A polarization imaging section 20 includes polarized pixels in each of a plurality of polarization directions. The polarization imaging section 20 includes a polarizer. The polarization imaging section 20 outputs image signals of a polarized image to a defect detecting section 35 of an image processing section 30. In a case where a difference between a pixel value of a target polarized pixel generated by the polarization imaging section and a pixel value of the target polarized pixel estimated from polarization characteristics corresponding to pixel values of peripheral pixels in a polarization direction different from a polarization direction of the target polarized pixel is greater than a predetermined allowable range, the defect detecting section 35 determines that the target polarized pixel is a defective pixel. Therefore, it is possible to detect a defect of a pixel in the polarization imaging section that generates the polarized image.

Provided is an electronic device which includes an event-driven vision sensor that includes a sensor array having a sensor that generates an event signal when the sensor detects a change in intensity of incident light, an actuator that displaces a module including the vision sensor, and a control unit which transmits a control signal to the actuator and reflects a correction value based on the event signal generated when the actuator displaces the module in the control signal.

A method and apparatus for image processing, the method comprising obtaining input image data comprising a plurality of pixel intensity values representing a respective plurality of pixel locations, obtaining pixel location data identifying one or more pixel locations represented by compromised pixel intensity values, generating interpolated image data comprising improved pixel intensity values, storing improved image data comprising at least the interpolated image data, and detecting one or more further compromised pixel intensity values based on the improved image data.

An image processing apparatus including a processor including hardware, the processor being configured to: detect a defective pixel from among the multiple pixels; calculate a level of a pixel value of the defective pixel; compare the calculated level of the pixel value of the defective pixel with a threshold to determine whether a defective pixel that is stored in a storage is to be corrected, the threshold being determined based on a brightness that is calculated from pixel values close to a defective pixel and on any one of an exposure time of image data corresponding to a defective pixel on which a determination is to be made, a value of gain, and variation in pixel value among pixels surrounding the defective pixel on which a determination is to be made; and interpolate the pixel value of the determined defective pixel that is to be corrected.

Embodiments relate to image signal processors (ISP) that include binner circuits that down-sample an input image. An input image may include a plurality of pixels. The output image of the binner circuit may include a reduced number of pixels. The binner circuit may include a plurality of different operation modes. In a bin mode, the binner circuit may blend a subset of input pixel values to generate an output pixel quad. In a skip mode, the binner circuit may select one of the input pixel values as the output pixel pixel. The selection may be performed randomly to avoid aliasing. In a luminance mode, the binner circuit may take a weighted average of a subset of pixel values having different colors. In a color value mode, the binner circuit may select one of the colors in a subset of pixel values as an output pixel value.

A radiation imaging apparatus includes pixels arranged to form pixel rows and pixel columns. The pixels include first pixels and second pixels whose sensitivity to radiation is lower than the first pixels. The apparatus further includes a signal lines arranged to correspond to the pixel columns, a readout circuit configured to read out a signal from the pixels via the signal lines, and a processing unit configured to decide a correction value using signals read out from the second pixels and correct signals read out from the first pixels using the correction value. An internal structure of the readout circuit has a period. The second pixels are arranged such that there are two or more types of remainders of column numbers of pixel columns that include the second pixels divided by the period.

An imaging section includes a plurality of pixel output units that receive subject light that enters without going through an imaging lens and a pinhole. Output pixels of at least two of the plurality of pixel output units differ in incident angle directivity as a result of modulation of the incident angle directivity based on the incident angle of the subject light. A defective pixel detection section detects a defective pixel of the imaging section on the basis of pixel outputs of the imaging section. The defective pixel detection section discriminates a defective pixel that has produced a pixel output whose signal level is larger than or smaller than a threshold range. The image conversion section performs restoration computations by using pixel outputs generated for the respective pixels other than that of the defective pixel and a coefficient set stored in the coefficient storage section, thus generating a restored image.

The solid-state image sensing device includes a photoelectric conversion unit, a charge holding unit for holding charges transferred from the photoelectric conversion unit, a first transfer transistor for transferring charges from the photoelectric conversion unit to the charge holding unit, and a light blocking part including a first light blocking part and a second light blocking part, in which the first light blocking part is arranged between a second surface opposite to a first surface as a light receiving surface of the photoelectric conversion unit and the charge holding unit, and covers the second surface, and is formed with a first opening, and the second light blocking part surrounds the side surface of the photoelectric conversion unit.

Processing circuitry may be configured to detect an abnormal pixel among a plurality of pixels based on pixel values of the plurality of pixels and one or more reference pixel values corresponding to the plurality of values; generate first encoded data by encoding pixel data of the plurality of pixels based on the pixel values with a first encoder; generate second encoded data by encoding the pixel data based on remaining pixels of the plurality of pixels excluding the detected abnormal pixel with a second encoder; and output the first encoded data or the second encoded data based on detecting the abnormal pixel.

An imager array may be provided as part of an imaging system. The imager array may include a plurality of infrared imaging modules. Each infrared imaging module may include a plurality of infrared sensors associated with an optical element. The infrared imaging modules may be oriented, for example, substantially in a plane facing the same direction and configured to detect images from the same scene. Such images may be processed in accordance with various techniques to provide images of infrared radiation. The infrared imaging modules may include filters or lens coatings to selectively detect desired ranges of infrared radiation. Such arrangements of infrared imaging modules in an imager array may be used to advantageous effect in a variety of different applications.