Patent classifications
G06F119/12
Systems and methods to model a site
Systems and methods are disclosed herein for generating and/or providing a model, such as may be utilized for designing and/or presenting a proposal for a project for a structure or site. The disclosed embodiments can include identifying installation surface faces, installation surface face benefit metrics, obstructions, obstacles affecting placement of elements of the project, and for providing an educational experience, comprising general information and at least one structure-specific installation proposal. A selected plan can be implemented from within a proposal platform of the disclosed systems and methods.
Remedial action in an integrated circuit in response to a monitor circuit diagnostic code sequence
Aspects relate to monitoring timing margin of logic paths and its degradation through an integrated circuit. In one example an integrated circuit has a logic path formed in the integrated circuit. A monitor circuit is formed in the integrated circuit near the logic path and configured to monitor a condition of the logic path and to generate a diagnostic code sequence to indicate the condition of the logic path over time. A monitor controller is configured to receive diagnostic codes of the diagnostic code sequence, to determine a condition of the integrated circuit based on the diagnostic code sequence, and to initiate a remedial action in response to the condition of the integrated circuit.
Circuit design modification based on timing tradeoff
Various embodiments provide for modifying a circuit design based on timing tradeoff, which can be part of an electronic design automation (EDA) system. For instance, some embodiments use a return on investment (ROI) concept to determine one or more thresholds for how much area or power of a circuit design should be available for use (e.g., sacrificed) in order to obtain an improvement in slack by a given transformation.
System and method for comparing circuit design constraint sets
Embodiments included herein are directed towards a method for comparing constraint sets. The embodiments may include determining, using at least one processor, at least one arrival propagation time corresponding to at least one endpoint, the at least one endpoint associated with a first constraint set and a second constraint set. The embodiments may further include creating, using the at least one processor, a first tag associated with the first constraint set and a second tag associated with the second constraint set. The embodiments may also include determining, using the at least one processor, at least one of: a non-equivalent path exception corresponding to the at least one endpoint and based at least in part on at least one of the arrival propagation time, the first tag, and the second tag; and an equivalent path exception corresponding to the at least one endpoint.
Signal and power integrated analog analysis system and method for full chip system
A simulation system and a method thereof are disclosed. In the simulation system, a system power transmission model, and analog current time-domain model and digital current time-domain model are connected to obtain power noise generated after a supply current is obtained; jitter time-domain information of each interface connection circuit model under the power noise is obtained based on transmission of a clock signal outputted from a phase lock loop, by a simulation program; next, a voltage step response of a voltage measurement point when a clock terminal of each interface connection circuit model receives an ideal signal, is simulated by the simulation program to generate a first voltage time-domain model; a system waveform is generated based on the jitter time-domain information of each interface connection circuit model under the power noise, the first voltage time-domain model and data transmission, thereby obtaining an eye diagram and time-domain jitter distribution.