 as variables.

Detection And Elimination Of Stress Singularity

A computer-implemented method and system automatically detects stress singularity in a three-dimensional (3D) computer-aided design (CAD) model. A potential area of high stress is detected. A finite element mesh of the 3D CAD model is refined, at least in the potential area of high stress, after which, whether the high stress value converges is determined. A user is alerted that the potential area of high stress is an area having one or more elements of stress singularity. Suggestions are made regarding how to eliminate the stress singularity and the user is enabled to modify the design of the 3D CAD model to eliminate the stress singularity.

RELEASE CYCLE OPTIMIZATION BASED ON SIGNIFICANT FEATURES VALUES SIMULATION

Embodiments include a system for release cycle optimization; the system includes a processor configured to perform a method. The method includes accessing, by a processor, historical data relating to a plurality of software version each having a plurality of attributes; selecting a subset of attributes from the plurality of attributes; receiving a set of data values for each of the subset of attributes from the plurality of attributes; performing one or more simulations of a software development cycle utilizing the set of data values; and obtaining a set of results from the one or more simulations comprising a plurality of predicted field defects values corresponding to each of the set of data values.