A wafer testing probe card includes a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. The flexible circuit board is electrically connected to the printed circuit board. The elastic piece is disposed between the printed circuit board and the flexible circuit board. The probe unit includes a probe head and a plurality of probes. The probe head is fixed on the printed circuit board and has a plurality of through holes. The probes respectively pass through the through holes and move up and down relative to the probe head.

A system to identify potential faults in an electrical power distribution system includes a vibration monitor configured to detect a vibration event proximate a portion of the electrical power distribution system, a power quality monitor configured to detect a power quality event in a portion of the electrical power distribution system, an analysis system configured to correlate the vibration event detected by the vibration monitor with the power quality event detected by the power quality monitor, and an output configured to receive information regarding the power quality event from the analysis system and to provide the information to an operator.

A method and apparatus for testing a duct leak detection system of an aircraft is disclosed. A sensor of the duct leak detection system is selected at an interface of the duct leak detection system. An alternating current is sent through the selected sensor and a resistance of the selected sensor is measured using the alternating current. An indicative signal is generated at the interface when the measured resistance of the selected sensor is outside of a specification of the selected sensor.

A light emitting device includes a series connection unit constituted of N light emitting elements, a light emitting element driving circuit having an output terminal connected to an anode of the series connection unit, N short-circuit switches respectively connected in parallel to the light emitting elements, and a switch control unit arranged to control on and off of the short-circuit switches. A ground fault detection circuit, which detects a ground fault of the light emitting device, includes a reference voltage source arranged to generate a reference voltage, and a comparator arranged to compare the anode voltage of the series connection unit with the reference voltage. The reference voltage has a value smaller than the product of an on-resistance of one of the short-circuit switches and output current of the light emitting element driving circuit.

A fault current limiter may include a current limiting leg to transmit a first current and a control leg in parallel with the current limiting leg, the control leg to transmit a second current. The control leg may include a plurality of power electronic modules arranged in electrical series with one another, and a bypass power electronic module arranged in electrical series with the plurality of power electronic modules. The control leg may further include a plurality of current monitors arranged electrically in series with the plurality of power electronic modules and the bypass power electronic module, and at least one triggering circuit, wherein the plurality of current monitors is electrically coupled to the at least one triggering circuit, and wherein the at least one triggering circuit is coupled to at least one of: the plurality of power electronic modules, and the bypass power electronic module.

When a voltage applied to a heater assumes a low-level potential, a control section of a load drive apparatus instantaneously supplies an anomaly judgment current to the heater, and computes the electrical resistance of the heater on the basis of the anomaly judgment current. The control section judges whether or not any of anomalous states of the heater, including at least a deteriorated state of the heater and wiring anomalous states of the heater, has occurred on the basis of the electrical resistance of the heater.

A power supply device is disclosed. A circuit board is disposed inside a conductive housing. A rectifying module is disposed on the circuit board and has primary and secondary sides. The grounding module includes a first grounding element, a second grounding element, and a fastening element. Two terminals of the first surge protection module are respectively electrically connected to the primary side and the first grounding element. Two terminals of the second surge protection module are respectively electrically connected to the secondary side and the second grounding element. The second grounding element and the first grounding element are not directly connected. The fastening element passes through the conductive housing, the circuit board, the first grounding element, and the second grounding element so that the conductive housing, the first grounding element, and the second grounding element are electrically connected to one another.

A time delay through a voltage converter, including a transformer therein, must be known or estimated in order to optimally control the voltage converter. For example, power switches that control the input power to the voltage converter must use this time delay in order to, e.g., achieve zero-voltage switching (ZVS) with minimal dead-time. The time delays are typically considered as constants, and the power switch control is optimized for a limited operational range that corresponds to such constant time delays. Herein, variable time delays are determined based upon varying load conditions of the voltage converter. By more accurately determining the time delay for a given load condition and basing the voltage converter control on such accurate (load-dependent) time delays, the voltage converter may be more optimally controlled and achieve higher efficiency.

A testing container includes a right-parallelepiped-like container, electrical components of a transformer test system which are arranged in the container and which represent a respective heat source during a testing operation, and a cooling system including at least one heat exchanger. In addition, the testing container includes a movement apparatus configured to move the at least one heat exchanger from a transport position within the container into a working position which is located at least partially outside the container. Thus, the at least one heat exchanger is movable by means of the movement apparatus from the transport position within the container into the working position which is located at least partially outside the container.

An EMC test bench, includes an item of equipment under test to be loaded on board an aircraft, the item of equipment being subjected to EMC tests and delivering ARINC electrical interfaces as inputs and as output; an electrical interfaces device representative of an item of anti-lightning equipment and including an ARINC signals acquisition and/or generation card connected to the ARINC inputs and outputs of the item of equipment under test; a command and control rack for analyzing control signals originating from the electrical interfaces device including the ARINC signals acquisition and/or generation card, and a signals conversion system for protecting the command and control rack connected between the command and control rack and the electrical interfaces device.