According to an embodiment, an X-ray imaging device includes an irradiator, an exposure switch device, and a control device. The irradiator irradiates a subject placed on a bed with X-rays. The exposure switch device receives an operation of an operator related to X-ray irradiation. The control device controls the X-ray irradiation based on the X-rays. The exposure switch device includes a switch and an output. The switch is set on the basis of a position of the operator and detects the operation of the operator. The output outputs an operation signal based on the operation of the operator to the control device when the operation of the operator has been detected by the switch.

An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective images of the multiple objects in the respective controlled inspection positions. The detection mechanism includes one or more detectors arranged circumferentially around a central axis. At least one positioning mechanism is adapted to move the multiple objects into and out of the respective controlled inspection positions.

An x-ray system, comprising: a backscatter detector, comprising: an x-ray conversion material; a plurality of sensors configured to generate electrical signals in combination with the x-ray conversion material in response to incident x-rays; and a collimator disposed on the x-ray conversion material and including a plurality of partitions extending away from the x-ray conversion material and the sensors and forming a plurality of openings, each opening corresponding to one of the sensors.

An x-ray scanning system includes an x-ray source that produces a collimated fan beam of incident x-ray radiation. The system also includes a chopper wheel that can be irradiated by the collimated fan beam. The chopper wheel is oriented with a wheel plane containing the chopper wheel substantially non-perpendicular relative to a beam plane containing the collimated fan beam. In various embodiments, a disk chopper wheel's effective thickness is increased, allowing x-ray scanning with end point energies of hundreds of keV using relatively thinner, lighter, and less costly chopper wheel disks. Backscatter detectors can be mounted to an exterior surface of a vehicle housing the x-ray source, and slits in the disk chopper wheel can be tapered for more uniform target irradiation.

The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

Provided is a backscattered X-ray image device based on multi-sources. The backscattered X-ray image device includes an X-ray tube array configured to generate X-rays, first slit plates provided on the X-ray tube array and having a first slit through which the X-rays pass, second slit plates provided on the first slit plates and having second slits defined in a direction different from that of the first slit, and detectors provided on the second slit plates and having a narrow gap in the same direction as the first slit, the detectors being configured to detect a backscattered beam that is emitted from a subject receiving the X-rays.

A method and apparatus for classifying and/or identifying materials by means of their spectral response to gamma radiation. Classification is carried out by irradiating multiple different samples with gamma radiation, detecting a spectral response in the backscatter direction, sorting the spectral response into energy bands and selecting a combination of energy bands to define a relationship that best distinguishes between clusters of spectral responses for different material classes. Two or more of the energy bands may overlap.

A sample inspection system and a corresponding method for inspecting a sample is provided. The sample inspection system includes a beam former, a beam modulator an energy resolving detector and a collimator. The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source to generate a primary beam of electromagnetic radiation. The beam modulator is provided at a distance from the beam former to define a sample chamber. The collimator is provided between the beam modulator and the energy resolving detector. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector is arranged to detect the reference beam.

A system for evaluating the scan quality of a scanner on a test piece is provided. The system includes a processor and a memory in communication to the processor for storing instructions executable by the processor, such that the processor is configured to receive a scanned image of the test piece from the scanner, display the scanned image, generate a first score value based on the scanned image, display an evaluation input interface configured to receive user evaluation input based on the evaluation of the scanned image, and generate a second score value based on the user evaluation input, such that the first score value and the second score value are utilized to evaluate the scan quality of the scanner. Further, a method for evaluating the scan quality of the scanner is provided.

Embodiments of the present disclosure disclose a combined scanning X-ray generator, a composite inspection apparatus and an inspection method. The combined scanning X-ray generator includes: a housing; an anode arranged in the housing, the anode including a first end of the anode and a second end of the anode opposite the first end of the anode; a pencil beam radiation source arranged at the first end of the anode and configured to emit a pencil X-ray beam; and a fan beam radiation source arranged at the second end of the anode and configured to emit a fan X-ray beam; wherein the pencil beam radiation source and the fan beam radiation source are operated independently.