A signal processing chain implements wide dynamic range (WDR) multi-frame processing including receiving raw image signals from a WDR sensor including a plurality of frames including a first frame including first exposure time pixel data and a second frame including second exposure time pixel data. Statistics for camera control are generated including first statistics for the first pixel data and second statistics for the second pixel data. The first and second pixel data are merged using WDR merge algorithm in a WDR merge block which utilizes the first and second statistics to generate a raw higher bit width single frame image. The single frame image is post-processed in post-processing block using at least a defect pixel correction algorithm, and at least a portion of tone mapping is performed on the single frame image after the post-processing to provide an output toned mapped image.

A solid-state imaging device includes a pixel array and a pixel value correcting unit. The pixel array includes a plurality of pixels, the plurality of pixels each having one of a different exposure time and a different exposure sensitivity and being disposed according to a predetermined rule. The pixel value correcting unit is configured to correct, among pixel values obtained from the plurality of pixels in the pixel array, a pixel value of a pixel of the plurality of pixels that applies to a preset condition, by using a pixel value of another pixel of the plurality of pixels.

An infrared detector system is described which includes a detector diode array 3 and a non volatile memory 1. The non volatile memory 1 can use CMOS Silicon Fuse technology which can be polysilicon devices that are programmed using voltage-current-time profiles suitable for the silicon process technology, such that when applied will cause the polysilicon element to heat up rapidly and melt. This results in the fuse element going open circuit, just like blowing a known fuse. The fuse can act as a logic element that has a one time, user programmable and permanent logic state. An array of such memory cells is can be mapped to a sub pixel diode detector array.

.[.The present invention relates to an.]. .Iadd.An .Iaddend.image processing apparatus which can restore, from a color and sensitivity mosaic image acquired using a CCD image sensor of the single plate type or the like, a color image signal of a wide dynamic range wherein the sensitivity characteristics of pixels are uniformized and each of the pixels has all of a plurality of color components .Iadd.is provided.Iaddend.. A sensitivity uniformization section uniformizes the sensitivities of pixels of a color and sensitivity mosaic image to produce a color mosaic image, and a color interpolation section interpolates color components of the pixels of the color mosaic image M to produce output images R, G and B. The .[.present invention.]. .Iadd.image processing apparatus .Iaddend.can be applied to a digital camera which converts a picked up optical image into a color image signal of a wide dynamic range.

An image pickup apparatus includes an endoscope configured to have an image pickup section in which a plurality of pixels are provided, and a storage section configured to store scope individual information, a binning processing section configured to split an image into a plurality of regions so that one region includes a plurality of pixel signals, and add up the pixel signals for each region to obtain a binning pixel signal, a binning brightness detection section configured to detect brightness of the region, a blend processing section configured to set a weight in the region on the basis of the brightness, and weight and composite the pixel signals and the binning pixel signal to generate a composite image, and a control section configured to control the binning processing section in accordance with the scope individual information.

Methods and apparatus for compensating for bad pixels in a sensor array. In embodiments, a detector system receives an image on a sensor array of pixels for a first frame via a lens when the lens and the sensor array are configured in a first positional relationship. The array includes at least one bad pixel. The system moves the lens and/or the sensor array based on a position of the at least one bad pixel in the image such that the lens and the sensor array are configured in a second positional relationship. The image on the sensor array for a second frame is received via the lens when the lens and the sensor array are configured in a second positional relationship. The system compensates for the location of the at least one bad pixel in the image for the first and second frames to output a processed image.

A method of removing a bad pixel from a pixel image is provided. The method includes determining whether a representative pixel representing at least one bad pixel is included in a kernel, determining whether a first pixel is a bad pixel when the representative pixel is included in the kernel, and compensating for the first pixel using a second pixel in the kernel when the first pixel is determined to be a bad pixel. The kernel has the first pixel at a center of the kernel.

The present technology relates to an image processing device, an image processing method, and an image processing system capable of improving detection accuracy of a defective pixel. Provided is an image processing device including a defective pixel estimation unit that estimates a defect of a pixel of interest in an image captured by a solid-state imaging device that contains a two-dimensional array of color pixels, and high-sensitivity pixels having higher sensitivity than sensitivities of the color pixels. The defect of the pixel of interest is estimated on the basis of a correlation between pixel values of the high-sensitivity pixels, and pixel values of the color pixels. The image processing device further includes a defective pixel correction unit that corrects the pixel of interest when it is estimated that the pixel of interest is a defective pixel. The present technology is applicable to an image processing device which corrects a defective pixel by signal processing, for example.

A method of correcting defects appearing in an image produced by an image sensor, the method comprising: receiving an image to be corrected, taken by the image sensor, receiving a temperature from the image sensor, acquired when the image to be corrected is taken by the image sensor, receiving an integration time applied by the image sensor when taking the image to be corrected, and for each pixel of the image to be corrected, subtracting from the pixel value a pixel-specific noise correction factor derived from a noise reduction model comprising a linear component dependent on the temperature of the image sensor, added to an exponential component depending on the temperature of the image sensor and multiplied by the integration time, the linear and exponential components depending on coefficients specific to the pixel.

An image sensor including: a plurality of phase shift code generators, wherein each of the plurality of phase shift code generators outputs a phase shift code; a test data selection circuit for outputting test data corresponding to a test pattern; a counter for receiving the phase shift code from at least one of the plurality of phase shift code generators, receiving the test data from the test data selection circuit, latching a digital code corresponding to the test pattern using the phase shift code, and outputting the digital code; and a control logic for calculating a data pattern using the digital code and selecting one of the plurality of phase shift code generators in accordance with a result of a comparison between the data pattern and the test pattern.