The invention relates to semiconductor devices for conversion of the ionizing radiation into an electrical signal enabling determination of the radiation level and absorbed dose of gamma, proton, electronic and alpha radiations being measured. The ionizing radiation sensor is a p-i-n structure fabricated by the planar technology. The sensor contains a high-resistance silicon substrate of n-type conductivity, on whose front side there are p-regions; layer from SiO2; aluminum metallization; and a passivating layer. P-region, located in the central part of the substrate and occupying the most surface area, forms the active region of the sensor. At least two p-regions in the form of circular elements are located in the inactive region on the perimeter of the substrate around the central p-region and ensure a decrease in the surface current value and smooth voltage drop from the active region to the device perimeter.

The present invention provides an invisible light flat plate detector and a manufacturing method thereof, an imaging apparatus, relates to the field of detection technology, can solve problems that the structure of the invisible light flat plate detector in the prior art is complex and the manufacturing method thereof is tedious. The invisible light flat plate detector of the present invention comprises a plurality of detection units and an invisible light conversion layer provided above the detection units for converting invisible light into visible light, each of the detection units comprising a thin film transistor provided on a substrate, and a first insulation layer, a first electrode, a semiconductor photoelectronic conversion module, a second electrode which are successively provided above the thin film transistor and of which projections on the substrate at least partially overlap with a projection of the thin film transistor on the substrate.

A neutron detector for detecting neutrons with energies from meV to tens of MeV comprising one or more nitride (BN) strips electrically connected in parallel or series. In some embodiments, the two or more BN strips are stacked on one another. In other embodiments, the two or more BN strips are disposed on a substrate with a gap between the two or more BN strips.

A neutron detector for detecting neutrons with energies from meV to tens of MeV comprising one or more nitride (BN) strips electrically connected in parallel or series. In some embodiments, the two or more BN strips are stacked on one another. In other embodiments, the two or more BN strips are disposed on a substrate with a gap between the two or more BN strips.

There is room for improvement in the quality of diamond crystals used in radiation detectors produced using the conventional hetero-epitaxial method. The diamond crystal used for the radiation detector according to the present invention: is heteroepitaxially grown by means of chemical vapor deposition on a substrate comprising a material other than the diamond and having a plane orientation inclined by a predetermined off-angle from a just plane orientation; and has a crystallinity such that the full width half maximum of the diffraction peak of the (004) plane of the X-ray diffractometry represents a value shorter than or equal to 200 seconds.

There is room for improvement in the quality of diamond crystals used in radiation detectors produced using the conventional hetero-epitaxial method. The diamond crystal used for the radiation detector according to the present invention: is heteroepitaxially grown by means of chemical vapor deposition on a substrate comprising a material other than the diamond and having a plane orientation inclined by a predetermined off-angle from a just plane orientation; and has a crystallinity such that the full width half maximum of the diffraction peak of the (004) plane of the X-ray diffractometry represents a value shorter than or equal to 200 seconds.