The present disclosure provides a magnetic field sensor system, comprising an AMR magnetic field sensor and an overcurrent detection sensor. The overcurrent detection sensor comprises an AMR sensing element connected in a half bride arrangement with a field insensitive component. The output of the overcurrent detection sensor is able to monitor the strength of the magnetic field experiences by the sensor system, and detect if the magnet field goes beyond a sensing threshold of the AMR magnetic field sensor. Outside of this threshold, the AMR magnet field sensor is unable to provide a measurement of the magnetic field strength. The overcurrent detection sensor can therefore detect that the system is operating in very high magnetic fields, which in turn can indicate that there is overcurrent in the system.

Semiconductor structure and methods of forming the same are provided. An exemplary method includes receiving a workpiece including a magnetic tunneling junction (MTJ) and a conductive capping layer disposed on the MTJ, depositing a first dielectric layer over the workpiece, performing a first planarization process to the first dielectric layer, and after the performing of the first planarization process, patterning the first dielectric layer to form an opening exposing a top surface of the conductive capping layer, selectively removing the conductive capping layer. The method also includes depositing an electrode layer to fill the opening and performing a second planarization process to the workpiece such that a top surface of the electrode layer and a top surface of the first dielectric layer are coplanar.

In some examples, a device includes a magnetic tunnel junction including a first Weyl semimetal layer, a second Weyl semimetal layer, and a dielectric layer positioned between the first and second Weyl semimetal layers. The magnetic tunnel junction may have a large tunnel magnetoresistance ratio, which may be greater than five hundred percent or even greater than one thousand percent.

A multiplier is formed from a plurality of nanomagnetic structures including slant edge input nanomagnetic structures, diagonal elongate interconnect nanomagnetic structures, and output nanomagnetic structures. Input logic levels are provided by inserting a magnetic field, which generates an set of output magnetic fields representing the product of the binary input values.

A magnetoresistive element that has a magnetic material made of an alloy having a stable bcc structure containing Co as a main component, has an excellent tunnel magnetoresistive ratio, and can be put into practical use by mass production, and a magnetic storage device using the magnetoresistive element are provided. The magnetoresistive element includes a first magnetic layer whose magnetization direction is substantially fixed, a second magnetic layer whose magnetization direction is changeable, and a non-magnetic layer arranged between the first magnetic layer and the second magnetic layer. The first magnetic layer and/or the second magnetic layer has an alloy having a bcc structure containing Co as a main component and Co and Mn.

A magnetic memory device including a substrate; a first and second magnetic pattern stacked on the substrate; a tunnel barrier pattern between the first and second magnetic pattern; a bottom electrode between the substrate and the first magnetic pattern; a seed pattern between the bottom electrode and the first magnetic pattern; and a diffusion barrier pattern between the bottom electrode and the seed pattern, wherein a bottom surface of the at least one diffusion barrier pattern is in contact with a top surface of the bottom electrode, and a top surface of the at least one diffusion barrier pattern is in contact with a bottom surface of the seed pattern, the at least one diffusion barrier pattern includes a non-magnetic metal, or an alloy of the non-magnetic metal and a non-metal element, and the non-magnetic metal includes Ta, W, Nb, Ti, Cr, Zr, Hf, Mo, Al, Mg, or V.

The present invention relates to a kind of magnetic heterojunction structure and the method of controlling and achieving spin logic and multiple-state storage functions. The said single magnetic heterojunction structure comprises the substrate, in-plane anti-ferromagnetic layer, in-plane ferromagnetic layer, nonmagnetic layer, vertical ferromagnetic layer, and vertical anti-ferromagnetic layer respectively from the bottom up; the said in-plane ferromagnetic layer and the said vertical ferromagnetic layer are coupled together through the said nonmagnetic layer in the middle; in-plane exchange biases, namely exchange biases in the plane, exist between the said in-plane ferromagnetic layer and the said in-plane anti-ferromagnetic layer, and out-of-plane exchange biases, namely exchange biases out of the plane, exist between the said vertical ferromagnetic layer and the said vertical anti-ferromagnetic layer.

A ferromagnetic free layer, a preparation method and an application thereof are provided, where the ferromagnetic layer includes a magnetic film alloy, and the magnetic film alloy includes multiple layers of laminated films. A thickness of each of the films decreases gradually from a first end to a second end of the magnetic film alloy, so as to break in-plane structural symmetry of the magnetic film alloy, and the films include heavy metal films and ferromagnetic metal films, where out-of-plane crystal symmetry of the magnetic film alloy is broken by means of component gradients. When a current is applied in plane of the magnetic film alloy, a spin orbit torque will be generated, which directly drives the magnetic moment of the magnetic film alloy to undergo a deterministic magnetization reversal.

A spin-current magnetization rotational element includes a spin orbit torque wiring extending in a first direction and a first ferromagnetic layer disposed in a second direction intersecting the first direction of the spin orbit torque wiring, the spin orbit torque wiring having a first surface positioned on the side where the first ferromagnetic layer is disposed, and a second surface opposite to the first surface, and the spin orbit torque wiring has a second region on the first surface outside a first region in which the first ferromagnetic layer is disposed, the second region being recessed from the first region to the second surface side.

Systems for performing source line sensing of magnetoelectric junctions in accordance with embodiments of the invention are disclosed. In one embodiment, a MeRAM circuit includes a plurality of voltage controlled magnetic tunnel junction bits, application of a voltage with opposite polarity increases the perpendicular magnetic anisotropy and magnetic coercivity of the free layer through the VCMA effect, each magnetoelectric junction is connected to the drain of an MOS transistor, the combination includes a MeRAM cell, each MeRAM cell includes three terminals, each connected respectively to a bit line, a source line, and at least one word line, in an array, a pulse generator and a write MOS transistor connected to the bit line and the source line, a sense amplifier and a sense MOS transistor connected to the source line and the bit line, and a current source circuit connected to the source line and the reference line.